D.B.I. Feltham
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 2%
- Control and Systems Engineering
- Software
- Industrial and Manufacturing Engineering
- Topics
- VLSI and Analog Circuit Testing (11 papers)Integrated Circuits and Semiconductor Failure Analysis (10 papers)Low-power high-performance VLSI design (2 papers)
- Journals
- IEEE Journal of Solid-State CircuitsIEEE Transactions on Very Large Scale Integration (VLSI) SystemsIEEE Design and Test
- Partner nations
- United StatesPolandUnited Kingdom
In The Last Decade
D.B.I. Feltham
13 papers receiving 326 citations
Peers
Comparison fields: 5 of 19
- Electrical and Electronic Engineering 317
- Hardware and Architecture 308
- Control and Systems Engineering 30
- Software 17
- Industrial and Manufacturing Engineering 13
Countries citing papers authored by D.B.I. Feltham
This map shows the geographic impact of D.B.I. Feltham's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.B.I. Feltham with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.B.I. Feltham more than expected).
Fields of papers citing papers by D.B.I. Feltham
This network shows the impact of papers produced by D.B.I. Feltham. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.B.I. Feltham. The network helps show where D.B.I. Feltham may publish in the future.
Co-authorship network of co-authors of D.B.I. Feltham
This figure shows the co-authorship network connecting the top 25 collaborators of D.B.I. Feltham. A scholar is included among the top collaborators of D.B.I. Feltham based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.B.I. Feltham. D.B.I. Feltham is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 37 | |
| 2 | 5 | |
| 3 | 23 | |
| 4 | Full Hold-Scan Systems in Microprocessors: Cost/Benefit Analysis | 49 |
| 5 | 21 | |
| 6 | 61 | |
| 7 | 3 | |
| 8 | 1 | |
| 9 | 25 | |
| 10 | 17 | |
| 11 | 43 | |
| 12 | 7 | |
| 13 | 52 |
About D.B.I. Feltham
D.B.I. Feltham is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering, having authored 13 papers that have together received 344 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (11 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Low-power high-performance VLSI design (2 papers). The work is most often cited by research in Hardware and Architecture (308 citations), Electrical and Electronic Engineering (317 citations) and Software (17 citations). D.B.I. Feltham has collaborated with scholars based in United States, Poland and United Kingdom. Frequent co-authors include W. Maly, J. Khare, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, M.J. Patyra, P. Nigh, L.R. Carley, S.M. Reddy and Anne Gattiker. Their work appears in journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and IEEE Design and Test.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.