M. Koike
Impact in
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- Semiconductor materials and interfaces
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- GaN-based semiconductor devices and materials
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 14
- Semiconductor materials and devices 12
- Silicon and Solar Cell Technologies 7
- Advancements in Semiconductor Devices and Circuit Design 5
- Thin-Film Transistor Technologies 3
M. Koike
33 papers receiving 401 citations
Peers
Comparison fields: 5 of 27
- Atomic and Molecular Physics, and Optics 190
- Condensed Matter Physics 62
- Electrical and Electronic Engineering 293
- Electronic, Optical and Magnetic Materials 63
- Materials Chemistry 145
Countries citing papers authored by M. Koike
This map shows the geographic impact of M. Koike's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Koike with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Koike more than expected).
Fields of papers citing papers by M. Koike
This network shows the impact of papers produced by M. Koike. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Koike. The network helps show where M. Koike may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Koike, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 4 | |
| 2 | 2014 | 6 | |
| 3 | 2013 | 6 | |
| 4 | 2012 | 1 | |
| 5 | 2011 | 4 | |
| 6 | 2009 | 5 | |
| 7 | 2008 | 3 | |
| 8 | 2008 | 1 | |
| 9 | 2006 | 10 | |
| 10 | Depth Resolution Parameters and Sputtering Rates Extracted from Amorphous and Crystalline Silicon Materials for SIMS Shallow Depth Profiling | 2005 | 2 |
| 11 | 2004 | 16 | |
| 12 | 2002 | 2 | |
| 13 | 2001 | 6 | |
| 14 | 1999 | 5 | |
| 15 | 1998 | 12 | |
| 16 | 1998 | 6 | |
| 17 | 1997 | 52 | |
| 18 | 1994 | 127 | |
| 19 | A Layout Design System for Analog Custom LSIs | 1987 | 3 |
| 20 | 1978 | 22 |
About M. Koike
M. Koike is a scholar working on Structural Biology, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Ceramics and Composites and Computational Mechanics, having authored 34 papers that have together received 423 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (14 papers), Semiconductor materials and devices (12 papers), Semiconductor materials and interfaces (8 papers), Ion-surface interactions and analysis (7 papers), Silicon and Solar Cell Technologies (7 papers), Diamond and Carbon-based Materials Research (6 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers) and Thin-Film Transistor Technologies (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (190 citations), Condensed Matter Physics (62 citations), Electrical and Electronic Engineering (293 citations), Electronic, Optical and Magnetic Materials (63 citations) and Materials Chemistry (145 citations). M. Koike has collaborated with scholars based in Japan, United States and South Korea. Frequent co-authors include Shiro Takeno, Akira Nishiyama, Mizuki Ono, T. Ohguro, T. Morimoto, Y. Ushiku, T. Yoshitomi, M. Saito, Hiroshi Iwai and Kazuhide Abe. Their work appears in journals such as Japanese Journal of Applied Physics, Applied Physics Letters, Scientific Reports, Applied Surface Science and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.