Jeffrey Stevens

467 total citations
5 papers, 377 citations indexed

About

Jeffrey Stevens is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Jeffrey Stevens has authored 5 papers receiving a total of 377 indexed citations (citations by other indexed papers that have themselves been cited), including 3 papers in Electrical and Electronic Engineering, 2 papers in Electronic, Optical and Magnetic Materials and 1 paper in Atomic and Molecular Physics, and Optics. Recurrent topics in Jeffrey Stevens's work include Semiconductor materials and devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Plasma Diagnostics and Applications (1 paper). Jeffrey Stevens is often cited by papers focused on Semiconductor materials and devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Plasma Diagnostics and Applications (1 paper). Jeffrey Stevens collaborates with scholars based in United States and Netherlands. Jeffrey Stevens's co-authors include Lorena I. Basilio, Larry K. Warne, Joel R. Wendt, Paul G. Clem, Paul Hines, James C. Ginn, Igal Brener, Michael B. Sinclair, David W. Peters and Jon F. Ihlefeld and has published in prestigious journals such as Physical Review Letters, Thin Solid Films and IEEE Transactions on Nuclear Science.

In The Last Decade

Jeffrey Stevens

5 papers receiving 355 citations

Peers

Countries citing papers authored by Jeffrey Stevens

Since Specialization

Citations

This map shows the geographic impact of Jeffrey Stevens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeffrey Stevens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeffrey Stevens more than expected).

Fields of papers citing papers by Jeffrey Stevens

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeffrey Stevens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeffrey Stevens. The network helps show where Jeffrey Stevens may publish in the future.

Co-authorship network of co-authors of Jeffrey Stevens

This figure shows the co-authorship network connecting the top 25 collaborators of Jeffrey Stevens. A scholar is included among the top collaborators of Jeffrey Stevens based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeffrey Stevens. Jeffrey Stevens is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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5 of 5 papers shown

#	Work	Indexed citations
1	Defect structures as a function of ion irradiation and annealing in LiNbO3 2023 ·Thin Solid Films ·Eric Lang, Thomas E. Beechem, Anthony D. McDonald, T. A. Friedmann, Roy H. Olsson, Jeffrey Stevens, Blythe Clark, Khalid Hattar	3
2	Realizing Optical Magnetism from Dielectric Metamaterials 2012 ·Physical Review Letters ·James C. Ginn, Igal Brener, David W. Peters, Joel R. Wendt, Jeffrey Stevens, Paul Hines, Lorena I. Basilio, Larry K. Warne, Jon F. Ihlefeld, Paul G. Clem, Michael B. Sinclair	348
3	SOI Substrate Removal for SEE Characterization: Techniques and Applications 2012 ·IEEE Transactions on Nuclear Science ·M.R. Shaneyfelt, James R. Schwank, P.E. Dodd, Jeffrey Stevens, György Vizkelethy, Scot E. Swanson, Scott M. Dalton	4
4	Low-pressure inductively coupled plasma etching of benzocyclobutene with SF6/O2 plasma chemistry 2012 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·E Douglas, Jeffrey Stevens, (unknown), C. W. Ford, R. J. Shul, S. J. Pearton	12
5	Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques 2011 ·IEEE Transactions on Nuclear Science ·James R. Schwank, M.R. Shaneyfelt, P.E. Dodd, (unknown), György Vizkelethy, Véronique Ferlet-Cavrois, Pascale Gouker, Richard S. Flores, Jeffrey Stevens, (unknown), Scott M. Dalton, Scot E. Swanson	10

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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