Eric Bersch
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- Semiconductor materials and devices 17
- Integrated Circuits and Semiconductor Failure Analysis 8
- Ferroelectric and Negative Capacitance Devices 4
- Advancements in Semiconductor Devices and Circuit Design 3
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- Electronic and Structural Properties of Oxides 5
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- Copper Interconnects and Reliability 6
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- Electron and X-Ray Spectroscopy Techniques 5
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- Semiconductor materials and interfaces 4
- Co-authors
- Sylvie RanganR. A. BartynskiEric GarfunkelE. VescovoAlain C. DieboldSteven ConsiglioRobert D. ClarkG. J. Leusink
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryElectronic, Optical and Magnetic Materials
- Journals
- Journal of Applied Physics (4 papers)Physical Review B (2 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (2 papers)
- Partner nations
- United StatesAustraliaGermany
In The Last Decade
Eric Bersch
23 papers receiving 529 citations
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 446
- Materials Chemistry 282
- Electronic, Optical and Magnetic Materials 86
- Surfaces, Coatings and Films 32
- Atomic and Molecular Physics, and Optics 118
Countries citing papers authored by Eric Bersch
This map shows the geographic impact of Eric Bersch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Bersch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Bersch more than expected).
Fields of papers citing papers by Eric Bersch
This network shows the impact of papers produced by Eric Bersch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Bersch. The network helps show where Eric Bersch may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Eric Bersch, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 7 | |
| 2 | 2013 | 19 | |
| 3 | 2013 | 3 | |
| 4 | 2012 | 14 | |
| 5 | 2012 | 5 | |
| 6 | 2012 | 7 | |
| 7 | 2011 | 4 | |
| 8 | 2011 | 46 | |
| 9 | 2011 | 3 | |
| 10 | 2010 | 16 | |
| 11 | 2010 | 1 | |
| 12 | 2010 | 31 | |
| 13 | 2010 | 19 | |
| 14 | 2009 | 1 | |
| 15 | 2009 | 10 | |
| 16 | 2009 | 2 | |
| 17 | 2009 | 3 | |
| 18 | Electronic structure of N3 DYE molecules on the TiO$_{2}$(110) surface and on anatase nanoparticle films | 2008 | 1 |
| 19 | 2008 | 16 | |
| 20 | 2008 | 220 |
About Eric Bersch
Eric Bersch is a scholar working on Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering, having authored 23 papers that have together received 544 indexed citations. Recurring topics across this work include Semiconductor materials and devices (17 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Copper Interconnects and Reliability (6 papers), Electronic and Structural Properties of Oxides (5 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), Semiconductor materials and interfaces (4 papers), Ferroelectric and Negative Capacitance Devices (4 papers) and Advancements in Semiconductor Devices and Circuit Design (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (446 citations), Materials Chemistry (282 citations) and Electronic, Optical and Magnetic Materials (86 citations). Eric Bersch has collaborated with scholars based in United States, Australia and Germany. Frequent co-authors include Sylvie Rangan, R. A. Bartynski, Eric Garfunkel, E. Vescovo, Alain C. Diebold, Steven Consiglio, Robert D. Clark, G. J. Leusink, Gert J. Leusink and B. Doris. Their work appears in journals such as Journal of Applied Physics, Physical Review B, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Surface Science and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.