Yannick Raffel

516 total citations
40 papers, 285 citations indexed

About

Yannick Raffel is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Polymers and Plastics. According to data from OpenAlex, Yannick Raffel has authored 40 papers receiving a total of 285 indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Electrical and Electronic Engineering, 6 papers in Materials Chemistry and 1 paper in Polymers and Plastics. Recurrent topics in Yannick Raffel's work include Semiconductor materials and devices (37 papers), Ferroelectric and Negative Capacitance Devices (36 papers) and Advanced Memory and Neural Computing (22 papers). Yannick Raffel is often cited by papers focused on Semiconductor materials and devices (37 papers), Ferroelectric and Negative Capacitance Devices (36 papers) and Advanced Memory and Neural Computing (22 papers). Yannick Raffel collaborates with scholars based in Germany, India and Taiwan. Yannick Raffel's co-authors include Thomas Kämpfe, Maximilian Lederer, Konrad Seidel, Sourav De, Franz Müller, Tarek Ali, Ricardo Olivo, Raik Hoffmann, Sven Beyer and Luca Pirro and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and IEEE Transactions on Electron Devices.

In The Last Decade

Yannick Raffel

35 papers receiving 285 citations

Peers

Yannick Raffel

EEE

Sourav De Germany

Matthew San Jose United States

Osbert Cheng Taiwan

Marko Simicic Belgium

Sung-Min Yoon South Korea

S. Deora United States

Xinlv Duan China

Goedele Potoms Belgium

Sanghoon Baek South Korea

Yongwen Sun United States

Sourav De Germany

Yannick Raffel

474 ×1.7

EEE

90 ×1.7

21 ×2.6

12 ×2.0

Citations per year, relative to Yannick Raffel Yannick Raffel (= 1×) peers Sourav De

Countries citing papers authored by Yannick Raffel

Since Specialization

Citations

This map shows the geographic impact of Yannick Raffel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yannick Raffel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yannick Raffel more than expected).

Fields of papers citing papers by Yannick Raffel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yannick Raffel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yannick Raffel. The network helps show where Yannick Raffel may publish in the future.

Co-authorship network of co-authors of Yannick Raffel

This figure shows the co-authorship network connecting the top 25 collaborators of Yannick Raffel. A scholar is included among the top collaborators of Yannick Raffel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yannick Raffel. Yannick Raffel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Kumar, Gautham, et al.. (2025). Trapping Dynamics and Endurance in HfO ₂ -FeFETs: An Insight From Charge Pumping. IEEE Electron Device Letters. 46(11). 2014–2017.

Kumar, Gautham, Deepak Bhatnagar, Yannick Raffel, et al.. (2025). Spike-Timing Dependent Learning Dynamics in Silicon-Doped Hafnium-Oxide-Based Ferroelectric Field Effect Transistors. IEEE Journal of the Electron Devices Society. 13. 762–768. 1 indexed citations

Raffel, Yannick, Gautham Kumar, Ricardo Olivo, et al.. (2025). Defect Dynamics in Silicon-Doped HfO₂-Based Front-End-of-Line FeFETs: Insights From Low-Frequency Noise on Doping Concentration, Interfaces, and Write Cycling. IEEE Transactions on Electron Devices. 72(6). 3307–3313. 3 indexed citations

Lehninger, David, Franz Müller, Yannick Raffel, et al.. (2025). Ferroelectric Hafnium Oxide: A Potential Game‐Changer for Nanoelectronic Devices and Systems. Advanced Electronic Materials. 11(7). 3 indexed citations

Pande, Sandeep Dwarkanath, Yannick Raffel, Maximilian Lederer, et al.. (2024). FeFET based LIF Neuron with Learnable Threshold and Time Constant. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–2. 1 indexed citations

Lederer, Maximilian, Yannick Raffel, Luca Pirro, et al.. (2024). Spike-Time Dependent Plasticity in HfO₂-Based Ferroelectric FET Synapses. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–3. 1 indexed citations

Lederer, Maximilian, Yannick Raffel, Franz Müller, et al.. (2024). Ferroelectric Field Effect Transistors–Based Content‐Addressable Storage‐Class Memory: A Study on the Impact of Device Variation and High‐Temperature Compatibility. SHILAP Revista de lepidopterología. 6(4). 5 indexed citations

Raffel, Yannick, Ricardo Olivo, Franz Müller, et al.. (2024). Ferroelectric FETs as Embedded NVRAM Supporting Cryogenic Quantum Processors. 1–5.

Olivo, Ricardo, et al.. (2024). Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectric Field Effect Transistor. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–3. 2 indexed citations

10.

Müller, Franz, Yannick Raffel, Maximilian Lederer, et al.. (2023). Fixed charges at the HfO 2 /SiO2 interface: Impact on the memory window of FeFET. SHILAP Revista de lepidopterología. 4. 100050–100050. 2 indexed citations

11.

Raffel, Yannick, Ricardo Olivo, Maik Simon, et al.. (2023). Importance of temperature dependence of interface traps in high-k metal gate stacks for silicon spin-qubit development. Applied Physics Letters. 123(3). 5 indexed citations

12.

Yadav, Nandakishor, Yannick Raffel, Ricardo Olivo, et al.. (2023). Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device. 63. 1–4.

13.

Parmar, Vivek, Franz Müller, Sandeep Kaur Kingra, et al.. (2023). Demonstration of Differential Mode Ferroelectric Field‐Effect Transistor Array‐Based in‐Memory Computing Macro for Realizing Multiprecision Mixed‐Signal Artificial Intelligence Accelerator. SHILAP Revista de lepidopterología. 5(6). 12 indexed citations

14.

Lehninger, David, Shawn Sanctis, Yannick Raffel, et al.. (2023). Ferroelectric Content-Addressable Memory Cells with IGZO Channel: Impact of Retention Degradation on the Multibit Operation. ACS Applied Electronic Materials. 5(2). 812–820. 15 indexed citations

15.

De, Sourav, Franz Müller, Maximilian Lederer, et al.. (2023). 28nm HKMG 1F-1R² Multilevel Memory for Inference Engine Application. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–2. 2 indexed citations

16.

Raffel, Yannick, Maximilian Drescher, Ricardo Olivo, et al.. (2022). Three Level Charge Pumping On Dielectric Hafnium Oxide Gate. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–4. 2 indexed citations

17.

Raffel, Yannick, Sourav De, Maximilian Lederer, et al.. (2022). Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO₂-Based FeFETs for In-Memory-Computing Applications. ACS Applied Electronic Materials. 4(11). 5292–5300. 23 indexed citations

18.

Raffel, Yannick, Maximilian Lederer, Ricardo Olivo, et al.. (2022). Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 8–11. 7 indexed citations

19.

Raffel, Yannick, Ricardo Olivo, Maximilian Lederer, et al.. (2022). Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–4. 17 indexed citations

20.

Müller, Franz, Ricardo Olivo, Konstantin Mertens, et al.. (2021). Influence of microstructure on the variability and current percolation paths in ferroelectric hafnium oxide based neuromorphic FeFET synapses. Lirias (KU Leuven). 1–2. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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