O. Fursenko

838 total citations
32 papers, 294 citations indexed

About

O. Fursenko is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, O. Fursenko has authored 32 papers receiving a total of 294 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 11 papers in Atomic and Molecular Physics, and Optics and 10 papers in Biomedical Engineering. Recurrent topics in O. Fursenko's work include Semiconductor materials and interfaces (8 papers), Semiconductor materials and devices (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). O. Fursenko is often cited by papers focused on Semiconductor materials and interfaces (8 papers), Semiconductor materials and devices (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). O. Fursenko collaborates with scholars based in Germany, Ukraine and Latvia. O. Fursenko's co-authors include J. Bauer, Grzegorz Łupina, P. Zaumseil, Mindaugas Lukosius, S. Marschmeyer, Piotr Dudek, J. Da̧browski, G. Lippert, Y. Yamamoto and Christian Wenger and has published in prestigious journals such as Applied Physics Letters, ACS Applied Materials & Interfaces and Applied Surface Science.

In The Last Decade

O. Fursenko

32 papers receiving 287 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
O. Fursenko Germany 9 190 164 83 71 53 32 294
Phillip Manley Germany 14 276 1.5× 243 1.5× 118 1.4× 99 1.4× 88 1.7× 30 425
T. Mollenhauer Germany 14 413 2.2× 126 0.8× 101 1.2× 130 1.8× 30 0.6× 38 465
B. Pivac Croatia 10 361 1.9× 236 1.4× 36 0.4× 51 0.7× 33 0.6× 51 395
U. Mackens Germany 11 257 1.4× 133 0.8× 81 1.0× 209 2.9× 38 0.7× 28 414
Adnan Nazir Denmark 11 224 1.2× 216 1.3× 220 2.7× 138 1.9× 147 2.8× 19 429
A. Wolff Germany 8 267 1.4× 320 2.0× 132 1.6× 87 1.2× 35 0.7× 22 423
Jose Marquez‐Velasco Greece 10 216 1.1× 420 2.6× 71 0.9× 84 1.2× 42 0.8× 14 491
H. W. Krautter United States 8 314 1.7× 208 1.3× 20 0.2× 69 1.0× 78 1.5× 12 362
Takashi Eshita Japan 10 222 1.2× 159 1.0× 40 0.5× 75 1.1× 32 0.6× 35 300
Gérard Guillot France 10 274 1.4× 139 0.8× 39 0.5× 136 1.9× 79 1.5× 50 370

Countries citing papers authored by O. Fursenko

Since Specialization
Citations

This map shows the geographic impact of O. Fursenko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Fursenko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Fursenko more than expected).

Fields of papers citing papers by O. Fursenko

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Fursenko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Fursenko. The network helps show where O. Fursenko may publish in the future.

Co-authorship network of co-authors of O. Fursenko

This figure shows the co-authorship network connecting the top 25 collaborators of O. Fursenko. A scholar is included among the top collaborators of O. Fursenko based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Fursenko. O. Fursenko is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lisker, Marco, Mindaugas Lukosius, Mirko Fraschke, et al.. (2018). Processing and integration of graphene in a 200 mm wafer Si technology environment. Microelectronic Engineering. 205. 44–52. 5 indexed citations
2.
Fursenko, O., Mindaugas Lukosius, Grzegorz Łupina, et al.. (2017). Development of graphene process control by industrial optical spectroscopy setup. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10330. 1033017–1033017. 3 indexed citations
3.
Łupina, Grzegorz, Mindaugas Lukosius, G. Lippert, et al.. (2017). Graphene Synthesis and Processing on Ge Substrates. ECS Journal of Solid State Science and Technology. 6(5). M55–M59. 9 indexed citations
4.
Fursenko, O., J. Bauer, & S. Marschmeyer. (2016). 3D through silicon via profile metrology based on spectroscopic reflectometry for SOI applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2 indexed citations
5.
Lukosius, Mindaugas, J. Da̧browski, Julia Kitzmann, et al.. (2016). Metal-Free CVD Graphene Synthesis on 200 mm Ge/Si(001) Substrates. ACS Applied Materials & Interfaces. 8(49). 33786–33793. 58 indexed citations
6.
Fursenko, O., J. Bauer, & S. Marschmeyer. (2014). In-line through silicon vias etching depths inspection by spectroscopic reflectometry. Microelectronic Engineering. 122. 25–28. 11 indexed citations
7.
Zimmermann, Lars, D. Knoll, Stefan Lischke, et al.. (2014). Monolithic integration of photonic devices in SiGe BiCMOS. 102–103. 4 indexed citations
8.
Fursenko, O., et al.. (2012). Characterization of Si nanowaveguide line edge roughness and its effect on light transmission. Materials Science and Engineering B. 177(10). 750–755. 6 indexed citations
9.
Fröhlich, Maik, et al.. (2012). Biostability of an implantable glucose sensor chip. IOP Conference Series Materials Science and Engineering. 41. 12022–12022. 5 indexed citations
10.
Dudek, Piotr, Grzegorz Łupina, Grzegorz Kozłowski, et al.. (2011). Atomic-scale engineering of future high-k dynamic random access memory dielectrics: The example of partial Hf substitution by Ti in BaHfO3. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(1). 6 indexed citations
11.
Fursenko, O., J. Bauer, Grzegorz Łupina, et al.. (2011). Optical properties and band gap characterization of high dielectric constant oxides. Thin Solid Films. 520(14). 4532–4535. 49 indexed citations
12.
Fursenko, O., J. Bauer, P. Zaumseil, Y. Yamamoto, & Bernd Tillack. (2008). Doping concentration control of SiGe layers by spectroscopic ellipsometry. Thin Solid Films. 517(1). 259–261. 5 indexed citations
13.
Fursenko, O., et al.. (2008). Characterization of silicide stacks by combination of spectroscopic ellipsometry and reflectometry. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 5(5). 1370–1373. 1 indexed citations
14.
Fursenko, O., et al.. (2007). Thermally induced changes in thin gold films detected by polaritonic ellipsometry. Materials Science and Engineering B. 149(3). 285–291. 17 indexed citations
15.
Rücker, H., R. Barth, D. Bolze, et al.. (2005). Integration of high-performance SiGe:C HBTs with thin-film SOI CMOS. 239–242. 5 indexed citations
16.
Zaumseil, P., D. Krüger, R. Kurps, O. Fursenko, & Petr Formánek. (2003). Precise Measurement of Ge Depth Profiles in SiGe HBT's - a Comparison of Different Methods. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 95-96. 473–482. 7 indexed citations
17.
Fursenko, O., J. Bauer, D. Bolze, et al.. (2003). Development of spectroscopic ellipsometry as in-line control for Co SALICIDE process. Thin Solid Films. 450(2). 248–254. 3 indexed citations
18.
Dmitruk, N. L., et al.. (2002). Influence of multilayer coating peculiarities on efficiency of surface plasmon resonance photodetector. 2. 531–534. 1 indexed citations
19.
Fursenko, O., et al.. (1998). Optical and electronic characterization of transition layer in thin film Au-GaAs Schottky barrier. Vacuum. 50(3-4). 439–443. 1 indexed citations
20.
Dmitruk, N. L., et al.. (1996). Polarization-sensitive photocurrents of metal-semiconductor structures with flat and microrelief interfaces. Microelectronics Journal. 27(1). 37–42. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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