Shoumian Chen

467 citations
61 papers · 325 indexed · h-index 8
Topics
Semiconductor materials and devices (25 papers)Advancements in Semiconductor Devices and Circuit Design (21 papers)Advancements in Photolithography Techniques (13 papers)
Partner nations
ChinaHong KongSingapore

In The Last Decade

Shoumian Chen

52 papers receiving 300 citations

Peers

Shoumian Chen
Comparison fields: 5 of 44
  • Electrical and Electronic Engineering 285
  • Electronic, Optical and Magnetic Materials 101
  • Materials Chemistry 62
  • Mechanics of Materials 55
  • Biomedical Engineering 45
Replace M. Assous with:
M. Assous France
Thierry Mourier France
Gayle Murdoch Belgium
Jeff Gambino United States
C. Huffman United States
F. Chen United States
W. Cote United States
Chih Hang Tung Singapore
David De Roest Belgium
Ennis T. Ogawa United States
Shoumian Chen relative to M. Assous France M. Assous's profile →
Citations per field
00.5×3.3×
M. Assous · 1×
Citations per year

Countries citing papers authored by Shoumian Chen

Since Specialization
Citations

This map shows the geographic impact of Shoumian Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shoumian Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shoumian Chen more than expected).

Fields of papers citing papers by Shoumian Chen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shoumian Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shoumian Chen. The network helps show where Shoumian Chen may publish in the future.

Co-authorship network of co-authors of Shoumian Chen

This figure shows the co-authorship network connecting the top 25 collaborators of Shoumian Chen. A scholar is included among the top collaborators of Shoumian Chen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shoumian Chen. Shoumian Chen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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#WorkIndexed citations
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About Shoumian Chen

Shoumian Chen is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Media Technology, having authored 61 papers that have together received 325 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers) and Advancements in Photolithography Techniques (13 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (101 citations), Electrical and Electronic Engineering (285 citations) and Mechanics of Materials (55 citations). Shoumian Chen has collaborated with scholars based in China, Hong Kong and Singapore. Frequent co-authors include Jisheng Pan, P.D. Foo, Licheng M. Han, N. Balasubramanian, Yuhang Zhao, Yanling Shi, Jia Huang, Yuhang Zhao, Jianjun Zhu and Qingqing Wu. Their work appears in journals such as SHILAP Revista de lepidopterología, Journal of The Electrochemical Society and IEEE Transactions on Power Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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