Luca Pirro

613 total citations
32 papers, 193 citations indexed

About

Luca Pirro is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Luca Pirro has authored 32 papers receiving a total of 193 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 3 papers in Biomedical Engineering and 2 papers in Materials Chemistry. Recurrent topics in Luca Pirro's work include Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Ferroelectric and Negative Capacitance Devices (12 papers). Luca Pirro is often cited by papers focused on Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Ferroelectric and Negative Capacitance Devices (12 papers). Luca Pirro collaborates with scholars based in Germany, France and India. Luca Pirro's co-authors include Konrad Seidel, Yannick Raffel, Thomas Kämpfe, G. Ghibaudo, Maximilian Lederer, Sourav De, Ricardo Olivo, Raik Hoffmann, M. Vinet and Johannes Heitmann and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Luca Pirro

31 papers receiving 193 citations

Peers

Luca Pirro

EEE

AMPO

J. Mazurier France

R. Ranica France

R. Mo United States

John Ellis-Monaghan United States

Uma Sharma India

P. Fonteneau France

M. Bawedin France

G.O. Workman United States

T.C. Ong United States

Stanisław Stopiński Poland

J. Mazurier France

Luca Pirro

175 ×0.9

EEE

13 ×0.6

AMPO

10 ×0.6

17 ×1.2

2 ×0.4

Citations per year, relative to Luca Pirro Luca Pirro (= 1×) peers J. Mazurier

Countries citing papers authored by Luca Pirro

Since Specialization

Citations

This map shows the geographic impact of Luca Pirro's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Luca Pirro with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Luca Pirro more than expected).

Fields of papers citing papers by Luca Pirro

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Luca Pirro. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Luca Pirro. The network helps show where Luca Pirro may publish in the future.

Co-authorship network of co-authors of Luca Pirro

This figure shows the co-authorship network connecting the top 25 collaborators of Luca Pirro. A scholar is included among the top collaborators of Luca Pirro based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Luca Pirro. Luca Pirro is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Raffel, Yannick, Gautham Kumar, Ricardo Olivo, et al.. (2025). Defect Dynamics in Silicon-Doped HfO₂-Based Front-End-of-Line FeFETs: Insights From Low-Frequency Noise on Doping Concentration, Interfaces, and Write Cycling. IEEE Transactions on Electron Devices. 72(6). 3307–3313. 3 indexed citations

Lederer, Maximilian, Yannick Raffel, Luca Pirro, et al.. (2024). Spike-Time Dependent Plasticity in HfO₂-Based Ferroelectric FET Synapses. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–3. 1 indexed citations

Müller, Franz, Yannick Raffel, Maximilian Lederer, et al.. (2023). Fixed charges at the HfO 2 /SiO2 interface: Impact on the memory window of FeFET. SHILAP Revista de lepidopterología. 4. 100050–100050. 2 indexed citations

Yadav, Nandakishor, Yannick Raffel, Ricardo Olivo, et al.. (2023). Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device. 63. 1–4.

De, Sourav, Franz Müller, Maximilian Lederer, et al.. (2023). 28nm HKMG 1F-1R² Multilevel Memory for Inference Engine Application. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–2. 2 indexed citations

Raffel, Yannick, Franz Müller, Maximilian Lederer, et al.. (2023). 28 nm high-k-metal gate ferroelectric field effect transistors based synapses — A comprehensive overview. SHILAP Revista de lepidopterología. 4. 100048–100048. 6 indexed citations

Raffel, Yannick, Maximilian Drescher, Ricardo Olivo, et al.. (2022). Three Level Charge Pumping On Dielectric Hafnium Oxide Gate. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–4. 2 indexed citations

Raffel, Yannick, Sourav De, Maximilian Lederer, et al.. (2022). Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO₂-Based FeFETs for In-Memory-Computing Applications. ACS Applied Electronic Materials. 4(11). 5292–5300. 23 indexed citations

Raffel, Yannick, Maximilian Lederer, Ricardo Olivo, et al.. (2022). Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 8–11. 7 indexed citations

10.

Raffel, Yannick, Ricardo Olivo, Maximilian Lederer, et al.. (2022). Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–4. 17 indexed citations

11.

Hueting, R.J.E., et al.. (2020). Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current. IEEE Transactions on Electron Devices. 68(2). 497–502. 5 indexed citations

12.

Raffel, Yannick, Konrad Seidel, Luca Pirro, et al.. (2020). Impact of Channel Implant Variation on RTN and Flicker Noise. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 1–4. 8 indexed citations

13.

Zhao, Zhixing, Steffen Lehmann, Luca Lucci, et al.. (2019). 22FDX^® f_MAX Optimization through Parasitics Reduction and GM Boost. SPIRE - Sciences Po Institutional REpository. 166–169. 11 indexed citations

14.

Andrieu, F., Luca Pirro, G. Cibrario, et al.. (2018). Design Technology Co-Optimization in advanced FDSOI CMOS around the Minimum Energy Point: body biasing and within-cell V<inf>T</inf>-mixing. HAL (Le Centre pour la Communication Scientifique Directe). 153–154. 4 indexed citations

15.

Watts, Josef, Kok Wai Chew, Steffen Lehmann, et al.. (2017). RF-pFET in fully depleted SOI demonstrates 420 GHz F_T. 84–87. 6 indexed citations

16.

Pirro, Luca, I. Ionica, G. Ghibaudo, et al.. (2016). Interface trap density evaluation on bare silicon-on-insulator wafers using the quasi-static capacitance technique. Journal of Applied Physics. 119(17). 8 indexed citations

17.

Pirro, Luca, I. Ionica, S. Cristoloveanu, & G. Ghibaudo. (2016). Low-frequency noise in bare SOI wafers: Experiments and model. Solid-State Electronics. 125. 167–174. 1 indexed citations

18.

Pirro, Luca, I. Ionica, Việt Hương Nguyễn, et al.. (2015). Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers. Solid-State Electronics. 115. 237–243. 1 indexed citations

19.

Pirro, Luca, et al.. (2015). Split-Capacitance and Conductance-Frequency Characteristics of SOI Wafers in Pseudo-MOSFET Configuration. IEEE Transactions on Electron Devices. 62(9). 2717–2723. 5 indexed citations

20.

Pirro, Luca, et al.. (2012). Low-temperature pseudo-metal-oxide-semiconductor field-effect transistor measurements on bare silicon-on-insulator wafers. Applied Physics Letters. 101(9). 92110–92110. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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