Bill Eklow
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 5%
- Automotive Engineering top 10%
- Computer Networks and Communications top 10%
- Control and Systems Engineering
- Co-authors
- Li JiangQiang XuKrishnendu ChakrabartyJeff RearickXinli GuAlfred L. CrouchFangming YeC. Barnhart
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (18 papers)VLSI and Analog Circuit Testing (16 papers)Engineering and Test Systems (11 papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsLund University Publications (Lund University)IEEE Design & Test of Computers
- Partner nations
- United StatesChinaHong Kong
In The Last Decade
Bill Eklow
25 papers receiving 473 citations
Peers
Comparison fields: 5 of 22
- Electrical and Electronic Engineering 432
- Hardware and Architecture 235
- Automotive Engineering 85
- Computer Networks and Communications 77
- Control and Systems Engineering 62
Countries citing papers authored by Bill Eklow
This map shows the geographic impact of Bill Eklow's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bill Eklow with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bill Eklow more than expected).
Fields of papers citing papers by Bill Eklow
This network shows the impact of papers produced by Bill Eklow. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bill Eklow. The network helps show where Bill Eklow may publish in the future.
Co-authorship network of co-authors of Bill Eklow
This figure shows the co-authorship network connecting the top 25 collaborators of Bill Eklow. A scholar is included among the top collaborators of Bill Eklow based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bill Eklow. Bill Eklow is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 6 | |
| 3 | 11 | |
| 4 | 33 | |
| 5 | 64 | |
| 6 | 0 | |
| 7 | 72 | |
| 8 | 25 | |
| 9 | 3 | |
| 10 | 24 | |
| 11 | 40 | |
| 12 | 33 | |
| 13 | 8 | |
| 14 | 6 | |
| 15 | 3 | |
| 16 | 14 | |
| 17 | 1 | |
| 18 | 7 | |
| 19 | 6 | |
| 20 | 0 |
About Bill Eklow
Bill Eklow is a scholar working on Hardware and Architecture, Control and Systems Engineering and Software, having authored 28 papers that have together received 492 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (18 papers), VLSI and Analog Circuit Testing (16 papers) and Engineering and Test Systems (11 papers). The work is most often cited by research in Hardware and Architecture (235 citations), Electrical and Electronic Engineering (432 citations) and Automotive Engineering (85 citations). Bill Eklow has collaborated with scholars based in United States, China and Hong Kong. Frequent co-authors include Li Jiang, Qiang Xu, Krishnendu Chakrabarty, Jeff Rearick, Xinli Gu, Alfred L. Crouch, Fangming Ye, C. Barnhart, Ran Wang and Huiyun Li. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Lund University Publications (Lund University) and IEEE Design & Test of Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.