Jonathan Cobb
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 14
- Optical Coatings and Gratings 4
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- Advancements in Photolithography Techniques 38
- Integrated Circuits and Semiconductor Failure Analysis 18
- Semiconductor materials and devices 11
- 3D IC and TSV technologies 4
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- Advanced Surface Polishing Techniques 5
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- Copper Interconnects and Reliability 5
- Co-authors
- Robert L. BrainardNeil M. ZimmermanA. F. ClarkCharlotte CutlerScott D. HectorUzodinma OkoroanyanwuFrances A. HouleVeena Rao
- Journals
- Journal of Photopolymer Science and Technology (2 papers)Physical review. B, Condensed matter (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (2 papers)
- Partner nations
- United StatesFranceSouth Korea
In The Last Decade
Jonathan Cobb
39 papers receiving 284 citations
Peers
Comparison fields: 5 of 26
- Surfaces, Coatings and Films 92
- Electrical and Electronic Engineering 282
- Biomedical Engineering 106
- Radiation 21
- Hardware and Architecture 15
Countries citing papers authored by Jonathan Cobb
This map shows the geographic impact of Jonathan Cobb's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jonathan Cobb with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jonathan Cobb more than expected).
Fields of papers citing papers by Jonathan Cobb
This network shows the impact of papers produced by Jonathan Cobb. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jonathan Cobb. The network helps show where Jonathan Cobb may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Jonathan Cobb, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2021 | 4 | |
| 2 | 2020 | 3 | |
| 3 | 2011 | 3 | |
| 4 | 2008 | 8 | |
| 5 | 2007 | 3 | |
| 6 | 2005 | 3 | |
| 7 | 2005 | 4 | |
| 8 | 2005 | 2 | |
| 9 | 2004 | 2 | |
| 10 | 2004 | 1 | |
| 11 | 2004 | 9 | |
| 12 | 2004 | 2 | |
| 13 | 2003 | 33 | |
| 14 | 2003 | 7 | |
| 15 | 2003 | 4 | |
| 16 | 2002 | 4 | |
| 17 | 2002 | 5 | |
| 18 | 2001 | 1 | |
| 19 | 2000 | 3 | |
| 20 | 1997 | 45 |
About Jonathan Cobb
Jonathan Cobb is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Hardware and Architecture and Electronic, Optical and Magnetic Materials, having authored 41 papers that have together received 312 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (38 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Electron and X-Ray Spectroscopy Techniques (14 papers), Semiconductor materials and devices (11 papers), Copper Interconnects and Reliability (5 papers), Advanced Surface Polishing Techniques (5 papers), 3D IC and TSV technologies (4 papers) and Optical Coatings and Gratings (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (92 citations), Electrical and Electronic Engineering (282 citations), Biomedical Engineering (106 citations), Radiation (21 citations) and Hardware and Architecture (15 citations). Jonathan Cobb has collaborated with scholars based in United States, France and South Korea. Frequent co-authors include Robert L. Brainard, Neil M. Zimmerman, A. F. Clark, Charlotte Cutler, Scott D. Hector, Uzodinma Okoroanyanwu, Frances A. Houle, Veena Rao, Craig C. Henderson and Gregg M. Gallatin. Their work appears in journals such as Journal of Photopolymer Science and Technology, Physical review. B, Condensed matter, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and MRS Proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.