R. D. Blanton
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
- Software top 10%
- Software Testing and Debugging Techniques
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 31
- Advancements in Photolithography Techniques 10
- Radiation Effects in Electronics 8
- VLSI and FPGA Design Techniques 3
-
- VLSI and Analog Circuit Testing 34
- Physical Unclonable Functions (PUFs) and Hardware Security 5
- Co-authors
- Osei Poku (4 shared papers)Xin Li (4 shared papers)John Paul Shen (3 shared papers)Vítor Grade Tavares (2 shared papers)W. Maly (3 shared papers)Qicheng Huang (4 shared papers)Manh Cuong Nguyen (3 shared papers)Xiang Li (1 shared paper)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (8 papers)IEEE Design and Test (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)Analog Integrated Circuits and Signal Processing (1 paper)IEEE Transactions on Industrial Informatics (1 paper)
- Partner nations
- United StatesSingaporeUnited Kingdom
In The Last Decade
R. D. Blanton
42 papers receiving 444 citations
Peers
Comparison fields: 5 of 32
- Hardware and Architecture 338
- Software 34
- Industrial and Manufacturing Engineering 70
- Electrical and Electronic Engineering 385
- Medical Laboratory Technology 2
Countries citing papers authored by R. D. Blanton
This map shows the geographic impact of R. D. Blanton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. D. Blanton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. D. Blanton more than expected).
Fields of papers citing papers by R. D. Blanton
This network shows the impact of papers produced by R. D. Blanton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. D. Blanton. The network helps show where R. D. Blanton may publish in the future.
Co-authors
The 25 scholars most cited alongside R. D. Blanton, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 47 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 37 | |
| 2 | 2006 | 31 | |
| 3 | 2008 | 28 | |
| 4 | 2004 | 26 | |
| 5 | 1999 | 22 | |
| 6 | 2011 | 19 | |
| 7 | 2015 | 19 | |
| 8 | 2008 | 18 | |
| 9 | 2008 | 18 | |
| 10 | 2019 | 18 | |
| 11 | 2018 | 15 | |
| 12 | 2016 | 15 | |
| 13 | 2018 | 13 | |
| 14 | 2014 | 13 | |
| 15 | 2002 | 12 | |
| 16 | 2015 | 12 | |
| 17 | 2011 | 12 | |
| 18 | 2012 | 11 | |
| 19 | 2009 | 10 | |
| 20 | 2011 | 10 |
About R. D. Blanton
R. D. Blanton is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Industrial and Manufacturing Engineering, Media Technology and Control and Systems Engineering, having authored 47 papers that have together received 456 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (34 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers), Advancements in Photolithography Techniques (10 papers), Radiation Effects in Electronics (8 papers), Physical Unclonable Functions (PUFs) and Hardware Security (5 papers), Industrial Vision Systems and Defect Detection (4 papers), Image Processing Techniques and Applications (3 papers) and VLSI and FPGA Design Techniques (3 papers). The work is most often cited by research in Hardware and Architecture (338 citations), Software (34 citations), Industrial and Manufacturing Engineering (70 citations), Electrical and Electronic Engineering (385 citations) and Medical Laboratory Technology (2 citations). R. D. Blanton has collaborated with scholars based in United States, Singapore and United Kingdom. Frequent co-authors include Osei Poku, Xin Li, John Paul Shen, Vítor Grade Tavares, W. Maly, Qicheng Huang, Manh Cuong Nguyen, Xiang Li, Thijs Vogels and Yang Xue. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Design and Test, IEEE Transactions on Semiconductor Manufacturing, Analog Integrated Circuits and Signal Processing and IEEE Transactions on Industrial Informatics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.