F.J. Ferguson
Impact in
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Low-power high-performance VLSI design
- VLSI and FPGA Design Techniques
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
Papers in
-
- VLSI and Analog Circuit Testing 37
- Physical Unclonable Functions (PUFs) and Hardware Security 5
- Software 5
- Software Testing and Debugging Techniques 5
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (5 papers)ACM Transactions on Design Automation of Electronic Systems (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)Computers & Electrical Engineering (1 paper)IEEE Transactions on Computers (1 paper)
- Partner nations
- United StatesTürkiye
In The Last Decade
F.J. Ferguson
45 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 43
- Hardware and Architecture 993
- Electrical and Electronic Engineering 1.0k
- Software 53
- Computational Theory and Mathematics 56
- Control and Systems Engineering 80
Countries citing papers authored by F.J. Ferguson
This map shows the geographic impact of F.J. Ferguson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F.J. Ferguson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F.J. Ferguson more than expected).
Fields of papers citing papers by F.J. Ferguson
This network shows the impact of papers produced by F.J. Ferguson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F.J. Ferguson. The network helps show where F.J. Ferguson may publish in the future.
Co-authorship network
The 17 scholars most cited alongside F.J. Ferguson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 4 | |
| 2 | 2003 | 4 | |
| 3 | 2002 | 6 | |
| 4 | 2002 | 2 | |
| 5 | 2002 | 4 | |
| 6 | 2002 | 27 | |
| 7 | 2002 | 4 | |
| 8 | 2002 | 4 | |
| 9 | 2002 | 3 | |
| 10 | 1998 | 5 | |
| 11 | Maximum Likelihood Estimation for Yield Analysis | 1996 | 2 |
| 12 | 1996 | 18 | |
| 13 | MAXIMUM LIKELIHOOD ESTIMATION FOR FAILURE ANALYSIS OF SRAM CELLS USING INDUCTIVE FAULT ANALYSIS | 1996 | 2 |
| 14 | 1995 IEEE International Test Conference Proceedings | 1995 | 2 |
| 15 | 1995 | 1 | |
| 16 | Defect Classes - An Overdue Paradigm for CMOS IC | 1994 | 56 |
| 17 | SOME FUTURE DIRECTIONS IN FAULT MODELING AND TEST PATTERN GENERATION RESEARCH | 1992 | 2 |
| 18 | 1989 | 5 | |
| 19 | 1988 | 76 | |
| 20 | Systematic characterization of physical defects for fault analysis of MOS IC cells | 1984 | 84 |
About F.J. Ferguson
F.J. Ferguson is a scholar working on Hardware and Architecture, Software, Electrical and Electronic Engineering, Computational Theory and Mathematics and Control and Systems Engineering, having authored 46 papers that have together received 1.1k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (37 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers), Low-power high-performance VLSI design (9 papers), VLSI and FPGA Design Techniques (6 papers), Radiation Effects in Electronics (6 papers), Software Testing and Debugging Techniques (5 papers), Physical Unclonable Functions (PUFs) and Hardware Security (5 papers) and Engineering and Test Systems (4 papers). The work is most often cited by research in Hardware and Architecture (993 citations), Electrical and Electronic Engineering (1.0k citations), Software (53 citations), Computational Theory and Mathematics (56 citations) and Control and Systems Engineering (80 citations). F.J. Ferguson has collaborated with scholars based in United States and Türkiye. Frequent co-authors include John Paul Shen, T. Larrabee, C.F. Hawkins, J.M. Soden, Alan Righter, B. Chess, W. Maly, Sezer Gören, D.B. Lavo and André L. M. Freitas. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ACM Transactions on Design Automation of Electronic Systems, IEEE Transactions on Semiconductor Manufacturing, Computers & Electrical Engineering and IEEE Transactions on Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.