K. Joshi

1.3k citations

36 papers · 951 indexed · h-index 13

Impact in

Metals and Alloys top 10%
Electrochemistry top 5%
- Electrochemical Analysis and Applications

Papers in ⓘ

Electrical and Electronic Engineering 27
- Semiconductor materials and devices 22
- Advancements in Semiconductor Devices and Circuit Design 21
- Integrated Circuits and Semiconductor Failure Analysis 15
- Molecular Junctions and Nanostructures 3
Atomic and Molecular Physics, and Optics 6
- Spectroscopy and Quantum Chemical Studies 3

Co-authors: Souvik Mahapatra (13 shared papers)Subhadeep Mukhopadhyay (10 shared papers)Nilesh Goel (7 shared papers)H. P. Dhar (2 shared papers)B. E. Conway (2 shared papers)Muhammad A. Alam (5 shared papers)Roger Parsons (1 shared paper)Ahmad E. Islam (3 shared papers)
Journals: Electrochimica Acta (4 papers)Journal of Applied Polymer Science (2 papers)IEEE Electron Device Letters (2 papers)IEEE Transactions on Electron Devices (2 papers)Journal of Macromolecular Science Part A (1 paper)
Partner nations: India United States Taiwan

In The Last Decade

K. Joshi

36 papers receiving 908 citations

Peers

Countries citing papers authored by K. Joshi

Since Specialization

Citations

This map shows the geographic impact of K. Joshi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Joshi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Joshi more than expected).

Fields of papers citing papers by K. Joshi

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Joshi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Joshi. The network helps show where K. Joshi may publish in the future.

Co-authors

The 25 scholars most cited alongside K. Joshi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with K. Joshi Line = papers co-authored together K. Joshi links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	A Comparative Study of Different Physics-Based NBTI Models IEEE Transactions on Electron Devices ·Souvik Mahapatra, Nilesh Goel, Sujay B. Desai, Shashank Gupta, B. Jose, Subhadeep Mukhopadhyay, K. Joshi, Ankit Jain, Ahmad E. Islam, Muhammad A. Alam	2013	223
2	On the form of adsorption isotherms for substitutional adsorption of molecules of different sizes Electrochimica Acta ·H. P. Dhar, B. E. Conway, K. Joshi	1973	159
3	A critical re-evaluation of the usefulness of R-D framework in predicting NBTI stress and recovery Souvik Mahapatra, Ahmad E. Islam, S. Deora, V. D. Maheta, K. Joshi, Ankit Jain, Muhammad A. Alam	2011	85
4	A consistent physical framework for N and P BTI in HKMG MOSFETs K. Joshi, Subhadeep Mukhopadhyay, Nilesh Goel, Souvik Mahapatra	2012	84
5	The diffuse double layer in mixed electrolytes Electrochimica Acta ·K. Joshi, Roger Parsons	1961	73
6	Guar gum as a selective flocculant for the beneficiation of alumina rich iron ore slimes: Density functional theory and experimental studies Minerals Engineering ·Vinay Jain, Venugopal Tammishetti, K. Joshi, Dharmendr Kumar, Pradip, Beena Rai	2017	41
7	Trap Generation in IL and HK layers during BTI / TDDB stress in scaled HKMG N and P MOSFETs Subhadeep Mukhopadhyay, K. Joshi, Veena Chaudhary, Nilesh Goel, Sandip De, R. K. Pandey, K. V. R. M. Murali, Souvik Mahapatra	2014	40
8	A comprehensive AC / DC NBTI model: Stress, recovery, frequency, duty cycle and process dependence Sujay B. Desai, Subhadeep Mukhopadhyay, Nilesh Goel, N. Nanaware, B. Jose, K. Joshi, Souvik Mahapatra	2013	37
9	A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs Microelectronics Reliability ·Nilesh Goel, K. Joshi, Subhadeep Mukhopadhyay, N. Nanaware, Suddhasatta Mahapatra	2014	34
10	Intrinsic correlation between PBTI and TDDB degradations in nMOS HK/MG dielectrics Jiaqi Yang, Muhammad Masuduzzaman, K. Joshi, Subhadeep Mukhopadhyay, Jinfeng Kang, Souvik Mahapatra, Muhammad A. Alam	2012	25
11	Understanding Process Impact of Hole Traps and NBTI in HKMG p-MOSFETs Using Measurements and Atomistic Simulations IEEE Electron Device Letters ·Souvik Mahapatra, Sandip De, K. Joshi, Subhadeep Mukhopadhyay, R. K. Pandey, K. V. R. M. Murali	2013	19
12	Second Virial Coefficient of Polar Gases The Physics of Fluids ·Saurabh Saxena, K. Joshi	1962	16
13	A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model IEEE Transactions on Electron Devices ·K. Joshi, Subhadeep Mukhopadhyay, Nilesh Goel, Nirmal Nanware, Souvik Mahapatra	2014	15
14	A comprehensive and critical re-assessment of 2-stage energy level NBTI model Shashank Gupta, B. Jose, K. Joshi, Ankit Jain, Muhammad A. Alam, Souvik Mahapatra	2012	12
15	Scaled Gate Stacks for Sub-20-nm CMOS Logic Applications Through Integration of Thermal IL and ALD HfOx IEEE Electron Device Letters ·K. Joshi, Shih‐Ya Hung, Subhadeep Mukhopadhyay, Tsutomu Sato, M. J. Bevan, Bijesh Rajamohanan, A. Wei, A. Noori, Brendan McDougall, Chi‐Nung Ni, C. Lazik, Ghazal Saheli, P. Liu, Dachen Chu, L. Daté, Suman Datta, Adam Brand, J. Swenberg, Souvik Mahapatra	2012	9
16	Study of dynamic TDDB in scaled FinFET technologies K. Joshi, S. W. Chang, Dongsheng Huang, P. J. Liao, Y.-H. Lee	2018	8
17	Characterization and modeling of NBTI stress, recovery, material dependence and AC degradation using R-D framework Souvik Mahapatra, Ahmad E. Islam, S. Deora, V. D. Maheta, K. Joshi, Muhammad A. Alam	2011	7
18	A new insight into BEOL TDDB lifetime model for advanced technology scaling M.N. Chang, Y.-H. Lee, Shi-Shien Lee, K. Joshi, Chin-Yuan Ko, Catherine Chiu, Kaijie Wu	2015	7
19	Adsorption of butyric and iso-butyric acid at the mercury/solution interface from 0.1 M KBr solution Electrochimica Acta ·K. Joshi, M.R. Bapat, S.W. Dhawale	1970	7
20	Viscosity of polar gases Physica ·K. Joshi, Saurabh Saxena	1961	6

About K. Joshi

K. Joshi is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electrochemistry, Biomedical Engineering and Physical and Theoretical Chemistry, having authored 36 papers that have together received 951 indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Electrochemical Analysis and Applications (5 papers), Electrostatics and Colloid Interactions (4 papers), Molecular Junctions and Nanostructures (3 papers), Spectroscopy and Quantum Chemical Studies (3 papers) and Membrane Separation and Gas Transport (2 papers). The work is most often cited by research in Metals and Alloys (47 citations), Electrochemistry (95 citations), Electrical and Electronic Engineering (672 citations), Physical and Theoretical Chemistry (82 citations) and Filtration and Separation (18 citations). K. Joshi has collaborated with scholars based in India, United States and Taiwan. Frequent co-authors include Souvik Mahapatra, Subhadeep Mukhopadhyay, Nilesh Goel, H. P. Dhar, B. E. Conway, Muhammad A. Alam, Roger Parsons, Ahmad E. Islam, Ankit Jain and Sujay B. Desai. Their work appears in journals such as Electrochimica Acta, Journal of Applied Polymer Science, IEEE Electron Device Letters, IEEE Transactions on Electron Devices and Journal of Macromolecular Science Part A.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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