Gary E. Sommargren

1.6k total citations
49 papers, 986 citations indexed

About

Gary E. Sommargren is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Gary E. Sommargren has authored 49 papers receiving a total of 986 indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 21 papers in Atomic and Molecular Physics, and Optics and 17 papers in Biomedical Engineering. Recurrent topics in Gary E. Sommargren's work include Advancements in Photolithography Techniques (18 papers), Advanced Measurement and Metrology Techniques (12 papers) and Advanced X-ray Imaging Techniques (11 papers). Gary E. Sommargren is often cited by papers focused on Advancements in Photolithography Techniques (18 papers), Advanced Measurement and Metrology Techniques (12 papers) and Advanced X-ray Imaging Techniques (11 papers). Gary E. Sommargren collaborates with scholars based in United States, Japan and Germany. Gary E. Sommargren's co-authors include Donald W. Sweeney, Peter A Krulevitch, C. McConaghy, Abraham P. Lee, John S. Taylor, Erlan S. Bliss, Daren Dillon, Brian J. Thompson, Lynn G. Seppala and N. M. Ceglio and has published in prestigious journals such as Optics Letters, Review of Scientific Instruments and Journal of the Optical Society of America A.

In The Last Decade

Gary E. Sommargren

45 papers receiving 906 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Gary E. Sommargren United States 16 376 363 335 282 260 49 986
David L. Shealy United States 19 316 0.8× 494 1.4× 601 1.8× 153 0.5× 263 1.0× 101 1.2k
H. J. Frankena Netherlands 15 298 0.8× 237 0.7× 258 0.8× 222 0.8× 173 0.7× 45 765
Tomoaki Eiju Japan 13 285 0.8× 384 1.1× 270 0.8× 395 1.4× 264 1.0× 46 1.2k
Joseph J. M. Braat Netherlands 20 494 1.3× 785 2.2× 656 2.0× 158 0.6× 139 0.5× 129 1.4k
Luis Miguel Sanchez‐Brea Spain 14 202 0.5× 278 0.8× 325 1.0× 147 0.5× 171 0.7× 97 756
Norbert Lindlein Germany 22 417 1.1× 1.0k 2.8× 588 1.8× 222 0.8× 125 0.5× 95 1.5k
Tom D. Milster United States 17 542 1.4× 448 1.2× 746 2.2× 123 0.4× 148 0.6× 144 1.2k
Alan E. Rosenbluth United States 15 474 1.3× 175 0.5× 300 0.9× 134 0.5× 128 0.5× 55 765
John E. Greivenkamp United States 18 225 0.6× 230 0.6× 224 0.7× 309 1.1× 162 0.6× 71 1.1k
Maurizio Vannoni Italy 17 230 0.6× 171 0.5× 221 0.7× 232 0.8× 201 0.8× 80 813

Countries citing papers authored by Gary E. Sommargren

Since Specialization
Citations

This map shows the geographic impact of Gary E. Sommargren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gary E. Sommargren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gary E. Sommargren more than expected).

Fields of papers citing papers by Gary E. Sommargren

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Gary E. Sommargren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gary E. Sommargren. The network helps show where Gary E. Sommargren may publish in the future.

Co-authorship network of co-authors of Gary E. Sommargren

This figure shows the co-authorship network connecting the top 25 collaborators of Gary E. Sommargren. A scholar is included among the top collaborators of Gary E. Sommargren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Gary E. Sommargren. Gary E. Sommargren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Evans, Julia W., Gary E. Sommargren, Bruce Macintosh, Scott Severson, & Daren Dillon. (2006). Effect of wavefront error on 10^−7 contrast measurements. Optics Letters. 31(5). 565–565. 9 indexed citations
2.
Goldberg, Kenneth A., Patrick Naulleau, Senajith Rekawa, et al.. (2005). Ultra-high accuracy optical testing: creating diffraction-limited short-wavelength optical systems. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5900. 59000G–59000G. 6 indexed citations
3.
Macintosh, Bruce, James Graham, Lisa Poyneer, et al.. (2003). Extreme adaptive optics planet imager: XAOPI. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5170. 272–272. 7 indexed citations
4.
Mast, Terry S., J. Stuart Nelson, & Gary E. Sommargren. (2000). <title>Primary mirror segment fabrication for CELT</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 13 indexed citations
5.
Taylor, John S., et al.. (1998). The Fabrication and Testing of Optics for EUV Projection Lithography1,2. OTuD.1–OTuD.1. 2 indexed citations
6.
Sommargren, Gary E.. (1996). Phase Shifting Diffraction Interferometry for Measuring Extreme Ultraviolet Optics. JThB.2–JThB.2. 2 indexed citations
7.
8.
Goldberg, Kenneth A., Jeffrey Bokor, H. Medecki, et al.. (1995). Progress towards λ/20 extreme ultraviolet interferometry. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 2923–2927. 14 indexed citations
9.
Sweeney, Donald W. & Gary E. Sommargren. (1995). Harmonic diffractive lenses. Applied Optics. 34(14). 2469–2469. 184 indexed citations
10.
Vernon, S. P., et al.. (1994). EUV Characterization of a Four-Bounce Projection System. TEO.171–TEO.171.
11.
Goldberg, Kenneth A., et al.. (1994). Point Diffraction Interferometry at EUV Wavelengths. TEO.134–TEO.134. 3 indexed citations
12.
Kania, D. R., M. R. Hermann, J. Honig, et al.. (1994). High Average Power Laser for EUV Lithography. SEL.234–SEL.234. 1 indexed citations
13.
14.
Ceglio, N. M., A. M. Hawryluk, & Gary E. Sommargren. (1993). Front-end design issues in soft-x-ray projection lithography. Applied Optics. 32(34). 7050–7050. 18 indexed citations
15.
Sommargren, Gary E. & Lynn G. Seppala. (1993). Condenser optics, partial coherence, and imaging for soft-x-ray projection lithography. Applied Optics. 32(34). 6938–6938. 14 indexed citations
16.
Sommargren, Gary E.. (1981). Optical heterodyne profilometry. Applied Optics. 20(4). 610–610. 171 indexed citations
17.
Sommargren, Gary E.. (1979). Heterodyne profilometer for measuring surface microstructure (A). Journal of the Optical Society of America A. 69. 1404. 1 indexed citations
18.
Sommargren, Gary E.. (1975). Phase-shift double-exposure holographic interferometry (A). Journal of the Optical Society of America A. 65. 1186. 1 indexed citations
19.
Sommargren, Gary E., et al.. (1975). <title>Self-Calibration And Analysis Of Image Formation In The Sub-Nanosecond Domain</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 48. 63–68. 4 indexed citations
20.
Bliss, Erlan S., et al.. (1975). Loss of focusable energy due to small-scale nonlinear effects. IEEE Journal of Quantum Electronics. 11(9). 851–851. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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