S. Fisson

840 total citations
45 papers, 734 citations indexed

About

S. Fisson is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, S. Fisson has authored 45 papers receiving a total of 734 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 24 papers in Materials Chemistry and 13 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in S. Fisson's work include Silicon Nanostructures and Photoluminescence (16 papers), Semiconductor materials and devices (14 papers) and Thin-Film Transistor Technologies (13 papers). S. Fisson is often cited by papers focused on Silicon Nanostructures and Photoluminescence (16 papers), Semiconductor materials and devices (14 papers) and Thin-Film Transistor Technologies (13 papers). S. Fisson collaborates with scholars based in France, Taiwan and Germany. S. Fisson's co-authors include G. Vuye, J. Rivory, Vien Van, Bruno Gallas, M.L. Thèye, A. Brunet‐Bruneau, F. Abelès, Josette Rivory, M. Gandais and A. Gheorghiu and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

S. Fisson

43 papers receiving 709 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Fisson France 16 415 403 204 171 121 45 734
A. Rahim Forouhi United States 8 669 1.6× 673 1.7× 221 1.1× 206 1.2× 115 1.0× 18 1.1k
Iris Bloomer United States 5 637 1.5× 657 1.6× 217 1.1× 202 1.2× 111 0.9× 14 1.0k
Johan Nijs Netherlands 15 437 1.1× 665 1.7× 192 0.9× 126 0.7× 141 1.2× 67 1.1k
J.E. Bourée France 17 720 1.7× 616 1.5× 166 0.8× 142 0.8× 140 1.2× 89 1.1k
N. J. Ianno United States 21 683 1.6× 608 1.5× 139 0.7× 204 1.2× 152 1.3× 83 1.2k
John L. Vossen United States 10 364 0.9× 536 1.3× 134 0.7× 135 0.8× 116 1.0× 18 823
H. Yamamoto Japan 16 401 1.0× 447 1.1× 382 1.9× 63 0.4× 180 1.5× 79 980
Marcia H. Grabow United States 10 473 1.1× 284 0.7× 500 2.5× 183 1.1× 80 0.7× 18 982
W. J. Gunning United States 17 334 0.8× 540 1.3× 253 1.2× 185 1.1× 201 1.7× 59 960
G. Vuye France 18 364 0.9× 432 1.1× 342 1.7× 251 1.5× 214 1.8× 55 858

Countries citing papers authored by S. Fisson

Since Specialization
Citations

This map shows the geographic impact of S. Fisson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Fisson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Fisson more than expected).

Fields of papers citing papers by S. Fisson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Fisson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Fisson. The network helps show where S. Fisson may publish in the future.

Co-authorship network of co-authors of S. Fisson

This figure shows the co-authorship network connecting the top 25 collaborators of S. Fisson. A scholar is included among the top collaborators of S. Fisson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Fisson. S. Fisson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Stenger, Ingrid, et al.. (2007). Near infrared absorption of Si nanoparticles embedded in silica films. Surface Science. 601(14). 2912–2916. 6 indexed citations
2.
Stenger, Ingrid, et al.. (2006). Study of the interface Si-nc/SiO2 by infrared spectroscopic ellipsometry and X-ray photoelectron spectroscopy. Physica E Low-dimensional Systems and Nanostructures. 38(1-2). 176–180. 4 indexed citations
3.
Gallas, Bruno, et al.. (2005). Optical properties of Si nanocrystals embedded inSiO2. Physical Review B. 72(15). 39 indexed citations
4.
Gallas, Bruno, et al.. (2004). Dielectric function of Si nanocrystals embedded in SiO2. Thin Solid Films. 455-456. 335–338. 11 indexed citations
6.
Gallas, Bruno, S. Fisson, Éric Charron, et al.. (2001). Making an omnidirectional reflector. Applied Optics. 40(28). 5056–5056. 25 indexed citations
7.
Brunet‐Bruneau, A., S. Fisson, G. Vuye, & J. Rivory. (2000). Change of TO and LO mode frequency of evaporated SiO2 films during aging in air. Journal of Applied Physics. 87(10). 7303–7309. 38 indexed citations
8.
Brunet‐Bruneau, A., S. Fisson, Vien Van, et al.. (1998). Visible and infrared ellipsometry study of ion assisted SiO2 films. Thin Solid Films. 313-314. 676–681. 11 indexed citations
9.
Van, Vien, A. Brunet‐Bruneau, S. Fisson, et al.. (1996). Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurements. Applied Optics. 35(28). 5540–5540. 14 indexed citations
10.
Ley, L., et al.. (1995). Initial stages in the formation of PtSi on Si(111) as followed by photoemission and spectroscopic ellipsometry. Thin Solid Films. 270(1-2). 561–566. 32 indexed citations
11.
Rivory, Josette, et al.. (1994). Growth of low and high refractive index dielectric films: an in situ ellipsometry study. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2253. 1328–1328. 1 indexed citations
12.
Fisson, S., et al.. (1994). X-ray photoelectron spectroscopy study of the growth of dielectric films on various substrates. Surface and Coatings Technology. 68-69. 724–728. 1 indexed citations
13.
Van, Vien, et al.. (1994). Growth of low and high refractive index dielectric layers as studied by in situ ellipsometry. Thin Solid Films. 253(1-2). 257–261. 8 indexed citations
14.
Vuye, G., et al.. (1993). Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry. Thin Solid Films. 233(1-2). 166–170. 130 indexed citations
15.
Van, Vien, S. Fisson, K. Yu-Zhang, & M. Harmelin. (1988). Electron transport in co-evaporated thin film and melt-spun ribbon Al1−xMnx alloys. Materials Science and Engineering. 99(1-2). 219–222. 1 indexed citations
16.
Van, Vien, S. Fisson, & M.L. Thèye. (1984). In situ investigations of the electronic properties of co-evaporated amorphous Mg-Zn alloy films. Journal of Non-Crystalline Solids. 61-62. 1325–1329. 6 indexed citations
17.
Thèye, M.L., A. Gheorghiu, M. Gandais, & S. Fisson. (1980). Structural relaxation and crystallization of amorphous Ge films. Journal of Non-Crystalline Solids. 37(3). 301–323. 21 indexed citations
18.
Van, Vien, M.L. Thèye, & S. Fisson. (1979). The temperature dependence of Drude absorption in thin polycrystalline gold films. Thin Solid Films. 57(1). 83–88. 9 indexed citations
19.
Van, Vien & S. Fisson. (1978). Mesures optiques sous ultra-vide à basses températures sur couches minces préparées in situ. Revue de Physique Appliquée. 13(3). 155–159. 7 indexed citations
20.
Gandais, M., M.L. Thèye, S. Fisson, & J. Boissonade. (1973). Structure Studies by Electron Diffraction on Amorphous Ge Films. physica status solidi (b). 58(2). 601–611. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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