N. Tamarapalli

1.6k total citations
17 papers, 1.3k citations indexed

About

N. Tamarapalli is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering. According to data from OpenAlex, N. Tamarapalli has authored 17 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 16 papers in Hardware and Architecture and 6 papers in Control and Systems Engineering. Recurrent topics in N. Tamarapalli's work include Integrated Circuits and Semiconductor Failure Analysis (17 papers), VLSI and Analog Circuit Testing (16 papers) and Engineering and Test Systems (6 papers). N. Tamarapalli is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (17 papers), VLSI and Analog Circuit Testing (16 papers) and Engineering and Test Systems (6 papers). N. Tamarapalli collaborates with scholars based in United States, Hungary and Poland. N. Tamarapalli's co-authors include J. Rajski, Janusz Rajski, Jerzy Tyszer, Mark Kassab, Kun-Han Tsai, Nilanjan Mukherjee, Jun Qian, G. Hetherington, A.S.M. Hassan and Andre Hertwig and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Design & Test of Computers and Proceedings - International Symposium for Testing and Failure Analysis.

In The Last Decade

N. Tamarapalli

17 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
N. Tamarapalli United States	14	1.2k	1.2k	192	45	42	17	1.3k
J.A. Waicukauski United States	23	1.9k 1.5×	1.8k 1.5×	280 1.5×	72 1.6×	23 0.5×	52	1.9k
Grzegorz Mrugalski United States	17	1.1k 0.9×	1.1k 0.9×	191 1.0×	20 0.4×	19 0.5×	66	1.2k
J. Savir United States	19	1.4k 1.2×	1.4k 1.2×	223 1.2×	63 1.4×	15 0.4×	73	1.5k
F.J. Ferguson United States	17	993 0.8×	1.0k 0.8×	80 0.4×	53 1.2×	33 0.8×	46	1.1k
Mark Kassab United States	16	1.6k 1.3×	1.5k 1.3×	242 1.3×	49 1.1×	11 0.3×	49	1.6k
S. Venkataraman United States	12	702 0.6×	690 0.6×	107 0.6×	45 1.0×	13 0.3×	27	745
H.-J. Wunderlich Germany	16	943 0.8×	900 0.7×	149 0.8×	43 1.0×	17 0.4×	47	990
C. Landrault France	21	1.4k 1.1×	1.4k 1.2×	185 1.0×	57 1.3×	10 0.2×	101	1.5k
R. Kapur United States	18	838 0.7×	834 0.7×	161 0.8×	52 1.2×	16 0.4×	40	923
B. Koenemann United States	9	1.5k 1.2×	1.4k 1.2×	258 1.3×	39 0.9×	5 0.1×	15	1.5k

Countries citing papers authored by N. Tamarapalli

Since Specialization

Citations

This map shows the geographic impact of N. Tamarapalli's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Tamarapalli with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Tamarapalli more than expected).

Fields of papers citing papers by N. Tamarapalli

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Tamarapalli. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Tamarapalli. The network helps show where N. Tamarapalli may publish in the future.

Co-authorship network of co-authors of N. Tamarapalli

This figure shows the co-authorship network connecting the top 25 collaborators of N. Tamarapalli. A scholar is included among the top collaborators of N. Tamarapalli based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Tamarapalli. N. Tamarapalli is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

17 of 17 papers shown

Qian, Jun, et al.. (2006). Yield Learning with Layout-aware Advanced Scan Diagnosis. Proceedings - International Symposium for Testing and Failure Analysis. 30897. 412–418. 20 indexed citations

Keim, Martin, N. Tamarapalli, Huaxing Tang, et al.. (2006). A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. 1–10. 62 indexed citations

Huang, Yu, et al.. (2006). Diagnosis with Limited Failure Information. 1–10. 33 indexed citations

Gupta, Akshay, et al.. (2006). Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. 1–9. 9 indexed citations

Cheng, Wu-Tung, et al.. (2006). Compression mode diagnosis enables high volume monitoring diagnosis flow. 156–165. 38 indexed citations

Fischer, Martin, et al.. (2006). The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. 360–368. 5 indexed citations

Tamarapalli, N., et al.. (2005). Advanced Scan Diagnosis Based Fault Isolation and Defect Identification for Yield Learning. Proceedings - International Symposium for Testing and Failure Analysis. 30880. 501–509. 9 indexed citations

Cheng, Wu-Tung, Kun-Han Tsai, Yu Huang, N. Tamarapalli, & Janusz Rajski. (2005). Compactor independent direct diagnosis. 204–209. 52 indexed citations

Tamarapalli, N., et al.. (2004). Industrial experience with adoption of edt for low-cost test without concessions. 1. 1211–1220. 15 indexed citations

10.

Benware, Brady, Chris Schuermyer, N. Tamarapalli, et al.. (2004). Impact of multiple-detect test patterns on product quality. 1. 1031–1040. 126 indexed citations

11.

Rajski, J., Jerzy Tyszer, Mark Kassab, et al.. (2003). Embedded deterministic test for low cost manufacturing test. 301–310. 321 indexed citations

12.

Rajski, Janusz, Mark Kassab, Nilanjan Mukherjee, et al.. (2003). Embedded deterministic test for low-cost manufacturing. IEEE Design & Test of Computers. 20(5). 58–66. 51 indexed citations

13.

Rajski, Janusz, et al.. (2003). High-frequency, at-speed scan testing. IEEE Design & Test of Computers. 20(5). 17–25. 114 indexed citations

14.

Hetherington, G., et al.. (2003). Logic BIST for large industrial designs: real issues and case studies. 358–367. 198 indexed citations

15.

Rajski, Janusz, N. Tamarapalli, & Jerzy Tyszer. (2002). Automated synthesis of large phase shifters for built-in self-test. 1047–1056. 54 indexed citations

16.

Tamarapalli, N. & J. Rajski. (2002). Constructive multi-phase test point insertion for scan-based BIST. 649–658. 99 indexed citations

17.

Rajski, Janusz, N. Tamarapalli, & Jerzy Tyszer. (2000). Automated synthesis of phase shifters for built-in self-test applications. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19(10). 1175–1188. 66 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact