John G. Ekerdt
- Electrical and Electronic Engineering top 0.5%
- Materials Chemistry top 1%
- Biomedical Engineering top 0.5%
- Atomic and Molecular Physics, and Optics top 2%
- Renewable Energy, Sustainability and the Environment top 2%
- Co-authors
- Blair J. CoxC. Grant WillsonAlexander A. DemkovDeborah A. NeumayerAgham PosadasMartin D. McDanielS. V. SreenivasanP. D. Kirsch
- Topics
- Semiconductor materials and devices (159 papers)Electronic and Structural Properties of Oxides (59 papers)Copper Interconnects and Reliability (35 papers)
- Partner nations
- United StatesBulgariaChina
In The Last Decade
John G. Ekerdt
286 papers receiving 8.3k citations
Peers
Comparison fields: 5 of 102
- Electrical and Electronic Engineering 4.5k
- Materials Chemistry 3.7k
- Biomedical Engineering 2.6k
- Atomic and Molecular Physics, and Optics 1.4k
- Renewable Energy, Sustainability and the Environment 1.0k
Countries citing papers authored by John G. Ekerdt
This map shows the geographic impact of John G. Ekerdt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John G. Ekerdt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John G. Ekerdt more than expected).
Fields of papers citing papers by John G. Ekerdt
This network shows the impact of papers produced by John G. Ekerdt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John G. Ekerdt. The network helps show where John G. Ekerdt may publish in the future.
Co-authorship network of co-authors of John G. Ekerdt
This figure shows the co-authorship network connecting the top 25 collaborators of John G. Ekerdt. A scholar is included among the top collaborators of John G. Ekerdt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John G. Ekerdt. John G. Ekerdt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 14 | |
| 3 | 3 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 346 | |
| 7 | 29 | |
| 8 | 61 | |
| 9 | 12 | |
| 10 | 95 | |
| 11 | 150 | |
| 12 | 0 | |
| 13 | 20 | |
| 14 | 13 | |
| 15 | 37 | |
| 16 | Interfacial chemistry of the Ba/SiO x N y /Si(100) nanostructure | 8 |
| 17 | 85 | |
| 18 | Step and Flash Imprint Lithography: A Technology Review | 1 |
| 19 | 428 | |
| 20 | 118 |
About John G. Ekerdt
John G. Ekerdt is a scholar working on Electrical and Electronic Engineering, Catalysis and Materials Chemistry, having authored 293 papers that have together received 8.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (159 papers), Electronic and Structural Properties of Oxides (59 papers) and Copper Interconnects and Reliability (35 papers). The work is most often cited by research in Catalysis (848 citations), Materials Chemistry (3.7k citations) and Electrical and Electronic Engineering (4.5k citations). John G. Ekerdt has collaborated with scholars based in United States, Bulgaria and China. Frequent co-authors include Blair J. Cox, C. Grant Willson, Alexander A. Demkov, Deborah A. Neumayer, Agham Posadas, Martin D. McDaniel, S. V. Sreenivasan, P. D. Kirsch, Israel E. Wachs and Matthew Colburn. Their work appears in journals such as Chemical Reviews, Journal of the American Chemical Society and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.