Osei Poku
- Hardware and Architecture top 2%
- Electrical and Electronic Engineering top 10%
- Industrial and Manufacturing Engineering top 10%
- Control and Systems Engineering
- Software top 10%
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (15 papers)VLSI and Analog Circuit Testing (15 papers)Radiation Effects in Electronics (4 papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsIEEE Design & Test of Computers2008 Design, Automation and Test in Europe
- Partner nations
- United States
In The Last Decade
Osei Poku
15 papers receiving 337 citations
Peers
Comparison fields: 5 of 26
- Hardware and Architecture 322
- Electrical and Electronic Engineering 318
- Industrial and Manufacturing Engineering 53
- Control and Systems Engineering 33
- Software 26
Countries citing papers authored by Osei Poku
This map shows the geographic impact of Osei Poku's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Osei Poku with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Osei Poku more than expected).
Fields of papers citing papers by Osei Poku
This network shows the impact of papers produced by Osei Poku. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Osei Poku. The network helps show where Osei Poku may publish in the future.
Co-authorship network of co-authors of Osei Poku
This figure shows the co-authorship network connecting the top 25 collaborators of Osei Poku. A scholar is included among the top collaborators of Osei Poku based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Osei Poku. Osei Poku is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 24 | |
| 2 | 1 | |
| 3 | 38 | |
| 4 | 23 | |
| 5 | 38 | |
| 6 | 3 | |
| 7 | 10 | |
| 8 | 29 | |
| 9 | 18 | |
| 10 | 28 | |
| 11 | 18 | |
| 12 | 12 | |
| 13 | 3 | |
| 14 | 14 | |
| 15 | 94 |
About Osei Poku
Osei Poku is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 15 papers that have together received 353 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (15 papers), VLSI and Analog Circuit Testing (15 papers) and Radiation Effects in Electronics (4 papers). The work is most often cited by research in Hardware and Architecture (322 citations), Software (26 citations) and Electrical and Electronic Engineering (318 citations). Osei Poku has collaborated with scholars based in United States. Frequent co-authors include R.D. Blanton, R. D. Blanton, Sizhe Liu, Yang Xue, Xin Li, Chris Schuermyer, W. Maly, Brady Benware, V. Iyengar and Peter Lloyd. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Design & Test of Computers and 2008 Design, Automation and Test in Europe.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.