J. C. Bravman

5.9k citations

163 papers · 4.7k indexed · 1 hit paper · h-index 36

Impact in

Condensed Matter Physics top 1%
- Physics of Superconductivity and Magnetism
Electronic, Optical and Magnetic Materials top 1%
- Copper Interconnects and Reliability

Papers in

Electronic, Optical and Magnetic Materials 94
- Copper Interconnects and Reliability 78
- Magnetic and transport properties of perovskites and related materials 14
Condensed Matter Physics 29
- Physics of Superconductivity and Magnetism 29

Co-authors: Robert Sinclair Richard P. Vinci Ramnath Venkatraman E. M. Zielinski William D. Nix B. M. Lairson Timothy P. Weihs Soon-Il Hong
Journals: Applied Physics Letters (20 papers)Journal of Applied Physics (12 papers)Physical review. B, Condensed matter (7 papers)Physica C Superconductivity (7 papers)Journal of materials research/Pratt's guide to venture capital sources (7 papers)
Partner nations: United States Australia Spain

In The Last Decade

J. C. Bravman

157 papers receiving 4.5k citations

Hit Papers

align trajectories log scale

The preparation of cross‐section specimens for transmission electron microscopy 1984 · 423 citations

Peers

Countries citing papers authored by J. C. Bravman

Since Specialization

Citations

This map shows the geographic impact of J. C. Bravman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. C. Bravman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. C. Bravman more than expected).

Fields of papers citing papers by J. C. Bravman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. C. Bravman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. C. Bravman. The network helps show where J. C. Bravman may publish in the future.

Co-authors

The 25 scholars most cited alongside J. C. Bravman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. C. Bravman Line = papers co-authored together J. C. Bravman links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Quantitative characterization of electromigration-induced plastic deformation in Al(0.5wt%Cu) interconnect Microelectronic Engineering ·Rozaliya Barabash, Gene E. Ice, Nobumichi Tamura, B. C. Valek, J. C. Bravman, Ralph Spolenak, J. R. Patel	2004	12
2	Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films Journal of Synchrotron Radiation ·Nobumichi Tamura, Alastair A. MacDowell, Ralph Spolenak, B. C. Valek, J. C. Bravman, W. L. Brown, Richard Celestre, H. A. Padmore, B. W. Batterman, J. R. Patel	2003	213
3	Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction Physical Review Letters ·Ralph Spolenak, W. L. Brown, Nobumichi Tamura, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, B. C. Valek, J. C. Bravman, T. Marieb, H. Fujimoto, B. W. Batterman, J. R. Patel	2003	50
4	Stress-induced and electromigration voiding in aluminum interconnects passivated with silicon nitride Journal of Applied Physics ·Hernán Poblete W., J. C. Bravman, 郭声琨, Samantha Lee, Paul A. Flinn, T. Marieb	2002	11
5	Miniature Nernstian oxygen sensor for deposition and growth environments Review of Scientific Instruments ·Eelco van Setten, T. M. Gür, David H.A. Blank, J. C. Bravman, M. R. Beasley	2002	20
6	Microtexture and strain in electroplated copper interconnects eScholarship (California Digital Library) ·Ralph Spolenak, D. Barr, M. E. Gross, K. Evans‐Lutterodt, W. L. Brown, Nobumichi Tamura, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, B. C. Valek, J. C. Bravman, P. A. Flinn, T. Marieb, Robert R. Keller, B. W. Batterman, J. R. Patel	2001	1
7	Chemical and Structural Characterization of Silane Adhesion Promoting Films for Use in Microelectronic Packaging MRS Proceedings ·Kim Jong Youl, Muhammad Wasim, Reinhold H. Dauskardt, J. C. Bravman	2000	1
8	Void nucleation on intentionally added defects in Al interconnects Applied Physics Letters ·郭声琨, S.-H. Lee, J. C. Bravman, P. A. Flinn, T. Marieb	1999	5
9	Comparison of Stresses in Al Lines Under Various Passivations MRS Proceedings ·Montes Castillo, J. C. Bravman, P. A. Flinn, Feng-yi Yang	1997	2
10	Finite Element Modeling of Grain Aspect Ratio and Strain Energy Density in a Textured Copper Thin Film MRS Proceedings ·Richard P. Vinci, J. C. Bravman	1996	2
11	Elastic strain gradients and x-ray line broadening effects as a function of temperature in aluminum thin films on silicon Journal of materials research/Pratt's guide to venture capital sources ·Ramnath Venkatraman, Paul R. Besser, J. C. Bravman, S. Brennan	1994	22
12	Observation of voids induced by mechanical stress and electromigration in passivated Al lines deposited at different purity levels Applied Physics Letters ·T. Marieb, J. C. Bravman, P. A. Flinn, Donald S. Gardner, Michael C. Madden	1994	12
13	X-ray determination of strains, stress, and relaxation in interconnect metallizations AIP conference proceedings ·Paul R. Besser, J. C. Bravman	1994	4
14	Direct observation of the growth and movement of electromigration voids under passivation AIP conference proceedings ·T. Marieb, Nassim Ajraz, J. C. Bravman, Michael C. Madden, Paul A. Flinn	1994	8
15	Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A. Robert Anderson, Kezheng Jiang, J. C. Bravman	1992	2
16	Role of atomic oxygen produced by an electron cyclotron resonance plasma in the oxidation of YBa2Cu3O7−x thin films studied by i n s i t u resistivity measurement Applied Physics Letters ·Kiyoshi Yamamoto, B. M. Lairson, Chang‐Beom Eom, R. H. Hammond, J. C. Bravman, T. H. Geballe	1990	35
17	Synthesis and properties of YBa2Cu3O7 thin films grown in situ by 90° off-axis single magnetron sputtering Physica C Superconductivity ·Chang‐Beom Eom, Jian Sun, B. M. Lairson, S. K. Streiffer, A. F. Marshall, Kiyoshi Yamamoto, Steven M. Anlage, J. C. Bravman, T. H. Geballe, S. S. Laderman, R. C. Taber, R. D. Jacowitz	1990	183
18	Specimen Preparation for Transmission Electron Microscopy of Materials Philosophical transactions of the Royal Society of London. Series B, Biological sciences ·Robert Anderson, J. C. Bravman	1988	55
19	Measuring the Strength and Stiffness of Thin Film Materials by Mechanically Deflecting Cantilever Microbeams MRS Proceedings ·Timothy P. Weihs, Soon-Il Hong, J. C. Bravman, William D. Nix	1988	30
20	SUPREM 3.5, process modeling of gallium arsenide Michael Deal, Stephen Hansen, R. Anholt, Stephen Y. Chou, J. D. Plummer, R.W. Dutton, T. W. Sigmon, David A. Stevenson, C. R. Helms, J. C. Bravman	1987	5

About J. C. Bravman

J. C. Bravman is a scholar working on Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Mechanics of Materials, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 163 papers that have together received 4.7k indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (78 papers), Metal and Thin Film Mechanics (55 papers), Semiconductor materials and devices (50 papers), Physics of Superconductivity and Magnetism (29 papers), Electronic Packaging and Soldering Technologies (28 papers), Advanced Surface Polishing Techniques (18 papers), Semiconductor materials and interfaces (17 papers) and Magnetic and transport properties of perovskites and related materials (14 papers). The work is most often cited by research in Condensed Matter Physics (1.1k citations), Electronic, Optical and Magnetic Materials (1.7k citations), Structural Biology (109 citations), Mechanics of Materials (1.5k citations) and Atomic and Molecular Physics, and Optics (1.2k citations). J. C. Bravman has collaborated with scholars based in United States, Australia and Spain. Frequent co-authors include Robert Sinclair, Richard P. Vinci, Ramnath Venkatraman, E. M. Zielinski, William D. Nix, B. M. Lairson, Timothy P. Weihs, Soon-Il Hong, S. K. Streiffer and Chang‐Beom Eom. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Physical review. B, Condensed matter, Physica C Superconductivity and Journal of materials research/Pratt's guide to venture capital sources.

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