J. W. McPherson

5.0k citations
98 papers · 3.8k indexed · h-index 32
Topics
Semiconductor materials and devices (63 papers)Copper Interconnects and Reliability (45 papers)Integrated Circuits and Semiconductor Failure Analysis (23 papers)
Partner nations
United StatesGreece

In The Last Decade

J. W. McPherson

94 papers receiving 3.6k citations

Peers

J. W. McPherson
Comparison fields: 5 of 100
  • Electrical and Electronic Engineering 3.3k
  • Electronic, Optical and Magnetic Materials 1.1k
  • Materials Chemistry 853
  • Biomedical Engineering 336
  • Atomic and Molecular Physics, and Optics 280
Replace Thomas M. M. Heenan with:
Thomas M. M. Heenan United Kingdom
M. Küntz Germany
Jingmin Zhang China
Lan Peng China
Alexandre Boyer France
Gert Rietveld Netherlands
Ho Seong Lee South Korea
K. J. Vinoy India
Paul Jarman United Kingdom
J. W. McPherson relative to Thomas M. M. Heenan United Kingdom Thomas M. M. Heenan's profile →
Citations per field
00.5×10×20×26.3×
Thomas M. M. Heenan · 1×
Citations per year

Countries citing papers authored by J. W. McPherson

Since Specialization
Citations

This map shows the geographic impact of J. W. McPherson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. W. McPherson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. W. McPherson more than expected).

Fields of papers citing papers by J. W. McPherson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. W. McPherson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. W. McPherson. The network helps show where J. W. McPherson may publish in the future.

Co-authorship network of co-authors of J. W. McPherson

This figure shows the co-authorship network connecting the top 25 collaborators of J. W. McPherson. A scholar is included among the top collaborators of J. W. McPherson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. W. McPherson. J. W. McPherson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 1
3 8
4 0
5 16
6 7
7 31
8 115
9 24
10 2
11 10
12 4
13 16
14 2
15 14
16 12
17 2
18 142
19 181
20 39

About J. W. McPherson

J. W. McPherson is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Ceramics and Composites, having authored 98 papers that have together received 3.8k indexed citations. Recurring topics across this work include Semiconductor materials and devices (63 papers), Copper Interconnects and Reliability (45 papers) and Integrated Circuits and Semiconductor Failure Analysis (23 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (1.1k citations), Electrical and Electronic Engineering (3.3k citations) and Hardware and Architecture (180 citations). J. W. McPherson has collaborated with scholars based in United States and Greece. Frequent co-authors include H. C. Mogul, A. Shanware, David Baglee, C. F. Dunn, R. Khamankar, Jin‐Young Kim, J. Rodriguez, E.T. Ogawa, Ennis T. Ogawa and J. Antonio Travieso-Rodríguez. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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