Jun Furuta

749 total citations
77 papers, 558 citations indexed

About

Jun Furuta is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Condensed Matter Physics. According to data from OpenAlex, Jun Furuta has authored 77 papers receiving a total of 558 indexed citations (citations by other indexed papers that have themselves been cited), including 76 papers in Electrical and Electronic Engineering, 18 papers in Hardware and Architecture and 7 papers in Condensed Matter Physics. Recurrent topics in Jun Furuta's work include Radiation Effects in Electronics (52 papers), Semiconductor materials and devices (50 papers) and Advancements in Semiconductor Devices and Circuit Design (35 papers). Jun Furuta is often cited by papers focused on Radiation Effects in Electronics (52 papers), Semiconductor materials and devices (50 papers) and Advancements in Semiconductor Devices and Circuit Design (35 papers). Jun Furuta collaborates with scholars based in Japan, Belgium and United States. Jun Furuta's co-authors include Kazutoshi Kobayashi, Hidetoshi Onodera, Kodai Yamada, Keisuke Kubota, Fei Mo, Shinichiro Abe, Masanori Hashimoto, Yukinobu Watanabe, Takehiro Takahashi and Stefaan Decoutere and has published in prestigious journals such as Japanese Journal of Applied Physics, IEEE Transactions on Nuclear Science and IEEE Transactions on Semiconductor Manufacturing.

In The Last Decade

Jun Furuta

70 papers receiving 550 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jun Furuta Japan 12 546 203 32 19 10 77 558
Alessio Griffoni Belgium 12 515 0.9× 52 0.3× 12 0.4× 8 0.4× 5 0.5× 48 525
C.R. Cirba United States 14 572 1.0× 44 0.2× 6 0.2× 6 0.3× 16 1.6× 23 576
S.V. Walstra United States 7 397 0.7× 185 0.9× 2 0.1× 29 1.5× 3 0.3× 8 402
Jihwan Kim United States 10 523 1.0× 37 0.2× 28 0.9× 19 1.0× 18 536
D. Hoyniak United States 7 262 0.5× 63 0.3× 6 0.2× 26 1.4× 2 0.2× 8 282
Behzad Ebrahimi Iran 12 401 0.7× 50 0.2× 12 0.4× 7 0.4× 1 0.1× 45 412
Kiyoo Itoh Japan 8 268 0.5× 89 0.4× 4 0.1× 57 3.0× 3 0.3× 29 294
Dolores Black United States 9 405 0.7× 229 1.1× 1 0.0× 16 0.8× 3 0.3× 17 420
Jyothi Velamala United States 16 541 1.0× 147 0.7× 24 1.3× 3 0.3× 29 561
X. Aragonés Spain 13 426 0.8× 62 0.3× 6 0.2× 9 0.5× 1 0.1× 48 434

Countries citing papers authored by Jun Furuta

Since Specialization
Citations

This map shows the geographic impact of Jun Furuta's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jun Furuta with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jun Furuta more than expected).

Fields of papers citing papers by Jun Furuta

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jun Furuta. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jun Furuta. The network helps show where Jun Furuta may publish in the future.

Co-authorship network of co-authors of Jun Furuta

This figure shows the co-authorship network connecting the top 25 collaborators of Jun Furuta. A scholar is included among the top collaborators of Jun Furuta based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jun Furuta. Jun Furuta is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kishimoto, Hiroshi, et al.. (2024). A Study on 23-GHz Low-Phase-Noise VCO with Transformer Output. 348–350.
2.
Furuta, Jun, et al.. (2024). Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy Ion and Neutron Irradiation. IEICE Transactions on Electronics. E107.C(9). 255–262.
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Ito, Takafumi, et al.. (2024). Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies. IEICE Transactions on Electronics. E107.C(7). 191–200.
6.
Takahashi, Takehiro, et al.. (2023). A Three-Level GaN Driver for High False Turn-ON Tolerance With Minimal Reverse Conduction Loss. IEEE Open Journal of Power Electronics. 4. 357–366. 6 indexed citations
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Li, Xiangdong, et al.. (2021). An E-mode p-GaN HEMT monolithically-integrated three-level gate driver operating with a single voltage supply. IEICE Electronics Express. 18(6). 20210059–20210059. 1 indexed citations
12.
Yamada, Kodai, et al.. (2020). Evaluation of Soft-Error Tolerance by Neutrons and Heavy Ions on Flip Flops With Guard Gates in a 65-nm Thin BOX FDSOI Process. IEEE Transactions on Nuclear Science. 67(7). 1470–1477. 9 indexed citations
13.
Furuta, Jun, et al.. (2020). Extracting Voltage Dependence of BTI-induced Degradation Without Temporal Factors by Using BTI-Sensitive and BTI-Insensitive Ring Oscillators. IEEE Transactions on Semiconductor Manufacturing. 33(2). 174–179. 8 indexed citations
14.
Yamada, Kodai, et al.. (2019). Radiation-Hardened Structure to Reduce Sensitive Range of a Stacked Structure for FDSOI. IEEE Transactions on Nuclear Science. 66(7). 1418–1426. 3 indexed citations
15.
Yamada, Kodai, et al.. (2019). Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI. IEEE Journal of the Electron Devices Society. 7. 817–824. 30 indexed citations
16.
Yamada, Kodai, et al.. (2018). Radiation-Hardened Flip-Flops With Low-Delay Overhead Using pMOS Pass-Transistors to Suppress SET Pulses in a 65-nm FDSOI Process. IEEE Transactions on Nuclear Science. 65(8). 1814–1822. 26 indexed citations
17.
Furuta, Jun, et al.. (2014). Evaluation of Multiple Cell Upsets Considering Parasitic Bipolar Effects. 113(454). 125–130. 1 indexed citations
18.
Furuta, Jun, Kazutoshi Kobayashi, & Hidetoshi Onodera. (2013). Impact of cell distance and well-contact density on neutron-induced Multiple Cell Upsets. 6C.3.1–6C.3.4. 30 indexed citations
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Furuta, Jun, et al.. (2011). A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. Asia and South Pacific Design Automation Conference. 83–84. 3 indexed citations
20.
Furuta, Jun, et al.. (2011). An Area-Efficient 65 nm Radiation-Hard Dual-Modular Flip-Flop to Avoid Multiple Cell Upsets. IEEE Transactions on Nuclear Science. 58(6). 3053–3059. 49 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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