Chris Schuermyer
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 2%
- Industrial and Manufacturing Engineering top 5%
- Control and Systems Engineering
- Software top 10%
- Co-authors
- Brady BenwareR. MadgeManish SharmaN. TamarapalliJ. RajskiKun-Han TsaiThomas HerrmannMartin Keim
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (17 papers)VLSI and Analog Circuit Testing (15 papers)Advancements in Photolithography Techniques (5 papers)
- Cited by
- Hardware and ArchitectureIndustrial and Manufacturing EngineeringElectrical and Electronic Engineering
- Journals
- IEEE Design and TestIEEE Design & Test of ComputersInternational Test Conference
- Partner nations
- United StatesHungaryGermany
In The Last Decade
Chris Schuermyer
19 papers receiving 420 citations
Peers
Comparison fields: 5 of 28
- Electrical and Electronic Engineering 407
- Hardware and Architecture 400
- Industrial and Manufacturing Engineering 72
- Control and Systems Engineering 39
- Software 24
Countries citing papers authored by Chris Schuermyer
This map shows the geographic impact of Chris Schuermyer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chris Schuermyer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chris Schuermyer more than expected).
Fields of papers citing papers by Chris Schuermyer
This network shows the impact of papers produced by Chris Schuermyer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chris Schuermyer. The network helps show where Chris Schuermyer may publish in the future.
Co-authorship network of co-authors of Chris Schuermyer
This figure shows the co-authorship network connecting the top 25 collaborators of Chris Schuermyer. A scholar is included among the top collaborators of Chris Schuermyer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Chris Schuermyer. Chris Schuermyer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 4 | |
| 5 | 35 | |
| 6 | 3 | |
| 7 | 11 | |
| 8 | 9 | |
| 9 | 21 | |
| 10 | 14 | |
| 11 | 4 | |
| 12 | 14 | |
| 13 | 62 | |
| 14 | 19 | |
| 15 | 39 | |
| 16 | 4 | |
| 17 | 126 | |
| 18 | 11 | |
| 19 | 56 |
About Chris Schuermyer
Chris Schuermyer is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 19 papers that have together received 435 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (17 papers), VLSI and Analog Circuit Testing (15 papers) and Advancements in Photolithography Techniques (5 papers). The work is most often cited by research in Hardware and Architecture (400 citations), Industrial and Manufacturing Engineering (72 citations) and Electrical and Electronic Engineering (407 citations). Chris Schuermyer has collaborated with scholars based in United States, Hungary and Germany. Frequent co-authors include Brady Benware, R. Madge, Manish Sharma, N. Tamarapalli, J. Rajski, Kun-Han Tsai, Thomas Herrmann, Martin Keim, Janusz Rajski and Huaxing Tang. Their work appears in journals such as IEEE Design and Test, IEEE Design & Test of Computers and International Test Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.