T. Bret

863 total citations
31 papers, 739 citations indexed

About

T. Bret is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Structural Biology. According to data from OpenAlex, T. Bret has authored 31 papers receiving a total of 739 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Surfaces, Coatings and Films, 21 papers in Electrical and Electronic Engineering and 11 papers in Structural Biology. Recurrent topics in T. Bret's work include Electron and X-Ray Spectroscopy Techniques (22 papers), Advancements in Photolithography Techniques (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). T. Bret is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (22 papers), Advancements in Photolithography Techniques (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). T. Bret collaborates with scholars based in Switzerland, Germany and Belgium. T. Bret's co-authors include P. Hoffmann, Ivo Utke, R. Jonckheere, P. Doppelt, Dieter Van den Heuvel, M. Waiblinger, A. H. Bachmann, A. Perentes, Klaus Edinger and Todd Brintlinger and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Applied Surface Science.

In The Last Decade

T. Bret

31 papers receiving 709 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
T. Bret Switzerland 17 443 423 279 253 152 31 739
Erik M. Secula United States 11 349 0.8× 124 0.3× 47 0.2× 106 0.4× 182 1.2× 156 591
Ivan Pollentier Belgium 17 805 1.8× 285 0.7× 18 0.1× 37 0.1× 123 0.8× 97 916
L. Frank Czechia 13 285 0.6× 378 0.9× 212 0.8× 18 0.1× 123 0.8× 69 519
Dan Herr United States 10 206 0.5× 76 0.2× 37 0.1× 65 0.3× 131 0.9× 68 389
L. Clément France 9 244 0.6× 112 0.3× 174 0.6× 15 0.1× 143 0.9× 34 465
Roberto Fallica Belgium 16 589 1.3× 227 0.5× 9 0.0× 37 0.1× 280 1.8× 62 736
F. Lorut France 11 298 0.7× 73 0.2× 66 0.2× 17 0.1× 109 0.7× 51 459
Claudia Menozzi Italy 12 193 0.4× 48 0.1× 44 0.2× 32 0.1× 126 0.8× 20 533
W. Bergholz Germany 13 774 1.7× 35 0.1× 13 0.0× 68 0.3× 183 1.2× 40 852
Victor Callegari Switzerland 9 297 0.7× 81 0.2× 30 0.1× 67 0.3× 144 0.9× 15 627

Countries citing papers authored by T. Bret

Since Specialization
Citations

This map shows the geographic impact of T. Bret's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Bret with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Bret more than expected).

Fields of papers citing papers by T. Bret

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Bret. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Bret. The network helps show where T. Bret may publish in the future.

Co-authorship network of co-authors of T. Bret

This figure shows the co-authorship network connecting the top 25 collaborators of T. Bret. A scholar is included among the top collaborators of T. Bret based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Bret. T. Bret is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bret, T., et al.. (2014). Industrial perspective on focused electron beam-induced processes. Applied Physics A. 117(4). 1607–1614. 27 indexed citations
2.
Erdmann, Andreas, Peter Evanschitzky, T. Bret, & R. Jonckheere. (2013). Modeling strategies for EUV mask multilayer defect dispositioning and repair. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8679. 86790Y–86790Y. 7 indexed citations
3.
Erdmann, Andreas, Peter Evanschitzky, T. Bret, & R. Jonckheere. (2012). Analysis of EUV mask multilayer defect printing characteristics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8322. 83220E–83220E. 10 indexed citations
4.
Waiblinger, M., et al.. (2012). The door opener for EUV mask repair. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8441. 84410F–84410F. 5 indexed citations
5.
Bret, T., et al.. (2012). Closing the gap for EUV mask repair. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8322. 83220C–83220C. 24 indexed citations
6.
Bret, T., et al.. (2012). Improving extreme UV lithography mask repair. SPIE Newsroom. 1 indexed citations
7.
Jonckheere, R., Dieter Van den Heuvel, T. Bret, et al.. (2011). Additional evidence of EUV blank defects first seen by wafer printing. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8166. 81660E–81660E. 11 indexed citations
8.
Jonckheere, R., et al.. (2011). Repair of natural EUV reticle defects. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8166. 81661G–81661G. 34 indexed citations
9.
Erdmann, Andreas, Peter Evanschitzky, Feng Shao, et al.. (2011). Predictive modeling of EUV-lithography: the role of mask, optics, and photoresist effects. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8171. 81710M–81710M. 10 indexed citations
10.
Jonckheere, R., Dieter Van den Heuvel, T. Bret, et al.. (2011). Evidence of printing blank-related defects on EUV masks missed by blank inspection. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7985. 79850W–79850W. 20 indexed citations
11.
Heuvel, Dieter Van den, R. Jonckheere, Tsukasa Abe, et al.. (2010). Natural EUV mask blank defects: evidence, timely detection, analysis and outlook. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7823. 78231T–78231T. 18 indexed citations
12.
Bret, T., et al.. (2006). Electron range effects in focused electron beam induced deposition of 3D nanostructures. Microelectronic Engineering. 83(4-9). 1482–1486. 42 indexed citations
13.
Boero, Giovanni, Ivo Utke, T. Bret, et al.. (2005). Submicrometer Hall devices fabricated by focused electron-beam-induced deposition. Applied Physics Letters. 86(4). 42503–42503. 74 indexed citations
14.
Bret, T., et al.. (2005). Light-Induced CVD of Titanium Dioxide Thin Films I: Kinetics of Deposition. Chemical Vapor Deposition. 11(1). 21–28. 6 indexed citations
15.
Hoffmann, P., Ivo Utke, A. Perentes, et al.. (2005). Comparison of fabrication methods of sub-100nm nano-optical structures and devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5925. 592506–592506. 15 indexed citations
16.
Bret, T., Ivo Utke, C. Gaillard, & P. Hoffmann. (2004). Periodic structure formation by focused electron-beam-induced deposition. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(5). 2504–2510. 32 indexed citations
17.
Utke, Ivo, T. Bret, Fabio Cicoira, et al.. (2004). Comparative Study of Cu Precursors for 3D Focused Electron Beam Induced Deposition. Journal of The Electrochemical Society. 151(8). C535–C535. 34 indexed citations
18.
Utke, Ivo, T. Bret, Fabio Cicoira, et al.. (2004). Comparative Study of Cu-Precursors for 3D Focused Electron Beam Induced Deposition [J. Electrochem. Soc., 151, C535 (2004)] [J. Electrochem. Soc., 151, C590 (2004)]. Journal of The Electrochemical Society. 152(1). L1–L1. 2 indexed citations
19.
Sandu, C.S., V. S. Teodorescu, Corneliu Ghica, et al.. (2003). Excimer Laser Crystallization of SnO2:Sb Sol-Gel Films. Journal of Sol-Gel Science and Technology. 28(2). 227–234. 9 indexed citations
20.
Bret, T., Ivo Utke, A. H. Bachmann, & P. Hoffmann. (2003). In situ control of the focused-electron-beam-induced deposition process. Applied Physics Letters. 83(19). 4005–4007. 53 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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