Shanshan Liu
- Electrical and Electronic Engineering top 5%
- Control and Systems Engineering top 5%
- Hardware and Architecture top 5%
- Computer Networks and Communications top 10%
- Materials Chemistry
- Co-authors
- Pedro ReviriegoFabrizio LombardiChen‐Ching LiuLiyi XiaoJing GuoYunhe HouNavin BhattZhigang Mao
- Topics
- Radiation Effects in Electronics (33 papers)VLSI and Analog Circuit Testing (20 papers)Advanced Memory and Neural Computing (17 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringSafety, Risk, Reliability and Quality
- Partner nations
- ChinaUnited StatesSpain
In The Last Decade
Shanshan Liu
154 papers receiving 1.5k citations
Peers
Comparison fields: 5 of 133
- Electrical and Electronic Engineering 1.0k
- Control and Systems Engineering 226
- Hardware and Architecture 203
- Computer Networks and Communications 132
- Materials Chemistry 131
Countries citing papers authored by Shanshan Liu
This map shows the geographic impact of Shanshan Liu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shanshan Liu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shanshan Liu more than expected).
Fields of papers citing papers by Shanshan Liu
This network shows the impact of papers produced by Shanshan Liu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shanshan Liu. The network helps show where Shanshan Liu may publish in the future.
Co-authorship network of co-authors of Shanshan Liu
This figure shows the co-authorship network connecting the top 25 collaborators of Shanshan Liu. A scholar is included among the top collaborators of Shanshan Liu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shanshan Liu. Shanshan Liu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 5 | |
| 4 | 1 | |
| 5 | 0 | |
| 6 | 24 | |
| 7 | 2 | |
| 8 | 0 | |
| 9 | 0 | |
| 10 | 0 | |
| 11 | 9 | |
| 12 | 1 | |
| 13 | 0 | |
| 14 | 0 | |
| 15 | 0 | |
| 16 | 1 | |
| 17 | 2 | |
| 18 | 2 | |
| 19 | 9 | |
| 20 | 95 |
About Shanshan Liu
Shanshan Liu is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 176 papers that have together received 1.6k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (33 papers), VLSI and Analog Circuit Testing (20 papers) and Advanced Memory and Neural Computing (17 papers). The work is most often cited by research in Hardware and Architecture (203 citations), Electrical and Electronic Engineering (1.0k citations) and Safety, Risk, Reliability and Quality (110 citations). Shanshan Liu has collaborated with scholars based in China, United States and Spain. Frequent co-authors include Pedro Reviriego, Fabrizio Lombardi, Chen‐Ching Liu, Liyi Xiao, Jing Guo, Yunhe Hou, Navin Bhatt, Zhigang Mao, Venkataramana Ajjarapu and Vijay Vittal. Their work appears in journals such as Nano Letters, Energy & Environmental Science and American Journal of Public Health.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.