D. R. Frear

5.3k citations
96 papers · 4.3k indexed · h-index 36

Impact in

Papers in

D. R. Frear

91 papers receiving 4.1k citations

Peers

D. R. Frear
Comparison fields: 5 of 65
  • General Materials Science 329
  • Mechanical Engineering 2.7k
  • Electrical and Electronic Engineering 3.9k
  • Electronic, Optical and Magnetic Materials 537
  • Aerospace Engineering 593
Replace Jeong‐Won Yoon with:
Jeong‐Won Yoon South Korea
Tung‐Han Chuang Taiwan
Guna S Selvaduray United States
Paul T. Vianco United States
Daquan Yu China
S.H. Mannan United Kingdom
Cheng–En Ho Taiwan
Da‐Yuan Shih United States
Yi‐Shao Lai Taiwan
I. Dutta United States
D. R. Frear relative to Jeong‐Won Yoon South Korea Jeong‐Won Yoon's profile →
Citations per field
00.5×2.6×
Jeong‐Won Yoon · 1×
Citations per year

Countries citing papers authored by D. R. Frear

Since Specialization
Citations

This map shows the geographic impact of D. R. Frear's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. R. Frear with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. R. Frear more than expected).

Fields of papers citing papers by D. R. Frear

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. R. Frear. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. R. Frear. The network helps show where D. R. Frear may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D. R. Frear, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. R. Frear Line = papers co-authored together D. R. Frear links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1
Lead-free solders for electronics applications: Wetting analysis
20240
2 202012
3 200864
4 200640
5 200443
6 200419
7 200313
8 2001199
9 199754
10
A microstructurally based model of solder joints under conditions of thermomechanical fatigue
19947
11 1993165
12
Controlled atmosphere soldering system
19921
13
Solder mechanics : a state of the art assessment
1991172
14
Microstructural characterization of solders and brazes for advanced packaging technology
19911
15 19918
16 198943
17 19895
18
MICROSTRUCTURAL OBSERVATIONS OF THE Sn-Pb SOLDER/Cu SYSTEM AND THERMAL FATIGUE OF THE SOLDER JOINT
19876
19
Fatigue and thermal fatigue of Pb-Sn solder joints
198712
20 198615

About D. R. Frear

D. R. Frear is a scholar working on General Materials Science, Mechanical Engineering, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Mechanics of Materials, having authored 96 papers that have together received 4.3k indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (78 papers), 3D IC and TSV technologies (39 papers), Advanced Welding Techniques Analysis (22 papers), Copper Interconnects and Reliability (15 papers), Intermetallics and Advanced Alloy Properties (15 papers), Semiconductor materials and interfaces (8 papers), Aluminum Alloys Composites Properties (8 papers) and Aluminum Alloy Microstructure Properties (7 papers). The work is most often cited by research in General Materials Science (329 citations), Mechanical Engineering (2.7k citations), Electrical and Electronic Engineering (3.9k citations), Electronic, Optical and Magnetic Materials (537 citations) and Aerospace Engineering (593 citations). D. R. Frear has collaborated with scholars based in United States, Italy and Singapore. Frequent co-authors include Paul T. Vianco, Jihun Jang, J. W. Morris, T. Y. Lee, D. Grivas, K. N. Tu, J. K. Lin, K. N. Tu, S.-M. Kuo and W.B. Jones. Their work appears in journals such as Journal of Electronic Materials, Journal of Applied Physics, JOM, Journal of materials research/Pratt's guide to venture capital sources and Metallurgical Transactions A.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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