Brady Benware

1.8k citations

58 papers · 1.4k indexed · h-index 21

Impact in

Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
Nuclear and High Energy Physics top 5%
- Laser-Plasma Interactions and Diagnostics

Papers in ⓘ

Hardware and Architecture 36
- VLSI and Analog Circuit Testing 36
Electrical and Electronic Engineering 45
- Integrated Circuits and Semiconductor Failure Analysis 36
- Advancements in Photolithography Techniques 11
- Semiconductor materials and devices 6

Co-authors: J. J. Rocca (18 shared papers)C. D. Macchietto (6 shared papers)C. Moreno (7 shared papers)R. Madge (10 shared papers)Chris Schuermyer (10 shared papers)Huaxing Tang (9 shared papers)Manish Sharma (8 shared papers)Martin Keim (7 shared papers)
Journals: Optics Letters (3 papers)Physical Review Letters (2 papers)Optics and Photonics News (1 paper)Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment (1 paper)IEEE Journal of Selected Topics in Quantum Electronics (1 paper)
Partner nations: United States Hungary Russia

In The Last Decade

Brady Benware

57 papers receiving 1.3k citations

Peers

Countries citing papers authored by Brady Benware

Since Specialization

Citations

This map shows the geographic impact of Brady Benware's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Brady Benware with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Brady Benware more than expected).

Fields of papers citing papers by Brady Benware

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Brady Benware. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Brady Benware. The network helps show where Brady Benware may publish in the future.

Co-authors

The 25 scholars most cited alongside Brady Benware, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Brady Benware Line = papers co-authored together Brady Benware links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 58 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Demonstration of a High Average Power Tabletop Soft X-Ray Laser Physical Review Letters ·Brady Benware, C. D. Macchietto, C. Moreno, J. J. Rocca	1998	187
2	Generation of millijoule-level soft-x-ray laser pulses at a 4-Hz repetition rate in a highly saturated tabletop capillary discharge amplifier Optics Letters ·C. D. Macchietto, Brady Benware, J. J. Rocca	1999	137
3	Impact of multiple-detect test patterns on product quality Brady Benware, Chris Schuermyer, N. Tamarapalli, Kun-Han Tsai, S. Ranganathan, R. Madge, J. Rajski, P. Krishnamurthy	2004	126
4	Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware	2007	71
5	A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis Martin Keim, N. Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware	2006	62
6	Focusing of a tabletop soft-x-ray laser beam and laser ablation Optics Letters ·Brady Benware, Andris Ozols, J. J. Rocca, I. A. Artioukov, В. В. Кондратенко, A. Vinogradov	1999	43
7	Measurement of the Spatial Coherence Buildup in a Discharge Pumped Table-Top Soft X-Ray Laser Physical Review Letters ·Mario C. Marconi, J. L. A. Chilla, C. Moreno, Brady Benware, J. J. Rocca	1997	40
8	In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost R. Madge, Brady Benware, Ritesh Turakhia, R. Daasch, Chris Schuermyer, J. Ruffler	2005	39
9	Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs Brady Benware, R. Madge, Cheng-Tse Lu, R. Daasch	2003	37
10	Two-dimensional near-field and far-field imaging of a Ne-like Ar capillary discharge table-top soft-x-ray laser Physical Review A ·C. Moreno, M. C. Marconi, Vyacheslav N. Shlyaptsev, Brady Benware, C. D. Macchietto, J. L. A. Chilla, J. J. Rocca, A. L. Osterheld	1998	36
11	</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>64</first_page> <last_page>64</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198433</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196611</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198433</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>72</first_page> <last_page>72</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198434</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196612</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198434</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>79</first_page> <last_page>79</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198435</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196613</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198435</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results IEEE Design & Test of Computers ·Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann	2012	35
12	Operation and output pulse characteristics of an extremely compact capillary-discharge tabletop soft-x-ray laser Optics Letters ·Brady Benware, C. Moreno, D. J. Burd, J. J. Rocca	1997	35
13	Obtaining high defect coverage for frequency-dependent defects in complex ASICs IEEE Design & Test of Computers ·R. Madge, Brady Benware, W.R. Daasch	2003	33
14	Enhancing Transition Fault Model for Delay Defect Diagnosis Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, M. Nakao, Yoshiaki Fukui, Hideyuki Otake	2008	32
15	Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data Manish Sharma, Brady Benware, Ling Lei, David Abercrombie, L. Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Runtian Lin, A De Man	2008	29
16	Improved volume diagnosis throughput using dynamic design partitioning Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, S.M. Reddy, Brady Benware	2012	28
17	Affordable and effective screening of delay defects in ASICs using the inline resistance fault model Brady Benware, Cheng-Tse Lu, John Van Slyke, P. Krishnamurthy, R. Madge, Martin Keim, Mark Kassab, Janusz Rajski	2005	26
18	Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser IEEE Journal of Selected Topics in Quantum Electronics ·I. A. Artioukov, Brady Benware, J. J. Rocca, Matt Forsythe, Yu. A. Uspenskiǐ, A. Vinogradov	1999	26
19	Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study Ritesh Turakhia, Robin Ward, Sandeep Goel, Brady Benware	2009	22
20	Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis IEEE Design & Test of Computers ·Manish Sharma, Chris Schuermyer, Brady Benware	2009	21

About Brady Benware

Brady Benware is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Nuclear and High Energy Physics, Industrial and Manufacturing Engineering and Radiation, having authored 58 papers that have together received 1.4k indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (36 papers), VLSI and Analog Circuit Testing (36 papers), Atomic and Molecular Physics (13 papers), Advancements in Photolithography Techniques (11 papers), Laser-Plasma Interactions and Diagnostics (10 papers), Industrial Vision Systems and Defect Detection (7 papers), Semiconductor materials and devices (6 papers) and Advanced X-ray Imaging Techniques (5 papers). The work is most often cited by research in Hardware and Architecture (725 citations), Nuclear and High Energy Physics (276 citations), Electrical and Electronic Engineering (992 citations), Structural Biology (24 citations) and Industrial and Manufacturing Engineering (150 citations). Brady Benware has collaborated with scholars based in United States, Hungary and Russia. Frequent co-authors include J. J. Rocca, C. D. Macchietto, C. Moreno, R. Madge, Chris Schuermyer, Huaxing Tang, Manish Sharma, Martin Keim, Janusz Rajski and N. Tamarapalli. Their work appears in journals such as Optics Letters, Physical Review Letters, Optics and Photonics News, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and IEEE Journal of Selected Topics in Quantum Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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