F. Bijkerk
Impact in
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 1%
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 36
- Optical Coatings and Gratings 35
- Radiation 35
- Co-authors
- Robbert Wilhelmus Elisabeth van de KruijsAndrey YakshinE. ZoethoutE. LouisChris LeeJacobus M. SturmEric LouisV. V. Medvedev
- Journals
- Journal of Applied Physics (31 papers)Optics Express (17 papers)Applied Surface Science (15 papers)Thin Solid Films (10 papers)Optics Letters (7 papers)
- Partner nations
- NetherlandsRussiaGermany
In The Last Decade
F. Bijkerk
223 papers receiving 3.0k citations
Peers
Comparison fields: 5 of 81
- Surfaces, Coatings and Films 590
- Radiation 620
- Structural Biology 59
- Computational Mechanics 716
- Atomic and Molecular Physics, and Optics 949
Countries citing papers authored by F. Bijkerk
This map shows the geographic impact of F. Bijkerk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Bijkerk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Bijkerk more than expected).
Fields of papers citing papers by F. Bijkerk
This network shows the impact of papers produced by F. Bijkerk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Bijkerk. The network helps show where F. Bijkerk may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Bijkerk, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 5 | |
| 2 | 2022 | 1 | |
| 3 | 2021 | 5 | |
| 4 | 2020 | 5 | |
| 5 | 2020 | 1 | |
| 6 | 2013 | 7 | |
| 7 | 2013 | 17 | |
| 8 | 2012 | 15 | |
| 9 | 2012 | 3 | |
| 10 | 2012 | 11 | |
| 11 | 2012 | 7 | |
| 12 | 2011 | 11 | |
| 13 | 2011 | 16 | |
| 14 | 2009 | 13 | |
| 15 | 2009 | 13 | |
| 16 | 2009 | 2 | |
| 17 | 2009 | 23 | |
| 18 | 2007 | 32 | |
| 19 | 2006 | 1 | |
| 20 | 2000 | 40 |
About F. Bijkerk
F. Bijkerk is a scholar working on Surfaces, Coatings and Films, Radiation, Computational Mechanics, Atomic and Molecular Physics, and Optics and Structural Biology, having authored 226 papers that have together received 3.2k indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (42 papers), Semiconductor materials and devices (41 papers), Advancements in Photolithography Techniques (38 papers), Electron and X-Ray Spectroscopy Techniques (36 papers), Optical Coatings and Gratings (35 papers), Semiconductor materials and interfaces (32 papers), Metal and Thin Film Mechanics (32 papers) and Diamond and Carbon-based Materials Research (31 papers). The work is most often cited by research in Surfaces, Coatings and Films (590 citations), Radiation (620 citations), Structural Biology (59 citations), Computational Mechanics (716 citations) and Atomic and Molecular Physics, and Optics (949 citations). F. Bijkerk has collaborated with scholars based in Netherlands, Russia and Germany. Frequent co-authors include Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin, E. Zoethout, E. Louis, Chris Lee, Jacobus M. Sturm, Eric Louis, V. V. Medvedev, Igor A. Makhotkin and Ileana Nedelcu. Their work appears in journals such as Journal of Applied Physics, Optics Express, Applied Surface Science, Thin Solid Films and Optics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.