E. M. Zielinski

766 citations

27 papers · 583 indexed · h-index 10

Co-authors: J. C. Bravman Richard P. Vinci B. M. Lairson S. K. Streiffer C. Jin S. List Robert Havemann R. S. List
Topics: Copper Interconnects and Reliability (18 papers)Metal and Thin Film Mechanics (12 papers)Semiconductor materials and devices (10 papers)
Cited by: Electronic, Optical and Magnetic Materials Mechanics of Materials Materials Chemistry
Journals: Physical review. B, Condensed matter Applied Physics Letters Journal of Applied Physics
Partner nations: United States Australia Poland

In The Last Decade

E. M. Zielinski

25 papers receiving 551 citations

Peers

Countries citing papers authored by E. M. Zielinski

Since Specialization

Citations

This map shows the geographic impact of E. M. Zielinski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. M. Zielinski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. M. Zielinski more than expected).

Fields of papers citing papers by E. M. Zielinski

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. M. Zielinski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. M. Zielinski. The network helps show where E. M. Zielinski may publish in the future.

Co-authorship network of co-authors of E. M. Zielinski

This figure shows the co-authorship network connecting the top 25 collaborators of E. M. Zielinski. A scholar is included among the top collaborators of E. M. Zielinski based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. M. Zielinski. E. M. Zielinski is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Use of print-simulations in accelerated yield learning for 22nm BEOL technology 2010 ·Ishtiaq Ahsan,Geng Han,J. G. Bolton,(unknown),(unknown),(unknown),Karen Holloway,(unknown),(unknown),J. Gill,E. M. Zielinski,David Fried	0
2	A BEOL multilevel structure with ultra low-k materials (k ≤ 2.4) 2010 ·(unknown),N. Lustig,(unknown),J. Gill,R. G. Filippi,(unknown),Kaushik Chanda,D. Kioussis,(unknown),(unknown),(unknown),A. Simon,P. Flaitz,(unknown),Wei‐Tsu Tseng,E. M. Zielinski,S. M. Gates,A. Grill,S. Nguyen,H. Shobha	1
3	Evaluation of Barrier CMP Slurries and Characterization of ULK Material Properties Shifts Due to CMP 2008 ·ECS Transactions ·Wei‐Tsu Tseng,D. Kioussis,(unknown),Hyunki Kim,(unknown),Feng Zhao,Laertis Economikos,N. Klymko,(unknown),(unknown),(unknown),(unknown),E. M. Zielinski,(unknown),(unknown)	3
4	Effects of dielectric liners on TDDB lifetime of a Cu/ low-k interconnect 2004 ·Ting Y. Tsui,(unknown),R. Willecke,E. M. Zielinski,Tae‐il Kim,(unknown),J. W. McPherson,(unknown),Andrew J. McKerrow	2
5	Damascene integration of copper and ultra-low-k xerogel for high performance interconnects 2002 ·E. M. Zielinski,Stephen W. Russell,R. S. List,Arthur M. Wilson,C. Jin,(unknown),J.P. Lu,Trace Hurd,(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),Patricia B. Smith,Stephen O’Brien,Robert Havemann	8
6	Novel Diffusion Barrier with Ultra-Thin Silicon Nitride Cap Layer 1998 ·MRS Proceedings ·J.P. Lu,Windsor Hsu,Q. Z. Hong,(unknown),(unknown),E. M. Zielinski,J. D. Luttmer,Robert Havemann,(unknown),Hai-Lung Tsai	2
7	Porous Silica Xerogel Processing And Integration For Ulsi Applications 1998 ·MRS Proceedings ·C. Jin,S. List,E. M. Zielinski	20
8	Inorganic antireflective coating process for deep-UV lithography 1998 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown),(unknown),Maureen A. Hanratty,D. Rogers,Guoqiang Xing,(unknown),E. M. Zielinski	4
9	Overview Of Process Integration Issues For Low K Dielectrics 1998 ·MRS Proceedings ·Robert Havemann,Manoj Kumar Jain,R. S. List,(unknown),(unknown),C. Jin,Meng‐Chou Chang,E. M. Zielinski,(unknown),(unknown),Stephen W. Russell,(unknown),Andrew J. McKerrow,(unknown)	16
10	Dimensional metrology challenges for ULSI interconnects 1998 ·Robert Havemann,Herschel M. Marchman,(unknown),M. Jain,E. M. Zielinski,(unknown),(unknown),Chenhao Jin,(unknown),(unknown)	1
11	Thermal strain and stress in copper thin films 1995 ·Thin Solid Films ·Richard P. Vinci,E. M. Zielinski,J. C. Bravman	213
12	The Influence of Strain Energy Minimization on Abnormal Grain Growth in Copper Thin Films 1995 ·MRS Proceedings ·E. M. Zielinski,Richard P. Vinci,J. C. Bravman	17
13	The influence of strain energy on abnormal grain growth in copper thin films 1995 ·Applied Physics Letters ·E. M. Zielinski,Richard P. Vinci,J. C. Bravman	68
14	The Effects of Processing on the Microstructure of Copper Thin Films on Tantalum Barrier Layers 1995 ·MRS Proceedings ·E. M. Zielinski,Richard P. Vinci,J. C. Bravman	4
15	A Simple Analysis of Average Mechanical Behavior and Strain Energy Density of Misoriented Grains in a Textured Film 1995 ·MRS Proceedings ·Richard P. Vinci,Timothy P. Weihs,E. M. Zielinski,Troy W. Barbee,J. C. Bravman	2
16	Effect of Copper Film Thickness on Stress and Strain in Grains of Different Orientation 1994 ·MRS Proceedings ·Richard P. Vinci,E. M. Zielinski,J. C. Bravman	2
17	Effects of barrier layer and annealing on abnormal grain growth in copper thin films 1994 ·Journal of Applied Physics ·E. M. Zielinski,Richard P. Vinci,J. C. Bravman	118
18	Nucleation and growth mechanisms ofa,b-axis-orientedYBa2Cu3O7−δfilms onLaAlO3 1993 ·Physical review. B, Condensed matter ·S. K. Streiffer,B. M. Lairson,E. M. Zielinski,J. C. Bravman	14
19	Comparative study of ion milling techniques in cross‐sectional transmission electron microscope specimen preparation 1992 ·Microscopy Research and Technique ·E. M. Zielinski,(unknown)	4
20	Transmission Electron Microscopy and X-Ray Diffraction Studies of a,b-Axis Oriented YBa₂Cu₃O_7-δ Films 1992 ·MRS Proceedings ·S. K. Streiffer,B. M. Lairson,E. M. Zielinski,J. C. Bravman	2

About E. M. Zielinski

E. M. Zielinski is a scholar working on Electronic, Optical and Magnetic Materials, Structural Biology and Mechanics of Materials, having authored 27 papers that have together received 583 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (18 papers), Metal and Thin Film Mechanics (12 papers) and Semiconductor materials and devices (10 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (363 citations), Mechanics of Materials (284 citations) and Materials Chemistry (237 citations). E. M. Zielinski has collaborated with scholars based in United States, Australia and Poland. Frequent co-authors include J. C. Bravman, Richard P. Vinci, B. M. Lairson, S. K. Streiffer, C. Jin, S. List, Robert Havemann, R. S. List, Stephen W. Russell and Meng‐Chou Chang. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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