J. F. Bresse
- Polymers and Plastics top 10%
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- Semiconductor materials and devices 23
- Integrated Circuits and Semiconductor Failure Analysis 12
- Advancements in Semiconductor Devices and Circuit Design 8
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- Semiconductor materials and interfaces 9
- Semiconductor Quantum Structures and Devices 9
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- Electron and X-Ray Spectroscopy Techniques 8
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- Ion-surface interactions and analysis 5
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- GaN-based semiconductor devices and materials 5
J. F. Bresse
45 papers receiving 470 citations
Peers
Comparison fields: 5 of 30
- Polymers and Plastics 121
- Electrical and Electronic Engineering 433
- Materials Chemistry 246
- Atomic and Molecular Physics, and Optics 150
- Surfaces, Coatings and Films 33
Countries citing papers authored by J. F. Bresse
This map shows the geographic impact of J. F. Bresse's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. F. Bresse with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. F. Bresse more than expected).
Fields of papers citing papers by J. F. Bresse
This network shows the impact of papers produced by J. F. Bresse. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. F. Bresse. The network helps show where J. F. Bresse may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. F. Bresse, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 42 | |
| 2 | 1997 | 5 | |
| 3 | 1996 | 8 | |
| 4 | 1995 | 3 | |
| 5 | 1993 | 1 | |
| 6 | Cathodoluminescence spectroscopty : an accurate technique for the characterization of the fabrication technology of GaAIAs/GaAs heterojunction bipolar transistors | 1992 | 2 |
| 7 | 1991 | 5 | |
| 8 | 1991 | 12 | |
| 9 | 1990 | 1 | |
| 10 | 1990 | 3 | |
| 11 | 1990 | 4 | |
| 12 | 1988 | 2 | |
| 13 | 1987 | 4 | |
| 14 | 1987 | 2 | |
| 15 | 1986 | 2 | |
| 16 | 1986 | 5 | |
| 17 | 1986 | 11 | |
| 18 | 1986 | 25 | |
| 19 | 1981 | 11 | |
| 20 | 1977 | 6 |
About J. F. Bresse
J. F. Bresse is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering, having authored 46 papers that have together received 510 indexed citations. Recurring topics across this work include Semiconductor materials and devices (23 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Semiconductor materials and interfaces (9 papers), Semiconductor Quantum Structures and Devices (9 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Ion-surface interactions and analysis (5 papers) and GaN-based semiconductor devices and materials (5 papers). The work is most often cited by research in Polymers and Plastics (121 citations), Electrical and Electronic Engineering (433 citations) and Materials Chemistry (246 citations). J. F. Bresse has collaborated with scholars based in France and Switzerland. Frequent co-authors include M. Pérotin, J.-C. Manifacier, R. Stuck, L. Szepessy, C. Dubon‐Chevallier, C. Daguet, G. Patriarche, M. Juhel, D. Lecrosnier and M. Gauneau. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.