Shiro Takeno
- Materials Chemistry
- Condensed Matter Physics top 5%
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Biomedical Engineering
- Co-authors
- Noburu FukushimaShin NakamuraKen AndoHiromi NiuA. HokazonoM. KoikeFumihiko UesugiMasaru Hayashi
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (13 papers)Semiconductor materials and devices (12 papers)Ion-surface interactions and analysis (10 papers)
- Partner nations
- JapanSouth Korea
In The Last Decade
Shiro Takeno
42 papers receiving 499 citations
Peers
Comparison fields: 5 of 33
- Materials Chemistry 229
- Condensed Matter Physics 194
- Electrical and Electronic Engineering 183
- Electronic, Optical and Magnetic Materials 147
- Biomedical Engineering 97
Countries citing papers authored by Shiro Takeno
This map shows the geographic impact of Shiro Takeno's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shiro Takeno with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shiro Takeno more than expected).
Fields of papers citing papers by Shiro Takeno
This network shows the impact of papers produced by Shiro Takeno. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shiro Takeno. The network helps show where Shiro Takeno may publish in the future.
Co-authorship network of co-authors of Shiro Takeno
This figure shows the co-authorship network connecting the top 25 collaborators of Shiro Takeno. A scholar is included among the top collaborators of Shiro Takeno based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shiro Takeno. Shiro Takeno is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 0 | |
| 3 | 11 | |
| 4 | 1 | |
| 5 | 48 | |
| 6 | 5 | |
| 7 | 10 | |
| 8 | 2 | |
| 9 | Depth Resolution Parameters and Sputtering Rates Extracted from Amorphous and Crystalline Silicon Materials for SIMS Shallow Depth Profiling | 2 |
| 10 | 23 | |
| 11 | 2 | |
| 12 | 37 | |
| 13 | 52 | |
| 14 | 2 | |
| 15 | 16 | |
| 16 | 4 | |
| 17 | 11 | |
| 18 | 12 | |
| 19 | 7 | |
| 20 | 2 |
About Shiro Takeno
Shiro Takeno is a scholar working on Structural Biology, Condensed Matter Physics and Electronic, Optical and Magnetic Materials, having authored 46 papers that have together received 516 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (13 papers), Semiconductor materials and devices (12 papers) and Ion-surface interactions and analysis (10 papers). The work is most often cited by research in Structural Biology (30 citations), Condensed Matter Physics (194 citations) and Metals and Alloys (23 citations). Shiro Takeno has collaborated with scholars based in Japan and South Korea. Frequent co-authors include Noburu Fukushima, Shin Nakamura, Ken Ando, Hiromi Niu, A. Hokazono, M. Koike, Fumihiko Uesugi, Masaru Hayashi, M. Tomita and T. Kinno. Their work appears in journals such as Applied Physics Letters, Applied Surface Science and Journal of Alloys and Compounds.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.