C. D'Emic
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Radio Frequency Integrated Circuit Design
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- Nanowire Synthesis and Applications
Papers in
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- Advancements in Semiconductor Devices and Circuit Design 5
- Semiconductor materials and devices 4
- Integrated Circuits and Semiconductor Failure Analysis 2
- Thin-Film Transistor Technologies 1
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- Nanowire Synthesis and Applications 2
- Co-authors
- Wilfried HaenschP. M. SolomonJ. JoplingO. DokumaciD.J. FrankP. RonsheimJeng-Bang YauDae-Gyu Park
- Journals
- Journal of Applied Physics (1 paper)OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (1 paper)
- Partner nations
- United States
In The Last Decade
C. D'Emic
5 papers receiving 132 citations
Peers
Comparison fields: 5 of 10
- Electrical and Electronic Engineering 137
- Biomedical Engineering 29
- Atomic and Molecular Physics, and Optics 12
- Instrumentation 1
- Bioengineering 1
Countries citing papers authored by C. D'Emic
This map shows the geographic impact of C. D'Emic's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. D'Emic with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. D'Emic more than expected).
Fields of papers citing papers by C. D'Emic
This network shows the impact of papers produced by C. D'Emic. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. D'Emic. The network helps show where C. D'Emic may publish in the future.
Co-authorship network
The 25 scholars most cited alongside C. D'Emic, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 1 | |
| 2 | 2011 | 24 | |
| 3 | 2004 | 90 | |
| 4 | 2003 | 3 | |
| 5 | Radiation-induced charge trapping in thin Al2O3/SiOxNy/Si(100) gate dielectric stacks. | 2003 | 20 |
About C. D'Emic
C. D'Emic is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Infectious Diseases and Organic Chemistry, having authored 5 papers that have together received 138 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (5 papers), Semiconductor materials and devices (4 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Nanowire Synthesis and Applications (2 papers), Thin-Film Transistor Technologies (1 paper) and Advanced Thermoelectric Materials and Devices (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (137 citations), Biomedical Engineering (29 citations), Atomic and Molecular Physics, and Optics (12 citations), Instrumentation (1 citation) and Bioengineering (1 citation). C. D'Emic has collaborated with scholars based in United States. Frequent co-authors include Wilfried Haensch, P. M. Solomon, J. Jopling, O. Dokumaci, D.J. Frank, P. Ronsheim, Jeng-Bang Yau, Dae-Gyu Park, K. Chan and Jin Cai. Their work appears in journals such as Journal of Applied Physics and OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.