H. Ryssel
About
In The Last Decade
H. Ryssel
383 papers receiving 4.6k citations
Peers
Comparison fields: 5 of 123
- Electrical and Electronic Engineering 3.3k
- Computational Mechanics 1.4k
- Materials Chemistry 1.4k
- Atomic and Molecular Physics, and Optics 1.2k
- Biomedical Engineering 780
Countries citing papers authored by H. Ryssel
This map shows the geographic impact of H. Ryssel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Ryssel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Ryssel more than expected).
Fields of papers citing papers by H. Ryssel
This network shows the impact of papers produced by H. Ryssel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Ryssel. The network helps show where H. Ryssel may publish in the future.
Co-authorship network of co-authors of H. Ryssel
This figure shows the co-authorship network connecting the top 25 collaborators of H. Ryssel. A scholar is included among the top collaborators of H. Ryssel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Ryssel. H. Ryssel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 10 | |
| 3 | 3 | |
| 4 | 2000 International Conference on Ion Implantation Technology proceedings : Ion implantation technology-2000 , Alpbach, Austria, 17-22 September 2000 | 4 |
| 5 | 16 | |
| 6 | 16 | |
| 7 | Simulation of the Production of Functional Layers for Vibration Sensors for Tool State Monitoring and Finite Element Analysis of Mechanical Characteristics | 1 |
| 8 | Investigation of the Suppression of the Narrow Channel Effect in Deep Sub-Micron EXTIGATE Transistors | 2 |
| 9 | 3 | |
| 10 | Optimization of Critical Ion Implantation Steps in 0.18 um CMOS Technology | 2 |
| 11 | pH Sensing Properties of ISFETs with LPCVD Silicon Nitride Sensitive-Gate | 3 |
| 12 | 15 | |
| 13 | Simulation of semiconductor devices and processes, vol. 6 | 0 |
| 14 | 6 | |
| 15 | 7 | |
| 16 | Ion implantation models for process simulation | 3 |
| 17 | 1 | |
| 18 | 3 | |
| 19 | 7 | |
| 20 | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.