P. Perdu

883 total citations
126 papers, 544 citations indexed

About

P. Perdu is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, P. Perdu has authored 126 papers receiving a total of 544 indexed citations (citations by other indexed papers that have themselves been cited), including 121 papers in Electrical and Electronic Engineering, 39 papers in Biomedical Engineering and 30 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in P. Perdu's work include Integrated Circuits and Semiconductor Failure Analysis (115 papers), Force Microscopy Techniques and Applications (28 papers) and Semiconductor materials and devices (24 papers). P. Perdu is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (115 papers), Force Microscopy Techniques and Applications (28 papers) and Semiconductor materials and devices (24 papers). P. Perdu collaborates with scholars based in France, Switzerland and Singapore. P. Perdu's co-authors include F. Beaudoin, D. Lewis, V. Pouget, P. Fouillat, F. Darracq, Marise Bafleur, David Trémouilles, Michel Vallet, Nathalie Labat and Sabir Jacquir and has published in prestigious journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability and Microelectronic Engineering.

In The Last Decade

P. Perdu

116 papers receiving 507 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
P. Perdu France 11 487 176 133 112 73 126 544
Paiboon Tangyunyong United States 16 496 1.0× 211 1.2× 134 1.0× 277 2.5× 31 0.4× 47 666
Kurt Ronse Belgium 18 836 1.7× 269 1.5× 49 0.4× 63 0.6× 41 0.6× 132 920
Yayi Wei China 13 623 1.3× 266 1.5× 38 0.3× 52 0.5× 28 0.4× 178 769
L.W. Linholm United States 11 595 1.2× 95 0.5× 97 0.7× 266 2.4× 26 0.4× 63 678
S.E. Steen United States 11 825 1.7× 151 0.9× 73 0.5× 163 1.5× 18 0.2× 30 921
N. Sillon France 19 895 1.8× 234 1.3× 36 0.3× 59 0.5× 20 0.3× 71 968
A. Farcy France 17 834 1.7× 109 0.6× 57 0.4× 59 0.5× 25 0.3× 102 936
C.H. Diaz Taiwan 27 2.1k 4.3× 332 1.9× 83 0.6× 235 2.1× 29 0.4× 109 2.2k
Tsuneo Terasawa Japan 19 1.0k 2.1× 305 1.7× 20 0.2× 105 0.9× 64 0.9× 129 1.1k
Hans Loeschner Austria 12 384 0.8× 264 1.5× 5 0.0× 98 0.9× 109 1.5× 73 534

Countries citing papers authored by P. Perdu

Since Specialization
Citations

This map shows the geographic impact of P. Perdu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Perdu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Perdu more than expected).

Fields of papers citing papers by P. Perdu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Perdu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Perdu. The network helps show where P. Perdu may publish in the future.

Co-authorship network of co-authors of P. Perdu

This figure shows the co-authorship network connecting the top 25 collaborators of P. Perdu. A scholar is included among the top collaborators of P. Perdu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Perdu. P. Perdu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Jacquir, Sabir, et al.. (2017). Automatic localization of signal sources in photon emission images for integrated circuit analysis. Signal Image and Video Processing. 12(4). 775–782. 1 indexed citations
2.
Darracq, F., et al.. (2014). A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectronics Reliability. 54(9-10). 2088–2092. 3 indexed citations
3.
Boit, Christian, et al.. (2011). Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectronics Reliability. 51(9-11). 1632–1636. 3 indexed citations
4.
Bravaix, A., et al.. (2011). A New Policy for COTS Selection: Overcome the DSM Reliability Challenge. SAE International Journal of Aerospace. 4(2). 1475–1484. 1 indexed citations
5.
Boit, Christian, et al.. (2011). Photon Emission Spectra through Silicon of Various Thicknesses. Proceedings - International Symposium for Testing and Failure Analysis. 38268. 164–169. 5 indexed citations
6.
Perdu, P., et al.. (2010). Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. Microelectronics Reliability. 50(9-11). 1700–1705. 1 indexed citations
7.
Perdu, P., et al.. (2009). Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. Microelectronics Reliability. 49(9-11). 1169–1174. 15 indexed citations
8.
Perdu, P., et al.. (2006). Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectronics Reliability. 46(9-11). 1569–1574. 11 indexed citations
9.
Perdu, P., et al.. (2006). Direct Measurements of Charge in Floating Gate Transistor Channels of Flash Memories Using Scanning Capacitance Microscopy. Proceedings - International Symposium for Testing and Failure Analysis. 30897. 86–93. 8 indexed citations
10.
Pouget, V., et al.. (2006). Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability. 46(9-11). 1514–1519. 3 indexed citations
11.
Perdu, P., et al.. (2005). Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability. 45(9-11). 1476–1481. 3 indexed citations
12.
Perdu, P., et al.. (2004). Light emission and TRE for a 120 nm technology case study: how much wavelength shift?. 31. 139–142. 1 indexed citations
13.
14.
Trémouilles, David, et al.. (2003). Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability. 43(9-11). 1577–1582. 1 indexed citations
15.
Lewis, D., et al.. (2003). Backside SC-OBIC using a pulsed NIR-laser and its application to fault location. 41. 193–195. 1 indexed citations
16.
Beaudoin, F., et al.. (2002). Backside Hot Spot Detection. Proceedings - International Symposium for Testing and Failure Analysis. 30774. 147–153. 1 indexed citations
17.
Beaudoin, F., et al.. (2002). IR confocal laser microscopy for MEMS Technological Evaluation. Microelectronics Reliability. 42(9-11). 1815–1817. 11 indexed citations
18.
Beaudoin, F., et al.. (2001). Modeling Thermal Laser Stimulation. Microelectronics Reliability. 41(9-10). 1477–1482. 12 indexed citations
19.
Perdu, P., et al.. (1999). Defect localization using voltage contrast IDDQ testing. Microelectronics Reliability. 39(6-7). 1021–1026. 1 indexed citations
20.
Perdu, P., et al.. (1998). Induced damages on CMOS and bipolar integrated structures under focused ion beam irradiation. Microelectronics Reliability. 38(6-8). 901–905. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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