William J. Dauksher

1.4k citations
86 papers · 1.1k indexed · h-index 20

William J. Dauksher

84 papers receiving 1.1k citations

Peers

William J. Dauksher
Comparison fields: 5 of 54
  • Electrical and Electronic Engineering 964
  • Surfaces, Coatings and Films 115
  • Biomedical Engineering 632
  • Atomic and Molecular Physics, and Optics 269
  • Mechanics of Materials 92
Replace T. C. Bailey with:
T. C. Bailey United States
K.E. Bean United States
P. Hudek Germany
Chusuke Munakata Japan
B. Pelissier France
Martin Salt Switzerland
Ivan Pollentier Belgium
Kevin J. Nordquist United States
Alan Myers United States
Shin-Puu Jeng Taiwan
William J. Dauksher relative to T. C. Bailey United States T. C. Bailey's profile →
Citations per field
00.5×4.7×
T. C. Bailey · 1×
Citations per year

Countries citing papers authored by William J. Dauksher

Since Specialization
Citations

This map shows the geographic impact of William J. Dauksher's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by William J. Dauksher with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites William J. Dauksher more than expected).

Fields of papers citing papers by William J. Dauksher

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by William J. Dauksher. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by William J. Dauksher. The network helps show where William J. Dauksher may publish in the future.

Co-authorship network

The 25 scholars most cited alongside William J. Dauksher, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with William J. Dauksher Line = papers co-authored together William J. Dauksher links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 202021
2 201619
3 200610
4 20061
5 20061
6
Color Nanotube Field Emission Displays for HDTV
20050
7 20041
8 20044
9 20047
10 20023
11 20027
12 200121
13 20016
14 20008
15 20004
16 20002
17 20002
18 199919
19 19969
20 19923

About William J. Dauksher

William J. Dauksher is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering, having authored 86 papers that have together received 1.1k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (50 papers), Nanofabrication and Lithography Techniques (35 papers), Advanced Surface Polishing Techniques (25 papers), Thin-Film Transistor Technologies (15 papers), Silicon and Solar Cell Technologies (13 papers), Semiconductor materials and devices (13 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and Metal and Thin Film Mechanics (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (964 citations), Surfaces, Coatings and Films (115 citations) and Biomedical Engineering (632 citations). William J. Dauksher has collaborated with scholars based in United States, Japan and Switzerland. Frequent co-authors include Stuart Bowden, Douglas J. Resnick, Stanislau Herasimenka, Kevin J. Nordquist, David P. Mancini, C. Grant Willson, John G. Ekerdt, T. C. Bailey, S. V. Sreenivasan and Pawitter J. S. Mangat. Their work appears in journals such as Applied Physics Letters, Proceedings of the IEEE and Journal of The Electrochemical Society.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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