H. W. Krautter
Impact in
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- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
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- Electronic and Structural Properties of Oxides
- ZnO doping and properties
Papers in
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- Copper Interconnects and Reliability 5
- Co-authors
- R. L. OpilaT. BooneJ. J. KrajewskiJ. M. RosamiliaB. J. SapjetaDavid A. MullerYves J. ChabalM. Hong
- Journals
- Journal of Applied Physics (3 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (2 papers)Journal of Crystal Growth (1 paper)Applied Physics Letters (1 paper)Journal of Lightwave Technology (1 paper)
- Partner nations
- United States
In The Last Decade
H. W. Krautter
12 papers receiving 332 citations
Peers
Comparison fields: 5 of 36
- Electrical and Electronic Engineering 314
- Materials Chemistry 208
- Electronic, Optical and Magnetic Materials 78
- Surfaces, Coatings and Films 24
- Atomic and Molecular Physics, and Optics 69
Countries citing papers authored by H. W. Krautter
This map shows the geographic impact of H. W. Krautter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. W. Krautter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. W. Krautter more than expected).
Fields of papers citing papers by H. W. Krautter
This network shows the impact of papers produced by H. W. Krautter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. W. Krautter. The network helps show where H. W. Krautter may publish in the future.
Co-authors
The 25 scholars most cited alongside H. W. Krautter, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 1 | |
| 2 | 2001 | 223 | |
| 3 | 2000 | 2 | |
| 4 | 1999 | 23 | |
| 5 | 1999 | 26 | |
| 6 | 1999 | 6 | |
| 7 | 1997 | 18 | |
| 8 | 1995 | 11 | |
| 9 | 1995 | 12 | |
| 10 | 1995 | 7 | |
| 11 | 1991 | 5 | |
| 12 | 1991 | 28 |
About H. W. Krautter
H. W. Krautter is a scholar working on Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Mechanics of Materials and Computational Mechanics, having authored 12 papers that have together received 362 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Copper Interconnects and Reliability (5 papers), Semiconductor Lasers and Optical Devices (3 papers), Metal and Thin Film Mechanics (3 papers), Ion-surface interactions and analysis (2 papers), Semiconductor Quantum Structures and Devices (2 papers), Diamond and Carbon-based Materials Research (2 papers) and Advancements in Photolithography Techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (314 citations), Materials Chemistry (208 citations), Electronic, Optical and Magnetic Materials (78 citations), Surfaces, Coatings and Films (24 citations) and Atomic and Molecular Physics, and Optics (69 citations). H. W. Krautter has collaborated with scholars based in United States. Frequent co-authors include R. L. Opila, T. Boone, J. J. Krajewski, J. M. Rosamilia, B. J. Sapjeta, David A. Muller, Yves J. Chabal, M. Hong, S. N. G. Chu and J. Kwo. Their work appears in journals such as Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Crystal Growth, Applied Physics Letters and Journal of Lightwave Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.