K. Suguro

1.7k total citations
110 papers, 1.1k citations indexed

About

K. Suguro is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, K. Suguro has authored 110 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 104 papers in Electrical and Electronic Engineering, 43 papers in Atomic and Molecular Physics, and Optics and 14 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in K. Suguro's work include Semiconductor materials and devices (77 papers), Semiconductor materials and interfaces (42 papers) and Advancements in Semiconductor Devices and Circuit Design (41 papers). K. Suguro is often cited by papers focused on Semiconductor materials and devices (77 papers), Semiconductor materials and interfaces (42 papers) and Advancements in Semiconductor Devices and Circuit Design (41 papers). K. Suguro collaborates with scholars based in Japan, United States and Italy. K. Suguro's co-authors include I. Kunishima, T. Iinuma, Yasushi Nakasaki, H. Nakajima, T. Arikado, Y. Katsumata, Y. Tsunashima, K. Nakajima, Hiroshi Iwai and T. Ohguro and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

K. Suguro

104 papers receiving 1.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. Suguro Japan 17 1.0k 441 183 139 134 110 1.1k
J. Gambino United States 14 946 0.9× 545 1.2× 311 1.7× 176 1.3× 159 1.2× 45 1.1k
T. Morimoto Japan 15 1000 1.0× 400 0.9× 172 0.9× 50 0.4× 104 0.8× 68 1.1k
Dean Malta United States 17 667 0.7× 205 0.5× 387 2.1× 46 0.3× 126 0.9× 51 852
S. K. Lahiri India 14 514 0.5× 159 0.4× 289 1.6× 48 0.3× 128 1.0× 34 716
D. B. Anderson United States 12 461 0.5× 303 0.7× 230 1.3× 103 0.7× 232 1.7× 32 689
J.‐P. Raskin Belgium 16 640 0.6× 192 0.4× 239 1.3× 36 0.3× 243 1.8× 57 935
Yunxia Jin China 15 422 0.4× 245 0.6× 73 0.4× 74 0.5× 198 1.5× 75 746
Marc Zussy France 17 678 0.7× 250 0.6× 89 0.5× 58 0.4× 195 1.5× 37 751
J. B. Lasky United States 10 937 0.9× 463 1.0× 148 0.8× 53 0.4× 150 1.1× 14 1.1k
V. I. Vdovin Russia 14 664 0.7× 345 0.8× 656 3.6× 138 1.0× 145 1.1× 115 938

Countries citing papers authored by K. Suguro

Since Specialization
Citations

This map shows the geographic impact of K. Suguro's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Suguro with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Suguro more than expected).

Fields of papers citing papers by K. Suguro

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Suguro. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Suguro. The network helps show where K. Suguro may publish in the future.

Co-authorship network of co-authors of K. Suguro

This figure shows the co-authorship network connecting the top 25 collaborators of K. Suguro. A scholar is included among the top collaborators of K. Suguro based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Suguro. K. Suguro is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wang, Qinghua, et al.. (2017). Visualization and automatic detection of defect distribution in GaN atomic structure from sampling Moiré phase. Nanotechnology. 28(45). 455704–455704. 18 indexed citations
2.
Borland, John, Tsutomu Nagayama, Temel Büyüklimanli, et al.. (2009). 22nm node n+ SiC stressor using deep PAI+C7H7+P4 with laser annealing. 1–8. 1 indexed citations
3.
Olson, J. C., Christopher Campbell, K. Suguro, et al.. (2008). Angle Effects in High Current Ion Implantation. AIP conference proceedings. 129–132. 1 indexed citations
4.
Aoyama, Tomonori, et al.. (2007). Work Function Modulation by Segregation of Indium through Tungsten Gate for Dual-Metal-Gate Complementary Metal Oxide Semiconductor Applications. Japanese Journal of Applied Physics. 46(4S). 1885–1885. 2 indexed citations
5.
Mizushima, Ichiro, Atsushi Yagishita, K. Suguro, et al.. (2006). Novel Elevated Source/Drain Technology for FinFET Overcoming Agglomeration and Facet Problems Utilizing Solid Phase Epitaxy. 1 indexed citations
6.
Inaba, S., K. Okano, A. Kaneko, et al.. (2006). FinFET: the prospective multi-gate device for future SoC applications. 50–53. 5 indexed citations
7.
Ito, Takayuki, et al.. (2004). Improvement of Performance Deviation and Productivity of MOSFETs With Gate Length Below 30 nm by Flash Lamp Annealing. IEEE Transactions on Semiconductor Manufacturing. 17(3). 286–291. 11 indexed citations
8.
Saito, Tomohiro, et al.. (2003). Low-Standby-Power Complementary Metal-Oxide-Semiconductor Transistors with TiN Single Gate on 1.8 nm Gate Oxide. Japanese Journal of Applied Physics. 42(Part 2, No. 10A). L1130–L1132. 3 indexed citations
9.
Ito, Takayuki, et al.. (2003). Impact of Flash Lamp Annealing on 20-nm-Gate-Length Metal Oxide Silicon Field Effect Transistors. Japanese Journal of Applied Physics. 42(Part 2, No. 10A). L1126–L1129. 2 indexed citations
10.
Nishiyama, Akira, Y. Ushiku, T. Ohguro, et al.. (2003). A novel selective Ni/sub 3/Si contact plug technique for deep-submicron ULSIs. 70–71. 2 indexed citations
11.
Ito, Takayuki, K. Suguro, M. Tamura, et al.. (2002). Flash lamp annealing technology for ultra-shallow junction formation. 23–26. 13 indexed citations
12.
Suguro, K., et al.. (2002). Ion-graphy implanter with stencil mask. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 20(3). 914–917. 7 indexed citations
13.
Yagishita, A., Tomohiro Saito, K. Nakajima, et al.. (2000). High performance damascene metal gate MOSFETs for 0.1 μm regime. IEEE Transactions on Electron Devices. 47(5). 1028–1034. 27 indexed citations
14.
Inumiya, Seiji, Atsushi Yagishita, Tomohiro Saito, et al.. (2000). Sub-1.3 nm Amorphous Tantalum Pentoxide Gate Dielectrics for Damascene Metal Gate Transistors. Japanese Journal of Applied Physics. 39(4S). 2087–2087. 8 indexed citations
15.
Nakajima, K., Y. Akasaka, M. Kaneko, et al.. (1999). Work function controlled metal gate electrode on ultrathin gate insulators. 95–96. 21 indexed citations
16.
17.
Suguro, K., et al.. (1993). Formation of Single-Crystal Al Interconnection by In Situ Annealing. Japanese Journal of Applied Physics. 32(6S). 3094–3094. 7 indexed citations
18.
Suguro, K., et al.. (1993). New method for making Al single crystal interconnections on amorphous insulators. 71–76. 2 indexed citations
19.
20.
Ohdomari, Iwao, et al.. (1981). Low-temperature redistribution of As in Si during Pd2Si formation. Applied Physics Letters. 38(12). 1015–1017. 41 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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