F. A. Stevie

4.8k total citations · 5 hit papers
89 papers, 3.5k citations indexed

About

F. A. Stevie is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Surfaces, Coatings and Films. According to data from OpenAlex, F. A. Stevie has authored 89 papers receiving a total of 3.5k indexed citations (citations by other indexed papers that have themselves been cited), including 54 papers in Electrical and Electronic Engineering, 53 papers in Computational Mechanics and 27 papers in Surfaces, Coatings and Films. Recurrent topics in F. A. Stevie's work include Ion-surface interactions and analysis (53 papers), Electron and X-Ray Spectroscopy Techniques (27 papers) and Integrated Circuits and Semiconductor Failure Analysis (24 papers). F. A. Stevie is often cited by papers focused on Ion-surface interactions and analysis (53 papers), Electron and X-Ray Spectroscopy Techniques (27 papers) and Integrated Circuits and Semiconductor Failure Analysis (24 papers). F. A. Stevie collaborates with scholars based in United States, Germany and Czechia. F. A. Stevie's co-authors include Lucille A. Giannuzzi, Carrie L. Donley, Robert G. Wilson, C. W. Magee, D. P. Griffis, R. Garcia, T. L. Shofner, S. R. Brown, Lee Chow and Gianluigi Ciovati and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and PLoS ONE.

In The Last Decade

F. A. Stevie

85 papers receiving 3.4k citations

Hit Papers

5 papers align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

A review of focused ion beam milling techniques for TEM specimen preparation

1999 942 citations Lucille A. Giannuzzi, F. A. Stevie Micron profile →
Introduction to Focused Ion Beams

2005 606 citations Lucille A. Giannuzzi, F. A. Stevie profile →
Introduction to focused ion beams : instrumentation, theory, techniques, and practice

2005 423 citations Lucille A. Giannuzzi, F. A. Stevie CERN Document Server (European Organization for Nuclear Research) profile →
Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis

1989 350 citations F. A. Stevie et al. profile →
Introduction to x-ray photoelectron spectroscopy

2020 314 citations F. A. Stevie et al. profile →

Peers

Countries citing papers authored by F. A. Stevie

Since Specialization

Citations

This map shows the geographic impact of F. A. Stevie's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. A. Stevie with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. A. Stevie more than expected).

Fields of papers citing papers by F. A. Stevie

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. A. Stevie. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. A. Stevie. The network helps show where F. A. Stevie may publish in the future.

Co-authorship network of co-authors of F. A. Stevie

This figure shows the co-authorship network connecting the top 25 collaborators of F. A. Stevie. A scholar is included among the top collaborators of F. A. Stevie based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. A. Stevie. F. A. Stevie is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Oxide dissolution and oxygen diffusion scenarios in niobium and implications on the Bean–Livingston barrier in superconducting cavities 2024 ·Journal of Applied Physics ·(unknown), (unknown), Ari Palczewski, F. A. Stevie, Michael J. Kelley, Charles Reece	4
2	A study of dopant incorporation in Te-doped GaAsSb nanowires using a combination of XPS/UPS, and C-AFM/SKPM 2021 ·Scientific Reports ·(unknown), (unknown), (unknown), (unknown), F. A. Stevie, K. M. Jones, (unknown), Shanthi Iyer	20
3	Advances in secondary ion mass spectrometry for N-doped niobium 2021 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·(unknown), Ari Palczewski, Charles Reece, F. A. Stevie, Michael J. Kelley	5
4	Analysis of permethrin treated fabric using ToF-SIMS 2020 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·Chuanzhen Zhou, F. A. Stevie, R. Garcia	1
5	Electron backscatter diffraction of Nb3Sn coated niobium: Revealing structure as a function of depth 2019 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·(unknown), (unknown), (unknown), Grigory Eremeev, (unknown), F. A. Stevie, Michael J. Kelley	2
6	Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 2018 ·PLoS ONE ·Stephen C. Smith, Chuanzhen Zhou, F. A. Stevie, R. Garcia	6
7	SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation 2016 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·F. A. Stevie, Chuanzhen Zhou, Marinus Hopstaken, (unknown), Zhichun Zhang, (unknown)	27
8	FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources 2014 ·Surface and Interface Analysis ·F. A. Stevie, (unknown), Petr Bábor, (unknown), E. Principe, (unknown)	9
9	SIMS analysis of high‐performance accelerator niobium 2014 ·Surface and Interface Analysis ·(unknown), F. A. Stevie, (unknown), Gianluigi Ciovati, J. M. Rigsbee, Pashupati Dhakal, D. P. Griffis	2
10	Effect of high temperature heat treatments on the quality factor of a large-grain superconducting radio-frequency niobium cavity 2013 ·Physical Review Special Topics - Accelerators and Beams ·Pashupati Dhakal, Gianluigi Ciovati, Ganapati Rao Myneni, K. E. Gray, (unknown), (unknown), D M McRae, Robert D. Pike, Thomas Proslier, F. A. Stevie, R. P. Walsh, Qiguang Yang, (unknown)	60
11	Introduction to focused ion beams : instrumentation, theory, techniques, and practice breakdown → 2005 ·CERN Document Server (European Organization for Nuclear Research) ·Lucille A. Giannuzzi, F. A. Stevie	423
12	Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument 2004 ·Applied Surface Science ·(unknown), Chungang Gu, F. A. Stevie, D. P. Griffis	4
13	FIB lift-out STEM failure analysis technique 2003 ·F. A. Stevie, C. B. Vartuli	1
14	Calibration Method for Elemental Quantification 2000 ·Microscopy and Microanalysis ·C. B. Vartuli, F. A. Stevie, Lucille A. Giannuzzi, T. L. Shofner, (unknown), R. B. Irwin, Jennifer McKinley, (unknown)	3
15	A review of focused ion beam milling techniques for TEM specimen preparation breakdown → 1999 ·Micron ·Lucille A. Giannuzzi, F. A. Stevie	942
16	Accurate base and collector current modeling of polysilicon emitter bipolar transistors: Quantification of hole surface recombination velocity 1996 ·Journal of Applied Physics ·I.C. Kizilyalli, (unknown), (unknown), F. A. Stevie, (unknown), (unknown), (unknown), (unknown)	2
17	Interface State Density Reduction and Effect of Oxidation Temperature on Fluorine Incorporation and Profiling for Fluorinated Metal Oxide Semiconductor Capacitors 1993 ·Journal of The Electrochemical Society ·D.N. Kouvatsos, F. A. Stevie, R. J. Jaccodine	22
18	Application of sample rotation to secondary ion mass spectrometry depth profiling of aluminum metallization 1992 ·Surface and Interface Analysis ·F. A. Stevie, Jeffrey L. Moore	11
19	Secondary ion mass spectrometry—first microelectronics, now the rest of the world 1992 ·Surface and Interface Analysis ·F. A. Stevie	6
20	Characterization of sulfuric acid proton-exchanged lithium niobate 1990 ·Journal of Applied Physics ·(unknown), (unknown), Michael C. Hughes, V. Kannan, F. A. Stevie, J. Ashley Taylor, Rohan Holmes	17

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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