C.H. Stapper
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing 30
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- Industrial Vision Systems and Defect Detection 14
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- Integrated Circuits and Semiconductor Failure Analysis 23
- Semiconductor materials and devices 11
- Advancements in Semiconductor Devices and Circuit Design 10
- Radiation Effects in Electronics 10
- Low-power high-performance VLSI design 7
- Advancements in Photolithography Techniques 6
- Co-authors
- Israel KorenV.K. JainG. SaucierZahava KorenJ. BarthP. CastrucciT. MaffittChristopher P. Miller
- Cited by
- Hardware and ArchitectureIndustrial and Manufacturing EngineeringElectrical and Electronic Engineering
- Journals
- IBM Journal of Research and Development (14 papers)IEEE Journal of Solid-State Circuits (4 papers)IEEE Transactions on Computers (3 papers)
- Partner nations
- United States
In The Last Decade
C.H. Stapper
47 papers receiving 2.3k citations
Peers
Comparison fields: 5 of 53
- Hardware and Architecture 1.5k
- Industrial and Manufacturing Engineering 585
- Electrical and Electronic Engineering 2.1k
- Statistics, Probability and Uncertainty 184
- Computer Networks and Communications 265
Countries citing papers authored by C.H. Stapper
This map shows the geographic impact of C.H. Stapper's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.H. Stapper with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.H. Stapper more than expected).
Fields of papers citing papers by C.H. Stapper
This network shows the impact of papers produced by C.H. Stapper. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.H. Stapper. The network helps show where C.H. Stapper may publish in the future.
Co-authorship network
The 9 scholars most cited alongside C.H. Stapper, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 3 | |
| 2 | 2000 | 36 | |
| 3 | 1995 | 118 | |
| 4 | 1995 | 1 | |
| 5 | 1993 | 15 | |
| 6 | 1990 | 40 | |
| 7 | Introduction Special Section on High-Yield Systems | 1989 | 1 |
| 8 | 1989 | 38 | |
| 9 | 1989 | 7 | |
| 10 | 1989 | 65 | |
| 11 | 1989 | 61 | |
| 12 | 1989 | 76 | |
| 13 | 1986 | 132 | |
| 14 | 1984 | 37 | |
| 15 | 1983 | 7 | |
| 16 | 1983 | 304 | |
| 17 | 1982 | 31 | |
| 18 | 1982 | 12 | |
| 19 | 1975 | 94 | |
| 20 | 1969 | 36 |
About C.H. Stapper
C.H. Stapper is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering, Electrical and Electronic Engineering, Statistics and Probability and Management Science and Operations Research, having authored 49 papers that have together received 2.5k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (30 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers), Industrial Vision Systems and Defect Detection (14 papers), Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Radiation Effects in Electronics (10 papers), Low-power high-performance VLSI design (7 papers) and Advancements in Photolithography Techniques (6 papers). The work is most often cited by research in Hardware and Architecture (1.5k citations), Industrial and Manufacturing Engineering (585 citations), Electrical and Electronic Engineering (2.1k citations), Statistics, Probability and Uncertainty (184 citations) and Computer Networks and Communications (265 citations). C.H. Stapper has collaborated with scholars based in United States. Frequent co-authors include Israel Koren, V.K. Jain, G. Saucier, Zahava Koren, J. Barth, P. Castrucci, T. Maffitt, Christopher P. Miller and S.H. Lewis. Their work appears in journals such as IBM Journal of Research and Development, IEEE Journal of Solid-State Circuits, IEEE Transactions on Computers, IEEE Transactions on Semiconductor Manufacturing and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.