Shiro Takeno

656 total citations
46 papers, 516 citations indexed

About

Shiro Takeno is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Condensed Matter Physics. According to data from OpenAlex, Shiro Takeno has authored 46 papers receiving a total of 516 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 21 papers in Materials Chemistry and 12 papers in Condensed Matter Physics. Recurrent topics in Shiro Takeno's work include Integrated Circuits and Semiconductor Failure Analysis (13 papers), Semiconductor materials and devices (12 papers) and Ion-surface interactions and analysis (10 papers). Shiro Takeno is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (13 papers), Semiconductor materials and devices (12 papers) and Ion-surface interactions and analysis (10 papers). Shiro Takeno collaborates with scholars based in Japan and South Korea. Shiro Takeno's co-authors include Noburu Fukushima, Shin Nakamura, Ken Ando, Hiromi Niu, A. Hokazono, M. Koike, Fumihiko Uesugi, Masaru Hayashi, M. Tomita and T. Kinno and has published in prestigious journals such as Applied Physics Letters, Applied Surface Science and Journal of Alloys and Compounds.

In The Last Decade

Shiro Takeno

42 papers receiving 499 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Shiro Takeno Japan 12 229 194 183 147 97 46 516
Anne Delobbe France 12 138 0.6× 69 0.4× 141 0.8× 124 0.8× 152 1.6× 31 426
Yu‐Miin Sheu Taiwan 13 283 1.2× 56 0.3× 266 1.5× 166 1.1× 60 0.6× 40 577
J. Petalas Greece 11 304 1.3× 222 1.1× 248 1.4× 120 0.8× 58 0.6× 15 525
M. Mertin Germany 9 137 0.6× 55 0.3× 134 0.7× 39 0.3× 49 0.5× 15 386
G. G. Peterson United States 8 183 0.8× 97 0.5× 296 1.6× 128 0.9× 53 0.5× 22 461
Vladimir A. Stoica United States 12 352 1.5× 64 0.3× 228 1.2× 146 1.0× 104 1.1× 32 547
Ernesto J. Escorcia-Aparicio United States 12 130 0.6× 327 1.7× 91 0.5× 299 2.0× 71 0.7× 21 743
M. P. Chauvat France 13 207 0.9× 330 1.7× 164 0.9× 159 1.1× 88 0.9× 35 464
A. Wadas Germany 16 107 0.5× 115 0.6× 123 0.7× 144 1.0× 247 2.5× 42 717
Moshe Dayan Israel 8 84 0.4× 92 0.5× 174 1.0× 115 0.8× 34 0.4× 31 340

Countries citing papers authored by Shiro Takeno

Since Specialization
Citations

This map shows the geographic impact of Shiro Takeno's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shiro Takeno with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shiro Takeno more than expected).

Fields of papers citing papers by Shiro Takeno

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shiro Takeno. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shiro Takeno. The network helps show where Shiro Takeno may publish in the future.

Co-authorship network of co-authors of Shiro Takeno

This figure shows the co-authorship network connecting the top 25 collaborators of Shiro Takeno. A scholar is included among the top collaborators of Shiro Takeno based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shiro Takeno. Shiro Takeno is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Takeno, Shiro, et al.. (2018). Novel Carrier Measurement Methodology for Floating Gate of Sub-20 nm Node Flash Memory Using Scanning Nonlinear Dielectric Microscopy. Proceedings - International Symposium for Testing and Failure Analysis. 81009. 547–549. 1 indexed citations
2.
Kimoto, Koji, Hiroki Tanaka, Daisuke Matsushita, Kosuke Tatsumura, & Shiro Takeno. (2012). Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate. AIP Advances. 2(4). 11 indexed citations
3.
Koike, M., et al.. (2012). High-resolution and site-specific scanning spreading resistance microscopy and its applications to silicon devices. AIP conference proceedings. 147–151. 1 indexed citations
4.
Uesugi, Fumihiko, A. Hokazono, & Shiro Takeno. (2011). Evaluation of two-dimensional strain distribution by STEM/NBD. Ultramicroscopy. 111(8). 995–998. 48 indexed citations
5.
6.
Tomita, M., T. Kinno, M. Koike, et al.. (2006). SIMS depth profile study using metal cluster complex ion bombardment. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 258(1). 242–245. 10 indexed citations
7.
Kohno, T., Shiro Takeno, Hajime Yoshida, & M. Kanda. (2006). Structural analysis of La-Mg-Ni-based new hydrogen storage alloy. Research on Chemical Intermediates. 32(5). 437–445. 2 indexed citations
8.
Tomita, M., Hiroki Tanaka, M. Koike, & Shiro Takeno. (2005). Depth Resolution Parameters and Sputtering Rates Extracted from Amorphous and Crystalline Silicon Materials for SIMS Shallow Depth Profiling. Journal of Surface Analysis. 12(2). 161–165. 2 indexed citations
9.
Kubota, Yuji, et al.. (2003). Development of TFT-LCD TAB modules. 43. 79–82.
10.
Takeno, Shiro, et al.. (2002). Effect of Fe Doping of Thin (Ba,Sr)TiO3Films on Increase in Dielectric Constant. Japanese Journal of Applied Physics. 41(Part 1, No. 10). 6060–6064. 23 indexed citations
11.
Yoshimi, M., Akira Nishiyama, Atsushi Murakoshi, et al.. (2002). Bandgap engineering technology for suppressing the substrate-floating-effect in 0.15 μm SOI-MOSFETs. 80–81.
12.
13.
Abe, Kazuhide, et al.. (1997). Electrical properties and microstructures of Pt/Ba0.5Sr0.5TiO3/SrRuO3 capacitors. Applied Physics Letters. 70(11). 1405–1407. 52 indexed citations
14.
Yoshimi, M., Akira Nishiyama, Atsushi Murakoshi, et al.. (1997). Suppression of the floating-body effect in SOI MOSFET's by the bandgap engineering method using a Si/sub 1-x/Ge/sub x/ source structure. IEEE Transactions on Electron Devices. 44(3). 423–430. 37 indexed citations
15.
Takeno, Shiro, et al.. (1996). A novel mosaic-like structure in SrTiO3 thin films on a Pt(001) surface revealed by transmission electron microscopy. Journal of materials research/Pratt's guide to venture capital sources. 11(11). 2777–2784. 2 indexed citations
16.
Takeno, Shiro, et al.. (1993). A high-resolution electron microscopy study on epitaxial infinite- layer SrCuO2 thin films grown on a SrTiO3 (100) substrate. Physica C Superconductivity. 206(1-2). 75–80. 16 indexed citations
17.
Takeno, Shiro, et al.. (1991). Defect structure study of YBa2Cu3O7−x epitaxial thin films on SrTiO3(100) and (110) substrates. Physica C Superconductivity. 176(1-3). 151–158. 12 indexed citations
18.
Takeno, Shiro, et al.. (1991). A polytypic study on a new layered perovskite vanadate Sr4V3O10−x. Journal of Solid State Chemistry. 94(2). 432–436. 7 indexed citations
19.
Nakayama, Hiroshi, Taneo Nishino, Kazuyuki Ueda, Shiro Takeno, & Hiroshi Fujita. (1991). Surface wave excitation Auger electron spectroscopy of Si(001) reconstructed surfaces. Ultramicroscopy. 39(1-4). 329–341. 11 indexed citations
20.
Takeno, Shiro, et al.. (1991). A structural study on the crystal regularity of YBa2Cu3O7-x thin films composed of several types of oriented domains. Physica C Superconductivity. 181(1-3). 143–148. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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