R. Madge

807 total citations
36 papers, 652 citations indexed

About

R. Madge is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering. According to data from OpenAlex, R. Madge has authored 36 papers receiving a total of 652 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 23 papers in Hardware and Architecture and 7 papers in Industrial and Manufacturing Engineering. Recurrent topics in R. Madge's work include Integrated Circuits and Semiconductor Failure Analysis (25 papers), VLSI and Analog Circuit Testing (23 papers) and Industrial Vision Systems and Defect Detection (7 papers). R. Madge is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (25 papers), VLSI and Analog Circuit Testing (23 papers) and Industrial Vision Systems and Defect Detection (7 papers). R. Madge collaborates with scholars based in United States, Canada and Netherlands. R. Madge's co-authors include Brady Benware, W.R. Daasch, Chris Schuermyer, Madan M. Rehani, N. Tamarapalli, J. Rajski, G.L. Ford, Kun-Han Tsai, S.A. Boggs and David A. Turner and has published in prestigious journals such as IEEE Transactions on Power Delivery, IEEE Transactions on Broadcasting and IEEE Power Engineering Review.

In The Last Decade

R. Madge

34 papers receiving 619 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Madge United States 15 561 486 85 75 49 36 652
H. Guzmán-Miranda Spain 12 439 0.8× 295 0.6× 7 0.1× 40 0.5× 12 0.2× 50 472
A. Di Stefano Italy 11 161 0.3× 41 0.1× 19 0.2× 41 0.5× 26 0.5× 30 323
S. Cherubal United States 13 598 1.1× 540 1.1× 13 0.2× 71 0.9× 2 0.0× 22 651
E. Malavasi United States 13 694 1.2× 509 1.0× 36 0.4× 19 0.3× 2 0.0× 41 753
Joseph R. Shinnerl United States 17 747 1.3× 585 1.2× 32 0.4× 18 0.2× 9 0.2× 21 883
Stanisław Hałgas Poland 12 409 0.7× 366 0.8× 50 0.6× 142 1.9× 1 0.0× 65 517
E. Christen United States 6 182 0.3× 101 0.2× 6 0.1× 59 0.8× 2 0.0× 14 274
Wenlong Lyu China 7 272 0.5× 72 0.1× 12 0.1× 27 0.4× 9 0.2× 8 405
Michał Tadeusiewicz Poland 14 533 1.0× 437 0.9× 47 0.6× 184 2.5× 1 0.0× 75 694
Lars Hedrich Germany 14 375 0.7× 325 0.7× 6 0.1× 31 0.4× 2 0.0× 65 528

Countries citing papers authored by R. Madge

Since Specialization
Citations

This map shows the geographic impact of R. Madge's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Madge with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Madge more than expected).

Fields of papers citing papers by R. Madge

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Madge. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Madge. The network helps show where R. Madge may publish in the future.

Co-authorship network of co-authors of R. Madge

This figure shows the co-authorship network connecting the top 25 collaborators of R. Madge. A scholar is included among the top collaborators of R. Madge based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Madge. R. Madge is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Daasch, W.R. & R. Madge. (2006). Variance Reduction and Outliers: Statistical Analysis of Semiconductor Test Data. 19. 304–312. 27 indexed citations
2.
Madge, R.. (2005). New test paradigms for yield and manufacturability - Invited address. 13–13. 1 indexed citations
3.
4.
Benware, Brady, et al.. (2005). Defect screening using independent component analysis on I/sub DDQ/. 427–432. 17 indexed citations
5.
Madge, R.. (2004). ATE Value Add through Open Data Collection. International Test Conference. 1430. 1 indexed citations
6.
Schuermyer, Chris, et al.. (2004). Minimum testing requirements to screen temperature dependent defects. International Test Conference. 300–308. 4 indexed citations
7.
Daasch, W.R., et al.. (2004). Detection of temperature sensitive defects using ZTC. 185–190. 6 indexed citations
8.
Marinissen, Erik Jan, Bart Vermeulen, R. Madge, Michael R. Kessler, & Michael Müller. (2003). Creating value through test. 2003 Design, Automation and Test in Europe Conference and Exhibition. 402–407. 1 indexed citations
9.
10.
Marinissen, Erik Jan, Bart Vermeulen, R. Madge, Michael R. Kessler, & Michael Müller. (2003). Creating Value Through Test. 10402–10409. 2 indexed citations
11.
Madge, R., et al.. (2003). Neighbor selection for variance reduction in I/sub DDQ/ and other parametric data. 1240–1248. 16 indexed citations
12.
Daasch, W.R., et al.. (2002). Neighborhood selection for I/sub DDQ/ outlier screening at wafer sort. IEEE Design & Test of Computers. 19(5). 74–81. 18 indexed citations
13.
Madge, R.. (2001). e-Diagnostics - Can ATE vendors step up to the challenge?. International Test Conference. 1154–1154. 1 indexed citations
14.
Fischer, David S. & R. Madge. (1992). Digital teleprotection units. A technology overview. IEEE Transactions on Power Delivery. 7(4). 1769–1774. 2 indexed citations
15.
Madge, R., et al.. (1992). Power line carrier emissions from transmission lines. IEEE Transactions on Power Delivery. 7(4). 1775–1785. 8 indexed citations
16.
Madge, R., et al.. (1989). Performance of Optical Ground Wires During Fault Current Tests. IEEE Power Engineering Review. 9(7). 39–40. 2 indexed citations
17.
Madge, R., et al.. (1986). Effect of Power Lines on AM Radio Broadcast Radiation Patterns. IEEE Power Engineering Review. PER-6(4). 44–44. 1 indexed citations
18.
Trueman, C.W., et al.. (1984). Comparison of Computed RF Current Flow on a Power Line With Full Scale Measurements. IEEE Transactions on Broadcasting. BC-30(3). 97–107. 13 indexed citations
19.
Boggs, S.A., G.L. Ford, & R. Madge. (1981). Coupling Devices for the Detection of Partial Discharges in Gas-Insulated Switchgear. IEEE Transactions on Power Apparatus and Systems. PAS-100(8). 3969–3973. 30 indexed citations
20.
Boggs, S.A., G.L. Ford, & R. Madge. (1981). Coupling Devices for the Detection of Partial Discharges in Gas-insulated Switchgear. IEEE Power Engineering Review. PER-1(8). 53–54. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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