R. Tu

418 total citations
15 papers, 319 citations indexed

About

R. Tu is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Infectious Diseases. According to data from OpenAlex, R. Tu has authored 15 papers receiving a total of 319 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 1 paper in Hardware and Architecture and 0 papers in Infectious Diseases. Recurrent topics in R. Tu's work include Advancements in Semiconductor Devices and Circuit Design (13 papers), Semiconductor materials and devices (12 papers) and Silicon Carbide Semiconductor Technologies (7 papers). R. Tu is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (13 papers), Semiconductor materials and devices (12 papers) and Silicon Carbide Semiconductor Technologies (7 papers). R. Tu collaborates with scholars based in United States, Italy and Taiwan. R. Tu's co-authors include Chenming Hu, Elyse Rosenbaum, K.N. Quader, P.K. Ko, Wayne Chan, P.K. Ko, J.C. King, C. Wann, Chenming Hu and G.K. Lum and has published in prestigious journals such as Scientific Reports, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

R. Tu

14 papers receiving 297 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Tu United States 8 309 32 18 15 10 15 319
S. Rangan United States 7 322 1.0× 22 0.7× 19 1.1× 7 0.5× 19 1.9× 12 323
M. Rafik France 12 345 1.1× 14 0.4× 21 1.2× 8 0.5× 20 2.0× 52 347
Donghyup Shin United States 7 288 0.9× 24 0.8× 7 0.4× 25 1.7× 6 0.6× 17 317
Meng Duan United Kingdom 15 430 1.4× 15 0.5× 10 0.6× 19 1.3× 17 1.7× 38 444
S. Aur United States 13 376 1.2× 15 0.5× 32 1.8× 10 0.7× 27 2.7× 36 383
R. Bolam United States 9 244 0.8× 18 0.6× 39 2.2× 7 0.5× 20 2.0× 30 249
W.W. Abadeer United States 8 321 1.0× 13 0.4× 18 1.0× 13 0.9× 32 3.2× 24 327
A. Bajolet France 10 280 0.9× 23 0.7× 13 0.7× 21 1.4× 23 2.3× 19 288
Shien-Yang Wu Taiwan 7 165 0.5× 28 0.9× 6 0.3× 19 1.3× 7 0.7× 12 183
S. Mittl United States 12 285 0.9× 8 0.3× 22 1.2× 3 0.2× 16 1.6× 28 292

Countries citing papers authored by R. Tu

Since Specialization
Citations

This map shows the geographic impact of R. Tu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Tu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Tu more than expected).

Fields of papers citing papers by R. Tu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Tu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Tu. The network helps show where R. Tu may publish in the future.

Co-authorship network of co-authors of R. Tu

This figure shows the co-authorship network connecting the top 25 collaborators of R. Tu. A scholar is included among the top collaborators of R. Tu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Tu. R. Tu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Lin, Jyi-Tsong & R. Tu. (2025). A novel ultra-steep subthreshold swing iTFET with control gate and control source biasing. Scientific Reports. 15(1). 28207–28207.
2.
3.
Tu, R., D. Sinitsky, F. Assaderaghi, C. Wann, & Chenming Hu. (2005). Simulation Of Floating Body Effect In SOI Circuits Using BSIM3SOI. 339–342. 2 indexed citations
4.
Wann, C., R. Tu, Bin Yu, et al.. (2002). A comparative study of advanced MOSFET structures. 32–33. 4 indexed citations
5.
Quader, K.N., et al.. (2002). A new approach for simulation of circuit degradation due to hot-electron damage in NMOSFETs. 18. 337–340. 5 indexed citations
6.
Tu, R., et al.. (2002). SOI MOSFET modeling using an AC conductance technique to determine heating. 21–22. 3 indexed citations
7.
Sinitsky, D., et al.. (1997). AC output conductance of SOI MOSFETs and impact on analog applications. IEEE Electron Device Letters. 18(2). 36–38. 14 indexed citations
8.
Tu, R., J.C. King, Hyungcheol Shin, & Chenming Hu. (1997). Simulating process-induced gate oxide damage in circuits. IEEE Transactions on Electron Devices. 44(9). 1393–1400. 8 indexed citations
9.
Tu, R., C. Wann, J.C. King, P.K. Ko, & Chenming Hu. (1995). An AC conductance technique for measuring self-heating in SOI MOSFET's. IEEE Electron Device Letters. 16(2). 67–69. 56 indexed citations
10.
Pavan, Paolo, et al.. (1995). Simulating radiation reliability with BERT. Microelectronics Journal. 26(6). 627–633. 2 indexed citations
11.
Tu, R., G.K. Lum, Paolo Pavan, P.K. Ko, & Chenming Hu. (1994). Simulating total-dose radiation effects on circuit behavior. 344–350. 7 indexed citations
12.
Tu, R., et al.. (1994). MOSFET saturation voltage. Solid-State Electronics. 37(7). 1445–1446. 7 indexed citations
13.
Pavan, Paolo, et al.. (1994). A complete radiation reliability software simulator. IEEE Transactions on Nuclear Science. 41(6). 2619–2630. 13 indexed citations
14.
Tu, R., Elyse Rosenbaum, Wayne Chan, et al.. (1993). Berkeley reliability tools-BERT. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 12(10). 1524–1534. 157 indexed citations
15.
Quader, K.N., et al.. (1993). A bidirectional NMOSFET current reduction model for simulation of hot-carrier-induced circuit degradation. IEEE Transactions on Electron Devices. 40(12). 2245–2254. 34 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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