L.C. Riewe
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
Papers in ⓘ
-
- Semiconductor materials and devices 22
- Advancements in Semiconductor Devices and Circuit Design 17
- Radiation Effects in Electronics 14
- Integrated Circuits and Semiconductor Failure Analysis 12
- Silicon Carbide Semiconductor Technologies 1
- Advancements in Battery Materials 1
- CCD and CMOS Imaging Sensors 1
- Co-authors
- Daniel M. Fleetwood (20 shared papers)P.S. Winokur (16 shared papers)M.R. Shaneyfelt (14 shared papers)J.R. Schwank (8 shared papers)R.A. Reber (5 shared papers)T.L. Meisenheimer (2 shared papers)S.C. Witczak (5 shared papers)R.L. Pease (6 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (17 papers)Journal of Applied Physics (2 papers)Microelectronics Reliability (1 paper)University of North Texas Digital Library (University of North Texas) (2 papers)OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (1 paper)
- Partner nations
- United StatesFrance
In The Last Decade
L.C. Riewe
24 papers receiving 1.3k citations
Hit Papers
Peers
Comparison fields: 5 of 39
- Electrical and Electronic Engineering 1.4k
- Hardware and Architecture 58
- Radiation 33
- Materials Chemistry 160
- Atomic and Molecular Physics, and Optics 90
Countries citing papers authored by L.C. Riewe
This map shows the geographic impact of L.C. Riewe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L.C. Riewe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L.C. Riewe more than expected).
Fields of papers citing papers by L.C. Riewe
This network shows the impact of papers produced by L.C. Riewe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L.C. Riewe. The network helps show where L.C. Riewe may publish in the future.
Co-authors
The 25 scholars most cited alongside L.C. Riewe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Effects of oxide traps, interface traps, and ‘‘border traps’’ on metal-oxide-semiconductor devices Hit paper breakdown → | 1993 | 393 |
| 2 | 1996 | 143 | |
| 3 | 1995 | 104 | |
| 4 | 1992 | 78 | |
| 5 | 1989 | 76 | |
| 6 | 2000 | 70 | |
| 7 | 1993 | 70 | |
| 8 | 1991 | 69 | |
| 9 | 2002 | 68 | |
| 10 | 1988 | 68 | |
| 11 | 1990 | 62 | |
| 12 | 2000 | 51 | |
| 13 | 1998 | 44 | |
| 14 | 1998 | 33 | |
| 15 | 1999 | 25 | |
| 16 | 2003 | 20 | |
| 17 | 1999 | 15 | |
| 18 | 1991 | 11 | |
| 19 | 2001 | 6 | |
| 20 | Thermal-stress effects on enhanced low-dose-rate sensitivity of linear bipolar circuits | 2000 | 5 |
About L.C. Riewe
L.C. Riewe is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Materials Chemistry, Infectious Diseases and Organic Chemistry, having authored 24 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Radiation Effects in Electronics (14 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Silicon Carbide Semiconductor Technologies (1 paper), Advancements in Battery Materials (1 paper), Electronic and Structural Properties of Oxides (1 paper) and CCD and CMOS Imaging Sensors (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Hardware and Architecture (58 citations), Radiation (33 citations), Materials Chemistry (160 citations) and Atomic and Molecular Physics, and Optics (90 citations). L.C. Riewe has collaborated with scholars based in United States and France. Frequent co-authors include Daniel M. Fleetwood, P.S. Winokur, M.R. Shaneyfelt, J.R. Schwank, R.A. Reber, T.L. Meisenheimer, S.C. Witczak, R.L. Pease, Ronald D. Schrimpf and W. L. Warren. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Applied Physics, Microelectronics Reliability, University of North Texas Digital Library (University of North Texas) and OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.