J. Hopkins

820 citations
22 papers · 675 indexed · h-index 12
Topics
Plasma Diagnostics and Applications (9 papers)Semiconductor materials and devices (7 papers)Diamond and Carbon-based Materials Research (4 papers)

In The Last Decade

J. Hopkins

21 papers receiving 629 citations

Peers

J. Hopkins
Comparison fields: 5 of 64
  • Electrical and Electronic Engineering 362
  • Biomedical Engineering 276
  • Surfaces, Coatings and Films 246
  • Materials Chemistry 178
  • Atomic and Molecular Physics, and Optics 62
Replace C. J. Blomfield with:
C. J. Blomfield United Kingdom
Zoran R. Vasic Australia
Gang Pu United States
Vít Kudrle Czechia
Rajesh Dorai United States
Axel Sonnenfeld Switzerland
M. Latrèche Canada
Stephen Coulson United Kingdom
M. Štefečka Slovakia
Felix Mitschker Germany
J. Hopkins relative to C. J. Blomfield United Kingdom C. J. Blomfield's profile →
Citations per field
00.5×2.9×
C. J. Blomfield · 1×
Citations per year

Countries citing papers authored by J. Hopkins

Since Specialization
Citations

This map shows the geographic impact of J. Hopkins's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Hopkins with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Hopkins more than expected).

Fields of papers citing papers by J. Hopkins

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Hopkins. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Hopkins. The network helps show where J. Hopkins may publish in the future.

Co-authorship network of co-authors of J. Hopkins

This figure shows the co-authorship network connecting the top 25 collaborators of J. Hopkins. A scholar is included among the top collaborators of J. Hopkins based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Hopkins. J. Hopkins is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 1
3 2
4 12
5 7
6 6
7 126
8 8
9 137
10 21
11 44
12 29
13 54
14 25
15 26
16 10
17 64
18 55
19 5
20 28

About J. Hopkins

J. Hopkins is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Renewable Energy, Sustainability and the Environment, having authored 22 papers that have together received 675 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (9 papers), Semiconductor materials and devices (7 papers) and Diamond and Carbon-based Materials Research (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (246 citations), Electrical and Electronic Engineering (362 citations) and Biomedical Engineering (276 citations). J. Hopkins has collaborated with scholars based in United Kingdom and United States. Frequent co-authors include J. P. S. Badyal, Hamza Ashraf, Jy Bhardwaj, A. Hynes, Jennifer N. Hanson Shepherd, Ian W. Johnston, Robert Boyd, S. Hall, Ian Johnston and Pawitter J. S. Mangat. Their work appears in journals such as ACS Nano, Macromolecules and Langmuir.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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