Herschel M. Marchman

925 total citations · 1 hit paper
28 papers, 642 citations indexed

About

Herschel M. Marchman is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Herschel M. Marchman has authored 28 papers receiving a total of 642 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 13 papers in Surfaces, Coatings and Films and 10 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Herschel M. Marchman's work include Advancements in Photolithography Techniques (14 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Electron and X-Ray Spectroscopy Techniques (8 papers). Herschel M. Marchman is often cited by papers focused on Advancements in Photolithography Techniques (14 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Electron and X-Ray Spectroscopy Techniques (8 papers). Herschel M. Marchman collaborates with scholars based in United States, Belgium and Switzerland. Herschel M. Marchman's co-authors include Graham Knott, Ben Lich, David S. Wall, J. E. Griffith, L. C. Hopkins, Anthony E. Novembre, J. Frackoviak, G. K. Celler, Gian F. Lorusso and Leonardus H. A. Leunissen and has published in prestigious journals such as Journal of Neuroscience, Applied Physics Letters and Review of Scientific Instruments.

In The Last Decade

Herschel M. Marchman

26 papers receiving 622 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling

2008 506 citations Graham Knott, Herschel M. Marchman et al. Journal of Neuroscience profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Herschel M. Marchman United States	8	245	194	151	146	142	28	642
Ben Lich United States	8	418 1.7×	263 1.4×	95 0.6×	261 1.8×	200 1.4×	12	876
Yoshiyuki Fukuda Japan	14	332 1.4×	81 0.4×	48 0.3×	522 3.6×	227 1.6×	34	930
Mohamed El Beheiry France	15	110 0.4×	356 1.8×	142 0.9×	474 3.2×	59 0.4×	25	1.2k
Benjamin Titze Switzerland	6	170 0.7×	128 0.7×	32 0.2×	115 0.8×	98 0.7×	6	391
Adrian Wanner Switzerland	12	106 0.4×	126 0.6×	25 0.2×	176 1.2×	47 0.3×	20	566
Anchi Cheng United States	6	219 0.9×	92 0.5×	12 0.1×	204 1.4×	112 0.8×	6	549
Bernhard Goetze Germany	12	100 0.4×	49 0.3×	50 0.3×	476 3.3×	65 0.5×	23	789
Carlas Smith Netherlands	15	288 1.2×	642 3.3×	99 0.7×	323 2.2×	6 0.0×	48	1.1k
Stéphane Bancelin France	18	38 0.2×	267 1.4×	43 0.3×	108 0.7×	9 0.1×	31	920
Tim Blakely United States	7	62 0.3×	103 0.5×	32 0.2×	29 0.2×	24 0.2×	8	443

Countries citing papers authored by Herschel M. Marchman

Since Specialization

Citations

This map shows the geographic impact of Herschel M. Marchman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Herschel M. Marchman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Herschel M. Marchman more than expected).

Fields of papers citing papers by Herschel M. Marchman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Herschel M. Marchman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Herschel M. Marchman. The network helps show where Herschel M. Marchman may publish in the future.

Co-authorship network of co-authors of Herschel M. Marchman

This figure shows the co-authorship network connecting the top 25 collaborators of Herschel M. Marchman. A scholar is included among the top collaborators of Herschel M. Marchman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Herschel M. Marchman. Herschel M. Marchman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Marchman, Herschel M.. (2017). Dimensional metrology. 3–3. 2 indexed citations

Knott, Graham, Herschel M. Marchman, David S. Wall, & Ben Lich. (2008). Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling. Journal of Neuroscience. 28(12). 2959–2964. 506 indexed citations breakdown →

Marchman, Herschel M., Gian F. Lorusso, L. Grella, et al.. (2006). Electron beam based modification of lithographic materials and the impact on critical dimensional metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6152. 615227–615227. 6 indexed citations

Lorusso, Gian F., Leonardus H. A. Leunissen, C. Gustin, et al.. (2006). Impact of line width roughness on device performance. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6152. 61520W–61520W. 14 indexed citations

Marchman, Herschel M., et al.. (2003). The Impact of Feature Packing Density on FIB Editing of Advanced Technology ICs. Proceedings - International Symposium for Testing and Failure Analysis. 30866. 348–354. 1 indexed citations

Allgair, John A., Charles N. Archie, E. H. Bogardus, et al.. (1998). Toward a unified advanced CD-SEM specification for sub-0.18-μm technology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3332. 138–138. 2 indexed citations

Marchman, Herschel M., et al.. (1998). AFM: a valid reference tool?. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3332. 2–2. 6 indexed citations

Monahan, Kevin M., et al.. (1998). Subnanometer-precision metrology for 100-nm gate linewidth control. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3332. 110–110. 1 indexed citations

Havemann, Robert, et al.. (1998). Dimensional metrology challenges for ULSI interconnects. 377–384. 1 indexed citations

10.

Allgair, John A., Charles N. Archie, J. Griffith, et al.. (1998). Toward a Unified Advanced CD-SEM Specification for Sub 0.18 Micrometer Technology | NIST. 3332. 1 indexed citations

11.

Marchman, Herschel M.. (1997). Scanning electron microscope matching and calibration for critical dimensional metrology. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 15(6). 2155–2161. 6 indexed citations

12.

Griffith, J. E., et al.. (1995). Dimensional metrology with scanning probe microscopes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(3). 1100–1105. 10 indexed citations

13.

Marchman, Herschel M. & Anthony E. Novembre. (1995). Near field optical latent imaging with the photon tunneling microscope. Applied Physics Letters. 66(24). 3269–3271. 9 indexed citations

14.

Marchman, Herschel M., J. E. Griffith, & R. W. Filas. (1994). Fabrication of optical fiber probes for nanometer-scale dimensional metrology. Review of Scientific Instruments. 65(8). 2538–2541. 8 indexed citations

15.

Griffith, J. E., Herschel M. Marchman, & L. C. Hopkins. (1994). Edge position measurement with a scanning probe microscope. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(6). 3567–3570. 7 indexed citations

16.

Wilson, Susan M., et al.. (1994). <title>Phase-shift mask metrology using scatterometry</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2322. 305–315. 1 indexed citations

17.

Marchman, Herschel M., et al.. (1994). Nanometer-scale dimensional metrology for advanced lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(6). 3585–3590. 17 indexed citations

18.

Marchman, Herschel M. & G. C. Wetsel. (1993). Optically guided large-nanostructure probe. Review of Scientific Instruments. 64(5). 1248–1252. 1 indexed citations

19.

Marchman, Herschel M., et al.. (1993). Metrology for phase-shifting masks. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(6). 2482–2486. 1 indexed citations

20.

Marchman, Herschel M., G. C. Wetsel, Mark A. Reed, John N. Randall, & Yung‐Chou Kao. (1992). Scanning tunneling microscope images of identifiable quantum dot diodes. Superlattices and Microstructures. 11(3). 333–336. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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