R. D. Blanton

641 total citations
47 papers, 456 citations indexed

About

R. D. Blanton is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering. According to data from OpenAlex, R. D. Blanton has authored 47 papers receiving a total of 456 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 35 papers in Hardware and Architecture and 4 papers in Industrial and Manufacturing Engineering. Recurrent topics in R. D. Blanton's work include VLSI and Analog Circuit Testing (34 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers) and Advancements in Photolithography Techniques (10 papers). R. D. Blanton is often cited by papers focused on VLSI and Analog Circuit Testing (34 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers) and Advancements in Photolithography Techniques (10 papers). R. D. Blanton collaborates with scholars based in United States, Singapore and United Kingdom. R. D. Blanton's co-authors include Osei Poku, Xin Li, Vítor Grade Tavares, John Paul Shen, W. Maly, Qicheng Huang, Manh Cuong Nguyen, Thijs Vogels, Xiang Li and Yang Xue and has published in prestigious journals such as IEEE Transactions on Industrial Informatics, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Semiconductor Manufacturing.

In The Last Decade

R. D. Blanton

42 papers receiving 444 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
R. D. Blanton United States	14	385	338	70	36	34	47	456
Mango C.-T. Chao Taiwan	14	454 1.2×	335 1.0×	37 0.5×	31 0.9×	12 0.4×	78	515
E. Malavasi United States	13	694 1.8×	509 1.5×	36 0.5×	31 0.9×	14 0.4×	41	753
Witold A. Pleskacz Poland	11	317 0.8×	229 0.7×	27 0.4×	29 0.8×	10 0.3×	102	425
Jin-Tai Yan Taiwan	12	511 1.3×	227 0.7×	25 0.4×	48 1.3×	5 0.1×	128	551
Juejian Wu China	7	266 0.7×	92 0.3×	29 0.4×	63 1.8×	7 0.2×	16	334
R. Rajsuman United States	12	513 1.3×	513 1.5×	8 0.1×	9 0.3×	18 0.5×	47	624
Alain Vachoux Switzerland	9	200 0.5×	210 0.6×	8 0.1×	14 0.4×	13 0.4×	34	349
Jing-Jia Liou Taiwan	16	805 2.1×	770 2.3×	9 0.1×	14 0.4×	30 0.9×	72	945
John A. Nestor United States	8	205 0.5×	355 1.1×	43 0.6×	43 1.2×	27 0.8×	29	420
Ilgweon Kang United States	7	224 0.6×	148 0.4×	23 0.3×	14 0.4×	4 0.1×	21	273

Countries citing papers authored by R. D. Blanton

Since Specialization

Citations

This map shows the geographic impact of R. D. Blanton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. D. Blanton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. D. Blanton more than expected).

Fields of papers citing papers by R. D. Blanton

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. D. Blanton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. D. Blanton. The network helps show where R. D. Blanton may publish in the future.

Co-authorship network of co-authors of R. D. Blanton

This figure shows the co-authorship network connecting the top 25 collaborators of R. D. Blanton. A scholar is included among the top collaborators of R. D. Blanton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. D. Blanton. R. D. Blanton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Zou, Yang, et al.. (2025). BRIDGES: Bridging Graph Modality and Large Language Models within EDA Tasks. 77–84.

Wu, Di, et al.. (2024). Exploration of Unary Arithmetic-Based Matrix Multiply Units for Low Precision DL Accelerators. ArXiv.org. 661–665. 2 indexed citations

Blanton, R. D., et al.. (2024). Faulty Function Extraction for Defective Circuits. 1–6. 3 indexed citations

Marinissen, Erik Jan, R. D. Blanton, Ben Kaczer, et al.. (2024). Silent Data Corruption: Test or Reliability Problem?. Lirias (KU Leuven). 1–7.

Girard, Patrick, R. D. Blanton, & Li-C. Wang. (2023). Machine Learning Support for Fault Diagnosis of System-on-Chip. HAL (Le Centre pour la Communication Scientifique Directe). 2 indexed citations

Nguyen, Manh Cuong, Xin Li, R. D. Blanton, & Xiang Li. (2022). Correlated Bayesian Co-Training for Virtual Metrology. IEEE Transactions on Semiconductor Manufacturing. 36(1). 28–36. 3 indexed citations

Huang, Qicheng, et al.. (2020). LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution. 4 indexed citations

Huang, Qicheng, et al.. (2019). Improving Test Chip Design Efficiency via Machine Learning. 1–10. 3 indexed citations

Blanton, R. D., et al.. (2018). On-Chip Diagnosis of Generalized Delay Failures Using Compact Fault Dictionaries. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38(2). 322–334.

10.

Blanton, R. D., et al.. (2018). IC Protection Against JTAG-Based Attacks. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38(1). 149–162. 15 indexed citations

11.

Blanton, R. D., Seth Copen Goldstein, & Herman Schmit. (2018). Tunable Fault Tolerance via Test and Reconfiguration. Figshare.

12.

Blanton, R. D., et al.. (2014). Design-for-Manufacturability Assessment for Integrated Circuits Using RADAR. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 33(10). 1559–1572. 6 indexed citations

13.

Blanton, R. D., et al.. (2012). Physically-Aware Analysis of Systematic Defects in Integrated Circuits. IEEE Design & Test of Computers. 29(5). 81–93. 11 indexed citations

14.

Blanton, R. D., et al.. (2011). To DFM or not to DFM?. 65–70. 19 indexed citations

15.

Poku, Osei, et al.. (2009). Automated failure population creation for validating integrated circuit diagnosis methods. 708–713. 10 indexed citations

16.

Patil, Nishant, et al.. (2006). Extraction of Defect Density and Size Distributions from Wafer Sort Test Results. 1–6. 9 indexed citations

17.

Blanton, R. D., et al.. (2006). Defect Modeling Using Fault Tuples. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25(11). 2450–2464. 31 indexed citations

18.

Vogels, Thijs, et al.. (2003). A Multi-Stage Approach to Fault Identification Using Fault Tuples. Proceedings - International Symposium for Testing and Failure Analysis. 30866. 496–505. 6 indexed citations

19.

Blanton, R. D., et al.. (2002). Failure modes for stiction in surface-micromachined MEMS. 551–556. 12 indexed citations

20.

Blanton, R. D., et al.. (1999). Superscalar processor validation at the microarchitecture level. 300–305. 22 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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