Srikanth Venkataraman

543 total citations
33 papers, 408 citations indexed

About

Srikanth Venkataraman is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, Srikanth Venkataraman has authored 33 papers receiving a total of 408 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Hardware and Architecture, 32 papers in Electrical and Electronic Engineering and 2 papers in Control and Systems Engineering. Recurrent topics in Srikanth Venkataraman's work include VLSI and Analog Circuit Testing (33 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers) and Radiation Effects in Electronics (10 papers). Srikanth Venkataraman is often cited by papers focused on VLSI and Analog Circuit Testing (33 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers) and Radiation Effects in Electronics (10 papers). Srikanth Venkataraman collaborates with scholars based in United States, Malaysia and Ireland. Srikanth Venkataraman's co-authors include W.K. Fuchs, Irith Pomeranz, J.H. Patel, I. Hartanto, Sreejit Chakravarty, E.M. Rudnick, Dong Xiang, Dongok Kim, S.M. Reddy and Ruifeng Guo and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and ACM Transactions on Design Automation of Electronic Systems.

In The Last Decade

Srikanth Venkataraman

33 papers receiving 399 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Srikanth Venkataraman United States 11 395 387 43 42 23 33 408
C. Hora Netherlands 13 447 1.1× 482 1.2× 11 0.3× 36 0.9× 29 1.3× 27 507
R. Raina United States 13 389 1.0× 391 1.0× 16 0.4× 58 1.4× 14 0.6× 29 445
B. Kruseman Netherlands 14 516 1.3× 576 1.5× 12 0.3× 31 0.7× 14 0.6× 35 600
Chris Schuermyer United States 11 400 1.0× 407 1.1× 24 0.6× 39 0.9× 72 3.1× 19 435
Huaxing Tang United States 13 488 1.2× 497 1.3× 17 0.4× 52 1.2× 75 3.3× 28 519
I. Hartanto United States 8 373 0.9× 357 0.9× 38 0.9× 68 1.6× 12 0.5× 15 386
D.B.I. Feltham United States 9 308 0.8× 317 0.8× 17 0.4× 30 0.7× 13 0.6× 13 344
P. Franco United States 8 347 0.9× 377 1.0× 31 0.7× 32 0.8× 3 0.1× 13 401
Sreejit Chakravarty United States 13 485 1.2× 507 1.3× 27 0.6× 55 1.3× 17 0.7× 57 538
S. Eichenberger Netherlands 12 509 1.3× 543 1.4× 9 0.2× 22 0.5× 19 0.8× 25 567

Countries citing papers authored by Srikanth Venkataraman

Since Specialization
Citations

This map shows the geographic impact of Srikanth Venkataraman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Srikanth Venkataraman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Srikanth Venkataraman more than expected).

Fields of papers citing papers by Srikanth Venkataraman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Srikanth Venkataraman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Srikanth Venkataraman. The network helps show where Srikanth Venkataraman may publish in the future.

Co-authorship network of co-authors of Srikanth Venkataraman

This figure shows the co-authorship network connecting the top 25 collaborators of Srikanth Venkataraman. A scholar is included among the top collaborators of Srikanth Venkataraman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Srikanth Venkataraman. Srikanth Venkataraman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hapke, Friedrich, et al.. (2020). Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 40(3). 584–597. 17 indexed citations
2.
Wang, Nai‐Xing, et al.. (2019). Layout Resynthesis by Applying Design-for-manufacturability Guidelines to Avoid Low-coverage Areas of a Cell-based Design. ACM Transactions on Design Automation of Electronic Systems. 24(4). 1–19. 1 indexed citations
3.
Wang, Nai‐Xing, et al.. (2019). Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines. 1022–1027. 4 indexed citations
4.
Wang, Nai‐Xing, et al.. (2018). Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. 14 indexed citations
5.
Pomeranz, Irith & Srikanth Venkataraman. (2018). Interconnect-aware tests to complement gate-exhaustive tests. 1–6. 2 indexed citations
6.
Venkataraman, Srikanth, et al.. (2017). Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. 1–9. 2 indexed citations
7.
Pomeranz, Irith, et al.. (2016). Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25(4). 1497–1505. 3 indexed citations
8.
Pomeranz, Irith, et al.. (2016). A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction. 138–143. 7 indexed citations
9.
Pomeranz, Irith, et al.. (2015). Diagnostic Fail Data Minimization Using an N-Cover Algorithm. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24(3). 1198–1202. 7 indexed citations
10.
Kim, Dongok, et al.. (2010). Defect diagnosis based on DFM guidelines. 206–211. 7 indexed citations
11.
Venkataraman, Srikanth, et al.. (2009). Microprocessor system failures debug and fault isolation methodology. 1–10. 6 indexed citations
12.
13.
Venkataraman, Srikanth, et al.. (2008). Diagnosis of Scan Clock Failures. 67–72. 6 indexed citations
14.
Kim, Dongok, et al.. (2007). Testing for systematic defects based on DFM guidelines. 1–10. 20 indexed citations
15.
Venkataraman, Srikanth. (2007). Does test have a greater role to play in the DFM process?. ScholarWorks@UMassAmherst (University of Massachusetts Amherst). 1–1. 1 indexed citations
16.
Venkataraman, Srikanth, et al.. (2006). Improving Precision Using Mixed-level Fault Diagnosis. 1–10. 36 indexed citations
17.
Pomeranz, Irith, et al.. (2004). Z-sets and z-detections: circuit characteristics that simplify fault diagnosis. Design, Automation, and Test in Europe. 1. 10068. 22 indexed citations
18.
Guo, Ruifeng & Srikanth Venkataraman. (2002). A New Technique for Scan Chain Failure Diagnosis. Proceedings - International Symposium for Testing and Failure Analysis. 30774. 723–732. 7 indexed citations
19.
Venkataraman, Srikanth & W.K. Fuchs. (1997). A deductive technique for diagnosis of bridging faults. International Conference on Computer Aided Design. 562–567. 53 indexed citations
20.
Xiang, Dong, Srikanth Venkataraman, W.K. Fuchs, & J.H. Patel. (1996). Partial scan design based on circuit state information. 807–812. 27 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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