Eric Bersch

656 total citations
23 papers, 544 citations indexed

About

Eric Bersch is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Eric Bersch has authored 23 papers receiving a total of 544 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 8 papers in Materials Chemistry and 7 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Eric Bersch's work include Semiconductor materials and devices (17 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Copper Interconnects and Reliability (6 papers). Eric Bersch is often cited by papers focused on Semiconductor materials and devices (17 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Copper Interconnects and Reliability (6 papers). Eric Bersch collaborates with scholars based in United States, Australia and Germany. Eric Bersch's co-authors include Sylvie Rangan, R. A. Bartynski, Eric Garfunkel, E. Vescovo, Alain C. Diebold, Steven Consiglio, Robert D. Clark, G. J. Leusink, Gert J. Leusink and Vimal Kamineni and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review B.

In The Last Decade

Eric Bersch

23 papers receiving 529 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Eric Bersch United States 10 446 282 118 86 33 23 544
Ragesh Puthenkovilakam United States 11 687 1.5× 381 1.4× 119 1.0× 77 0.9× 16 0.5× 13 763
P. Biegański Poland 13 269 0.6× 307 1.1× 112 0.9× 134 1.6× 32 1.0× 44 478
Benjamin French United States 15 366 0.8× 260 0.9× 88 0.7× 181 2.1× 18 0.5× 25 527
M. Bouslama Algeria 14 251 0.6× 278 1.0× 106 0.9× 47 0.5× 45 1.4× 43 449
F. Pierre France 11 214 0.5× 183 0.6× 151 1.3× 83 1.0× 17 0.5× 43 412
S. Di Nardo Italy 12 319 0.7× 236 0.8× 144 1.2× 52 0.6× 36 1.1× 36 475
T. Eickhoff Germany 12 278 0.6× 204 0.7× 81 0.7× 52 0.6× 28 0.8× 31 384
R. Rimet France 14 271 0.6× 294 1.0× 142 1.2× 110 1.3× 26 0.8× 44 513
B. Hu China 13 238 0.5× 349 1.2× 69 0.6× 139 1.6× 64 1.9× 37 453
Tianya Tan China 11 271 0.6× 309 1.1× 119 1.0× 73 0.8× 22 0.7× 23 443

Countries citing papers authored by Eric Bersch

Since Specialization
Citations

This map shows the geographic impact of Eric Bersch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Bersch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Bersch more than expected).

Fields of papers citing papers by Eric Bersch

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eric Bersch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Bersch. The network helps show where Eric Bersch may publish in the future.

Co-authorship network of co-authors of Eric Bersch

This figure shows the co-authorship network connecting the top 25 collaborators of Eric Bersch. A scholar is included among the top collaborators of Eric Bersch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eric Bersch. Eric Bersch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Cho, Junghyun, et al.. (2013). Mechanism of low-temperature copper-to-copper direct bonding for 3D TSV package interconnection. 1133–1140. 3 indexed citations
3.
4.
Consiglio, Steven, Robert D. Clark, Eric Bersch, et al.. (2012). Crystallinity of Electrically Scaled Atomic Layer Deposited HfO2from a Cyclical Deposition and Annealing Scheme. Journal of The Electrochemical Society. 159(6). G80–G88. 5 indexed citations
5.
Tapily, Kandabara, Steven Consiglio, Robert D. Clark, et al.. (2012). Texturing and Tetragonal Phase Stabilization of ALD HfxZr1-xO2 Using a Cyclical Deposition and Annealing Scheme. ECS Transactions. 45(3). 411–420. 14 indexed citations
6.
7.
Consiglio, Steven, Robert D. Clark, Eric Bersch, et al.. (2011). Structural Characteristics of Electrically Scaled ALD HfO2 from Cyclical Deposition and Annealing Scheme. ECS Transactions. 41(2). 89–108. 4 indexed citations
8.
Bersch, Eric, et al.. (2011). Comparison of methods to determine bandgaps of ultrathin HfO2 films using spectroscopic ellipsometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 29(4). 46 indexed citations
9.
Bersch, Eric, Steven Consiglio, Robert D. Clark, et al.. (2011). Multi-technique Approach for the Evaluation of the Crystalline Phase of Ultrathin High-k Gate Oxide Films. AIP conference proceedings. 154–160. 3 indexed citations
10.
Bersch, Eric, et al.. (2010). Systematic study of the effect of La2O3 incorporation on the flatband voltage and Si band bending in the TiN/HfO2/SiO2/p-Si stack. Journal of Applied Physics. 108(11). 16 indexed citations
11.
Bersch, Eric, et al.. (2010). Spectroscopic ellipsometry characterization of high-k gate stacks with Vt shift layers. Thin Solid Films. 519(9). 2889–2893. 1 indexed citations
12.
Rangan, Sylvie, et al.. (2010). Energy level alignment of catechol molecular orbitals on ZnO(110) and TiO2(110) surfaces. Applied Surface Science. 256(15). 4829–4833. 19 indexed citations
13.
Kamineni, Vimal, M. Raymond, Eric Bersch, B. Doris, & Alain C. Diebold. (2010). Optical metrology of Ni and NiSi thin films used in the self-aligned silicidation process. Journal of Applied Physics. 107(9). 31 indexed citations
14.
Rangan, Sylvie, Eric Bersch, R. A. Bartynski, Eric Garfunkel, & E. Vescovo. (2009). Band offsets of a ruthenium gate on ultrathin high-κoxide films on silicon. Physical Review B. 79(7). 10 indexed citations
15.
Kamineni, Vimal, M. Raymond, Eric Bersch, et al.. (2009). Thickness Measurement of Thin-metal Films by Optical Metrology. AIP conference proceedings. 114–121. 1 indexed citations
16.
Bersch, Eric, Lena Nicolaides, Steven Consiglio, et al.. (2009). Photoreflectance Spectroscopic Characterization of Si with SiO[sub 2] and HfO[sub 2] Dielectric Layers. AIP conference proceedings. 109–113. 2 indexed citations
17.
Bersch, Eric, Steven Consiglio, Robert D. Clark, et al.. (2009). Characterization of HfO[sub 2] and Hafnium Silicate Films on SiO[sub 2]∕Si. AIP conference proceedings. 55–61. 3 indexed citations
18.
Bersch, Eric, et al.. (2008). Electronic structure of N3 DYE molecules on the TiO$_{2}$(110) surface and on anatase nanoparticle films. Bulletin of the American Physical Society. 1 indexed citations
19.
Bersch, Eric, Sylvie Rangan, R. A. Bartynski, Eric Garfunkel, & E. Vescovo. (2008). Band offsets of ultrathin high-κoxide films with Si. Physical Review B. 78(8). 220 indexed citations
20.
Rangan, Sylvie, Eric Bersch, R. A. Bartynski, Eric Garfunkel, & E. Vescovo. (2008). Ge O x interface layer reduction upon Al-gate deposition on a HfO2∕GeOx∕Ge(001) stack. Applied Physics Letters. 92(17). 16 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Ragesh Puthenkovilakam Breakdown of academic impact, for papers by P. Biegański Breakdown of academic impact, for papers by Benjamin French Breakdown of academic impact, for papers by M. Bouslama Breakdown of academic impact, for papers by F. Pierre Breakdown of academic impact, for papers by S. Di Nardo Breakdown of academic impact, for papers by T. Eickhoff Breakdown of academic impact, for papers by R. Rimet Breakdown of academic impact, for papers by B. Hu Breakdown of academic impact, for papers by Tianya Tan
Rankless by CCL
2026