M.W. Savage

568 total citations
23 papers, 475 citations indexed

About

M.W. Savage is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computational Mechanics. According to data from OpenAlex, M.W. Savage has authored 23 papers receiving a total of 475 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Electrical and Electronic Engineering, 3 papers in Hardware and Architecture and 2 papers in Computational Mechanics. Recurrent topics in M.W. Savage's work include Radiation Effects in Electronics (21 papers), Semiconductor materials and devices (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (10 papers). M.W. Savage is often cited by papers focused on Radiation Effects in Electronics (21 papers), Semiconductor materials and devices (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (10 papers). M.W. Savage collaborates with scholars based in United States and France. M.W. Savage's co-authors include S. Büchner, R.L. Pease, L. W. Massengill, Dale McMorrow, J.L. Titus, Y. Boulghassoul, Andrew L. Sternberg, T.L. Turflinger, C. Poivey and J.W. Howard and has published in prestigious journals such as IEEE Transactions on Nuclear Science and Zenodo (CERN European Organization for Nuclear Research).

In The Last Decade

M.W. Savage

22 papers receiving 442 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
M.W. Savage United States	12	460	123	43	40	23	23	475
Alan D. Tipton United States	9	430 0.9×	146 1.2×	44 1.0×	23 0.6×	41 1.8×	13	452
Nathaniel A. Dodds United States	12	375 0.8×	90 0.7×	76 1.8×	27 0.7×	55 2.4×	32	404
Richard S. Flores United States	9	511 1.1×	99 0.8×	18 0.4×	24 0.6×	8 0.3×	18	524
C. Barillot France	8	316 0.7×	78 0.6×	44 1.0×	14 0.3×	26 1.1×	20	345
G. Bruguier France	8	472 1.0×	131 1.1×	27 0.6×	21 0.5×	11 0.5×	20	483
H.S. Kim United States	13	432 0.9×	79 0.6×	29 0.7×	10 0.3×	14 0.6×	19	448
H. R. Schwartz United States	7	228 0.5×	66 0.5×	19 0.4×	19 0.5×	7 0.3×	14	238
R. Marec France	13	426 0.9×	91 0.7×	17 0.4×	13 0.3×	6 0.3×	26	441
Megan C. Casey United States	14	588 1.3×	180 1.5×	21 0.5×	19 0.5×	9 0.4×	60	606
Anthony M. Phan United States	14	601 1.3×	150 1.2×	79 1.8×	17 0.4×	62 2.7×	39	634

Countries citing papers authored by M.W. Savage

Since Specialization

Citations

This map shows the geographic impact of M.W. Savage's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.W. Savage with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.W. Savage more than expected).

Fields of papers citing papers by M.W. Savage

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.W. Savage. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.W. Savage. The network helps show where M.W. Savage may publish in the future.

Co-authorship network of co-authors of M.W. Savage

This figure shows the co-authorship network connecting the top 25 collaborators of M.W. Savage. A scholar is included among the top collaborators of M.W. Savage based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M.W. Savage. M.W. Savage is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Gadlage, Matthew J., A. Roach, Adam R. Duncan, M.W. Savage, & Matthew Kay. (2015). Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage. IEEE Transactions on Nuclear Science. 62(6). 2717–2724. 38 indexed citations

Turflinger, T.L., et al.. (2015). RHA Implications of Proton on Gold-Plated Package Structures in SEE Evaluations. IEEE Transactions on Nuclear Science. 62(6). 2468–2475. 15 indexed citations

Kay, Matthew, et al.. (2013). Using Charge Accumulation to Improve the Radiation Tolerance of Multi-Gb NAND Flash Memories. IEEE Transactions on Nuclear Science. 60(6). 4214–4219. 8 indexed citations

Gadlage, Matthew J., et al.. (2012). Impact of Neutron-Induced Displacement Damage on the Multiple Bit Upset Sensitivity of a Bulk CMOS SRAM. IEEE Transactions on Nuclear Science. 59(6). 2722–2728. 7 indexed citations

Büchner, S., Dale McMorrow, C. Poivey, et al.. (2004). Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions. IEEE Transactions on Nuclear Science. 51(5). 2776–2781. 48 indexed citations

Savage, M.W., T.L. Turflinger, J.L. Titus, R.L. Pease, & C. Poivey. (2004). Characterization of SET response of the LM124A the LM111, and the LM6144. 121–126. 11 indexed citations

Boulghassoul, Y., S. Büchner, Dale McMorrow, et al.. (2004). Investigation of millisecond-long analog single-event transients in the LM6144 op amp. IEEE Transactions on Nuclear Science. 51(6). 3529–3536. 26 indexed citations

Savage, M.W., J.L. Titus, T.L. Turflinger, R.L. Pease, & C. Poivey. (2004). A comprehensive analog single-event transient analysis methodology. IEEE Transactions on Nuclear Science. 51(6). 3546–3552. 12 indexed citations

Massengill, L. W., Y. Boulghassoul, Andrew L. Sternberg, et al.. (2003). Focused-lon-beam assisted bipolar transistor characterization and analog single-event transient circuit analysis of the OP27. 133–140. 2 indexed citations

10.

Savage, M.W., T.L. Turflinger, J.L. Titus, et al.. (2003). Variations in SET pulse shapes in the LM124A and LM111. Zenodo (CERN European Organization for Nuclear Research). 75–81. 26 indexed citations

11.

Titus, J.L., et al.. (2003). Simulation study of single-event gate rupture using radiation-hardened stripe cell power MOSFET structures. IEEE Transactions on Nuclear Science. 50(6). 2256–2264. 32 indexed citations

12.

Sternberg, Andrew L., L. W. Massengill, S. Büchner, et al.. (2002). The role of parasitic elements in the single-event transient response of linear circuits. IEEE Transactions on Nuclear Science. 49(6). 3115–3120. 44 indexed citations

13.

Pease, R.L., M.C. Maher, M.R. Shaneyfelt, et al.. (2002). Total-dose hardening of a bipolar-voltage comparator. IEEE Transactions on Nuclear Science. 49(6). 3180–3184. 10 indexed citations

14.

Boulghassoul, Y., L. W. Massengill, Andrew L. Sternberg, et al.. (2002). Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis. IEEE Transactions on Nuclear Science. 49(6). 3090–3096. 47 indexed citations

15.

Savage, M.W., T.L. Turflinger, J.W. Howard, & S. Büchner. (2002). A compendium of single event transient data. 134–141. 6 indexed citations

16.

McNulty, P.J., M.W. Savage, David R. Roth, & C.C. Foster. (2002). Proton SEU rate predictions. 570–575.

17.

Savage, M.W., et al.. (2001). An improved stripe-cell SEGR hardened power MOSFET technology. IEEE Transactions on Nuclear Science. 48(6). 1872–1878. 23 indexed citations

18.

McNulty, P.J., et al.. (2001). Single-chip dosimeters to accompany photometric systems flown in space. IEEE Transactions on Nuclear Science. 48(6). 2039–2042. 3 indexed citations

19.

Krieg, J., et al.. (2000). Comparison of total dose effects on a voltage reference fabricated on bonded-wafer and polysilicon dielectric isolation. IEEE Transactions on Nuclear Science. 47(6). 2561–2567. 2 indexed citations

20.

Savage, M.W., P.J. McNulty, David R. Roth, & C.C. Foster. (1998). Possible role for secondary particles in proton-induced single event upsets of modern devices. IEEE Transactions on Nuclear Science. 45(6). 2745–2751. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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