Manish Sharma
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 2%
- Industrial and Manufacturing Engineering top 5%
- Education top 10%
- Developmental and Educational Psychology
- Co-authors
- Brady BenwareJames BewesDavid A. MullerPeter ReimannChris SchuermyerWu-Tung ChengJ.H. PatelHuaxing Tang
- Topics
- VLSI and Analog Circuit Testing (24 papers)Integrated Circuits and Semiconductor Failure Analysis (21 papers)Industrial Vision Systems and Defect Detection (7 papers)
- Cited by
- Hardware and ArchitectureIndustrial and Manufacturing EngineeringElectrical and Electronic Engineering
- Partner nations
- United StatesIndiaAustralia
In The Last Decade
Manish Sharma
39 papers receiving 500 citations
Peers
Comparison fields: 5 of 66
- Electrical and Electronic Engineering 344
- Hardware and Architecture 317
- Industrial and Manufacturing Engineering 83
- Education 73
- Developmental and Educational Psychology 42
Countries citing papers authored by Manish Sharma
This map shows the geographic impact of Manish Sharma's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Manish Sharma with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Manish Sharma more than expected).
Fields of papers citing papers by Manish Sharma
This network shows the impact of papers produced by Manish Sharma. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Manish Sharma. The network helps show where Manish Sharma may publish in the future.
Co-authorship network of co-authors of Manish Sharma
This figure shows the co-authorship network connecting the top 25 collaborators of Manish Sharma. A scholar is included among the top collaborators of Manish Sharma based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Manish Sharma. Manish Sharma is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 1 | |
| 4 | 2 | |
| 5 | Night Vision Technology | 3 |
| 6 | 2 | |
| 7 | 13 | |
| 8 | 0 | |
| 9 | 9 | |
| 10 | 20 | |
| 11 | 8 | |
| 12 | 13 | |
| 13 | 37 | |
| 14 | 62 | |
| 15 | 1 | |
| 16 | 7 | |
| 17 | 1 | |
| 18 | 13 | |
| 19 | 3 | |
| 20 | 6 |
About Manish Sharma
Manish Sharma is a scholar working on Hardware and Architecture, Acoustics and Ultrasonics and Industrial and Manufacturing Engineering, having authored 46 papers that have together received 526 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (24 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers) and Industrial Vision Systems and Defect Detection (7 papers). The work is most often cited by research in Hardware and Architecture (317 citations), Industrial and Manufacturing Engineering (83 citations) and Electrical and Electronic Engineering (344 citations). Manish Sharma has collaborated with scholars based in United States, India and Australia. Frequent co-authors include Brady Benware, James Bewes, David A. Muller, Peter Reimann, Chris Schuermyer, Wu-Tung Cheng, J.H. Patel, Huaxing Tang, Colin J. R. Sheppard and Martin Keim. Their work appears in journals such as Journal of Computer Assisted Learning, Journal of Modern Optics and Micron.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.