Nilesh Goel

1.3k total citations
39 papers, 883 citations indexed

About

Nilesh Goel is a scholar working on Electrical and Electronic Engineering, Cellular and Molecular Neuroscience and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Nilesh Goel has authored 39 papers receiving a total of 883 indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Electrical and Electronic Engineering, 6 papers in Cellular and Molecular Neuroscience and 3 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Nilesh Goel's work include Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (30 papers) and Ferroelectric and Negative Capacitance Devices (9 papers). Nilesh Goel is often cited by papers focused on Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (30 papers) and Ferroelectric and Negative Capacitance Devices (9 papers). Nilesh Goel collaborates with scholars based in India, United Arab Emirates and United States. Nilesh Goel's co-authors include Souvik Mahapatra, Subhadeep Mukhopadhyay, K. Joshi, Narendra Parihar, Sujay B. Desai, Muhammad A. Alam, Ankit Jain, Ahmad E. Islam, K. V. R. M. Murali and R. K. Pandey and has published in prestigious journals such as Nano Letters, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

Nilesh Goel

36 papers receiving 868 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Nilesh Goel India 17 863 66 45 41 25 39 883
Narendra Parihar India 16 711 0.8× 42 0.6× 35 0.8× 53 1.3× 22 0.9× 44 734
Haldun Küflüoğlu United States 15 1.4k 1.6× 52 0.8× 123 2.7× 43 1.0× 11 0.4× 23 1.4k
V. Reddy United States 17 1.6k 1.8× 75 1.1× 169 3.8× 44 1.1× 30 1.2× 34 1.6k
A. Bravaix France 20 1.4k 1.6× 62 0.9× 66 1.5× 76 1.9× 18 0.7× 118 1.4k
Yaqing Chi China 11 407 0.5× 28 0.4× 168 3.7× 65 1.6× 18 0.7× 90 459
Giuseppe La Rosa United States 13 657 0.8× 39 0.6× 34 0.8× 42 1.0× 22 0.9× 35 699
G. Bronner United States 9 345 0.4× 36 0.5× 84 1.9× 45 1.1× 9 0.4× 33 395
S. Ramey United States 15 684 0.8× 115 1.7× 44 1.0× 45 1.1× 16 0.6× 50 732
David Wolpert United States 9 195 0.2× 38 0.6× 55 1.2× 23 0.6× 10 0.4× 21 249
S. Mudanai United States 16 809 0.9× 92 1.4× 77 1.7× 51 1.2× 12 0.5× 37 835

Countries citing papers authored by Nilesh Goel

Since Specialization
Citations

This map shows the geographic impact of Nilesh Goel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nilesh Goel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nilesh Goel more than expected).

Fields of papers citing papers by Nilesh Goel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nilesh Goel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nilesh Goel. The network helps show where Nilesh Goel may publish in the future.

Co-authorship network of co-authors of Nilesh Goel

This figure shows the co-authorship network connecting the top 25 collaborators of Nilesh Goel. A scholar is included among the top collaborators of Nilesh Goel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nilesh Goel. Nilesh Goel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Goel, Nilesh, et al.. (2024). Aging Analysis of CMOS Based Synaptic Circuits. 1–3.
2.
Goel, Nilesh, et al.. (2022). Impact of Reliability Issues and Process Variability in Neuromorphic Circuits. 1–6. 1 indexed citations
3.
Goel, Nilesh, et al.. (2021). Reliability‐aware design of temporal neuromorphic encoder for image recognition. International Journal of Circuit Theory and Applications. 50(4). 1130–1142. 7 indexed citations
4.
Choudhury, Nilotpal, et al.. (2020). Modeling of DC - AC NBTI Stress - Recovery Time Kinetics in P-Channel Planar Bulk and FDSOI MOSFETs and FinFETs. IEEE Journal of the Electron Devices Society. 8. 1281–1288. 11 indexed citations
5.
Choudhury, Nilotpal, et al.. (2020). A Model for Hole Trapping-Detrapping Kinetics During NBTI in p-Channel FETs: (Invited paper). 1–4. 3 indexed citations
6.
7.
Goel, Nilesh, Shazia Hasan, & V. Kalaichelvi. (2020). Modelling, Simulation and Intelligent Computing. Lecture notes in electrical engineering. 7 indexed citations
8.
Amrouch, Hussam, Nilesh Goel, Narendra Parihar, et al.. (2018). Device to Circuit Framework for Activity-Dependent NBTI Aging in Digital Circuits. IEEE Transactions on Electron Devices. 66(1). 316–323. 26 indexed citations
9.
Goel, Nilesh, et al.. (2018). Analyzing Impact of NBTI and Time-Zero Variability on Dynamic SRAM Metrics. 1–5. 1 indexed citations
10.
11.
Mukhopadhyay, Subhadeep, Nilesh Goel, & Souvik Mahapatra. (2016). A Comparative Study of NBTI and PBTI Using Different Experimental Techniques. IEEE Transactions on Electron Devices. 63(10). 4038–4045. 19 indexed citations
12.
Parihar, Narendra, et al.. (2016). A Modeling Framework for NBTI Degradation Under Dynamic Voltage and Frequency Scaling. IEEE Transactions on Electron Devices. 63(3). 946–953. 47 indexed citations
13.
14.
Goel, Nilesh, et al.. (2014). DC / AC BTI variability of SRAM circuits simulated using a physics-based compact model. CA.2.1–CA.2.8. 9 indexed citations
15.
Mahapatra, Souvik, Nilesh Goel, Sujay B. Desai, et al.. (2013). A Comparative Study of Different Physics-Based NBTI Models. IEEE Transactions on Electron Devices. 60(3). 901–916. 223 indexed citations
16.
Desai, Sujay B., et al.. (2013). A comprehensive AC / DC NBTI model: Stress, recovery, frequency, duty cycle and process dependence. XT.2.1–XT.2.11. 37 indexed citations
17.
Joshi, K., Subhadeep Mukhopadhyay, Nilesh Goel, & Souvik Mahapatra. (2012). A consistent physical framework for N and P BTI in HKMG MOSFETs. 5A.3.1–5A.3.10. 84 indexed citations
18.
Mahapatra, Souvik, Nilesh Goel, & K. Joshi. (2012). A physics based model for NBTI in p-MOSFETs. 8. 1–4. 3 indexed citations
19.
Bersuker, G., Dmitry Veksler, D. C. Gilmer, et al.. (2010). Tunnel oxide degradation in TANOS devices and its origin. 50–51. 5 indexed citations
20.
Hill, Richard J., Joel Barnett, Jifu Huang, et al.. (2010). Self-aligned III-V MOSFETs heterointegrated on a 200 mm Si substrate using an industry standard process flow. 6.2.1–6.2.4. 31 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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