John F. Wager

11.0k total citations · 2 hit papers
197 papers, 8.7k citations indexed

About

John F. Wager is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, John F. Wager has authored 197 papers receiving a total of 8.7k indexed citations (citations by other indexed papers that have themselves been cited), including 176 papers in Electrical and Electronic Engineering, 113 papers in Materials Chemistry and 50 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in John F. Wager's work include Semiconductor materials and devices (105 papers), Thin-Film Transistor Technologies (69 papers) and ZnO doping and properties (51 papers). John F. Wager is often cited by papers focused on Semiconductor materials and devices (105 papers), Thin-Film Transistor Technologies (69 papers) and ZnO doping and properties (51 papers). John F. Wager collaborates with scholars based in United States, United Kingdom and South Korea. John F. Wager's co-authors include Douglas A. Keszler, Randy Hoffman, B. Norris, Hai Q. Chiang, David Hong, Rick E. Presley, C. W. Wilmsen, J.H. Jeong, Jeremy T. Anderson and J. A. Van Vechten and has published in prestigious journals such as Science, Journal of the American Chemical Society and Physical Review Letters.

In The Last Decade

John F. Wager

193 papers receiving 8.4k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

ZnO-based transparent thin-film transistors

2003 1.2k citations Randy Hoffman, B. Norris et al. Applied Physics Letters profile →
High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer

2004 705 citations John F. Wager, Randy Hoffman et al. Applied Physics Letters profile →

Peers

Countries citing papers authored by John F. Wager

Since Specialization

Citations

This map shows the geographic impact of John F. Wager's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John F. Wager with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John F. Wager more than expected).

Fields of papers citing papers by John F. Wager

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John F. Wager. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John F. Wager. The network helps show where John F. Wager may publish in the future.

Co-authorship network of co-authors of John F. Wager

This figure shows the co-authorship network connecting the top 25 collaborators of John F. Wager. A scholar is included among the top collaborators of John F. Wager based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John F. Wager. John F. Wager is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Defect Density of States of Tin Oxide and Copper Oxide p‐type Thin‐film Transistors 2025 ·Advanced Electronic Materials ·(unknown), Kham M. Niang, (unknown), (unknown), John F. Wager, Andrew J. Flewitt, Matt W. Graham	2
2	Chemical Bonding with or without Tunneling 2024 ·ACS Omega ·John F. Wager	0
3	Illuminating Trap Density Trends in Amorphous Oxide Semiconductors with Ultrabroadband Photoconduction 2023 ·Advanced Functional Materials ·(unknown), (unknown), John F. Wager, Matt W. Graham	11
4	Elucidation of bonding trends from variability in Atomic Solid State Energies 2019 ·Journal of Solid State Chemistry ·(unknown), John F. Wager, Douglas A. Keszler	10
5	Structural convergence properties of amorphous InGaZnO₄from simulated liquid-quench methods 2017 ·Dalton Transactions ·(unknown), (unknown), (unknown), Thomas J. L. Mustard, Geneva Laurita, Tsung-Han Chiang, Douglas A. Keszler, M. A. Subramanian, John F. Wager, Michelle Dolgos, James R. Rustad, Paul Ha‐Yeon Cheong	1
6	Amorphous semiconductor mobility limits 2015 ·Journal of Non-Crystalline Solids ·Kevin A. Stewart, (unknown), John F. Wager	27
7	Thermal oxidation of Zr–Cu–Al–Ni amorphous metal thin films 2015 ·Thin Solid Films ·Richard P. Oleksak, (unknown), (unknown), (unknown), (unknown), John F. Wager, William F. Stickle, Gregory S. Herman	4
8	Barrier height estimation of asymmetric metal-insulator-metal tunneling diodes 2013 ·Journal of Applied Physics ·(unknown), Sean Muir, Douglas A. Keszler, John F. Wager	26
9	Surface Origin of High Conductivities in UndopedIn2O3Thin Films 2012 ·Physical Review Letters ·Stephan Lany, Andriy Zakutayev, (unknown), John F. Wager, Kenneth R. Poeppelmeier, John D. Perkins, Joseph J. Berry, David S. Ginley, Alex Zunger	110
10	Engineering anisotropic dielectric response through amorphous laminate structures 2012 ·physica status solidi (a) ·(unknown), (unknown), (unknown), William F. Stickle, Douglas A. Keszler, John F. Wager	4
11	Advancing MIM Electronics: Amorphous Metal Electrodes 2010 ·Advanced Materials ·(unknown), Nasir Alimardani, (unknown), John F. Conley, Douglas A. Keszler, Brady J. Gibbons, John F. Wager	102
12	Stability and bias stressing of metal/insulator/metal diodes 2010 ·Nasir Alimardani, John F. Conley, (unknown), John F. Wager, Matthew L. Chin, S. Kilpatrick, Madan Dubey	4
13	pin double-heterojunction thin-film solar cell p-layer assessment 2009 ·Solar Energy Materials and Solar Cells ·(unknown), Rolf Schäfer, John F. Wager, (unknown), Heather A. S. Platt, Douglas A. Keszler, G. Schneider, Robert Kykyneshi, Janet Tate, Xiang Liu, A. Compaan, William N. Shafarman	35
14	68.1: Invited Paper : Transparent Electronics — Display Applications? 2007 ·SID Symposium Digest of Technical Papers ·John F. Wager	8
15	ZnO-based transparent thin-film transistors breakdown → 2003 ·Applied Physics Letters ·Randy Hoffman, B. Norris, John F. Wager	1192
16	Band structure and high-field electron transport of a ZnS phosphor in AC thin-film electroluminescent devices 1997 ·Journal of the Korean Physical Society ·(unknown), Subramaniam Pennathur, Stephen M. Goodnick, John F. Wager	4
17	<title>Electrical characterization of blue electroluminescent devices</title> 1994 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), John F. Wager, (unknown), Eric Dickey, Richard T. Tuenge, (unknown)	6
18	Hot electron luminescence in ZnS alternating-current thin-film electroluminescent devices 1993 ·Applied Physics Letters ·(unknown), John F. Wager, David C. Morton, (unknown), (unknown)	7
19	Electron energy-loss spectroscopy analysis of low-temperature plasma-enhanced chemically vapor deposited a-C:H films 1989 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·A. J. Nelson, D. K. Benson, C. Edwin Tracy, L. L. Kazmerski, John F. Wager	3
20	Detection of SiO2 at the indium tin oxide/Si solar cell interface 1979 ·Journal of Applied Physics ·John F. Wager, C. W. Wilmsen	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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