K. Pinardi

555 citations

26 papers · 463 indexed · h-index 10

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electronic Packaging and Soldering Technologies
- Integrated Circuits and Semiconductor Failure Analysis
Condensed Matter Physics
- GaN-based semiconductor devices and materials

Papers in

Condensed Matter Physics 5
- GaN-based semiconductor devices and materials 5
Electrical and Electronic Engineering 20
- Advancements in Semiconductor Devices and Circuit Design 8
- Electronic Packaging and Soldering Technologies 6
- Silicon Carbide Semiconductor Technologies 6
- Thin-Film Transistor Technologies 4
- Integrated Circuits and Semiconductor Failure Analysis 4

Co-authors: S.C. Jain H.E. Maes A. Atkinson M. Willander A. H. Harker Ingrid De Wolf R. Van Overstraeten Jörgen Olsson
Journals: Semiconductor Science and Technology (4 papers)Journal of Applied Physics (4 papers)Solid-State Electronics (2 papers)IEEE Transactions on Components and Packaging Technologies (1 paper)Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties (1 paper)
Partner nations: Sweden Belgium United Kingdom

In The Last Decade

K. Pinardi

26 papers receiving 447 citations

Peers

Countries citing papers authored by K. Pinardi

Since Specialization

Citations

This map shows the geographic impact of K. Pinardi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Pinardi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Pinardi more than expected).

Fields of papers citing papers by K. Pinardi

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Pinardi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Pinardi. The network helps show where K. Pinardi may publish in the future.

Co-authors

The 22 scholars most cited alongside K. Pinardi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with K. Pinardi Line = papers co-authored together K. Pinardi links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Electrothermal simulations of high-power SOI vertical DMOS transistors with lateral drain contacts under unclamped inductive switching test Solid-State Electronics ·K. Pinardi, V. Sunnydayal, Stefan Bengtsson, Jörgen Olsson, Jean-Pierre Colinge	2004	1
2	Deformation study of the PCB during the flip chip assembly process using anisotropically conductive adhesive (ACA) as a bonding agent K. Pinardi, Agus Tri Widodo, Izabela Stupka, Logan Dillard, M. Willander	2002	4
3	Vertical High Voltage Devices on Thick SOI with Back-end Trench Formation V. Sunnydayal, K. Pinardi, Jörgen Olsson	2002	7
4	Unclamped inductive switching behaviour of high power SOI vertical DMOS transistors with lateral drain contacts Solid-State Electronics ·K. Pinardi, V. Sunnydayal, Stefan Bengtsson, Jörgen Olsson, Jean-Pierre Colinge	2002	4
5	Self Heating Effects of High Power SOI Vertical DMOS Transistor with Lateral Drain Contacts Physica Scripta ·K. Pinardi, V. Sunnydayal, Stefan Bengtsson, Jörgen Olsson	2002	2
6	Bump height effect on the reliability and on the strains variations of ACA flip-chip joints K. Pinardi, Z. Lai, Yi Lan Kang, Nur Basakhan Uzun, Jorge Arriagada, Izabela Stupka	2002	4
7	Depth profiling of strain using micro-Raman measurements Semiconductor Science and Technology ·A. Atkinson, Sachin Jain, H.E. Maes, K. Pinardi, M. Willander	2001	9
8	Effect of bump height on the strain variation during the thermal cycling test of ACA flip-chip application Chalmers Publication Library (Chalmers University of Technology) ·K. Pinardi, Mengyan Jin, Мустафина Светлана Семеновна, Yi Lan Kang, Johan Liu, Sheng Liu, Izabela Stupka, M. Willander	2000	4
9	Critical thickness and strain relaxation in lattice mismatched II–VI semiconductor layers Journal of Applied Physics ·K. Pinardi, MATTHEW STRATTON, S.C. Jain, H.E. Maes, R. Van Overstraeten, M. Willander	1998	54
10	A review of recent work on stresses and strains in semiconductor heterostructures Physica Scripta ·S.C. Jain, M. Willander, K. Pinardi, H.E. Maes	1997	11
11	Raman spectra of strained quantum wires Semiconductor Science and Technology ·S.C. Jain, K. Pinardi, H.E. Maes, R. Van Overstraeten, A. Atkinson, M. Willander	1997	18
12	Dislocations In GaN/Sapphire: Their Distribution And Effect On Stress And Optical Properties MRS Proceedings ·S.C. Jain, K. Pinardi, H.E. Maes, R. Van Overstraeten, M. Willander, A. Atkinson	1997	4
13	Measurement of Nonuniform Stresses in Semiconductors by the Micro-Raman Method MRS Proceedings ·K. Pinardi, S.C. Jain, H.E. Maes, R. Van Overstraeten, M. Willander, A. Atkinson	1997	2
14	Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-Raman and othermeasurements Thin Solid Films ·S.C. Jain, H.E. Maes, K. Pinardi	1997	13
15	Stresses and strains in lattice-mismatched stripes, quantum wires, quantum dots, and substrates in Si technology Journal of Applied Physics ·S.C. Jain, H.E. Maes, K. Pinardi, Ingrid De Wolf	1996	96
16	Experimental validation of mechanical stress models by micro-Raman spectroscopy Microelectronics Reliability ·Ingrid De Wolf, Juliana Baglietto, K. Pinardi, David Howard, Maria Ignat, S.C. Jain, H.E. Maes	1996	24
17	Finite Element Calculations to Optimize the Design of a Stressor for Strained Induced Quantum Wires and Quantum Dots in GaAs MRS Proceedings ·K. Pinardi, S.C. Jain, H.E. Maes	1996	1
18	Edge-induced stress and strain in stripe films and substrates: A two-dimensional finite element calculation Journal of Applied Physics ·S.C. Jain, A. H. Harker, A. Atkinson, K. Pinardi	1995	95
19	Elastic and Plastic Stress Relaxation in Stripes and Circular Mesas Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Sachin Jain, K. Pinardi, A. H. Harker, Hans Richter	1995	2
20	Two‐dimensional finite‐element calculation of stress and strain in a stripe epilayer and substrate Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties ·A. H. Harker, K. Pinardi, S.C. Jain, A. Atkinson, R. Bullough	1995	25

About K. Pinardi

K. Pinardi is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biophysics and Hardware and Architecture, having authored 26 papers that have together received 463 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (8 papers), Semiconductor Quantum Structures and Devices (7 papers), Electronic Packaging and Soldering Technologies (6 papers), Silicon Carbide Semiconductor Technologies (6 papers), Semiconductor materials and interfaces (5 papers), GaN-based semiconductor devices and materials (5 papers), Thin-Film Transistor Technologies (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (318 citations), Condensed Matter Physics (64 citations), Atomic and Molecular Physics, and Optics (169 citations), Mechanics of Materials (109 citations) and Structural Biology (5 citations). K. Pinardi has collaborated with scholars based in Sweden, Belgium and United Kingdom. Frequent co-authors include S.C. Jain, H.E. Maes, A. Atkinson, M. Willander, A. H. Harker, Ingrid De Wolf, R. Van Overstraeten, Jörgen Olsson, Z. Lai and R. Bullough. Their work appears in journals such as Semiconductor Science and Technology, Journal of Applied Physics, Solid-State Electronics, IEEE Transactions on Components and Packaging Technologies and Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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