Yongchan Ban

469 total citations
37 papers, 364 citations indexed

About

Yongchan Ban is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, Yongchan Ban has authored 37 papers receiving a total of 364 indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Electrical and Electronic Engineering, 9 papers in Hardware and Architecture and 9 papers in Biomedical Engineering. Recurrent topics in Yongchan Ban's work include Advancements in Photolithography Techniques (30 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and VLSI and Analog Circuit Testing (9 papers). Yongchan Ban is often cited by papers focused on Advancements in Photolithography Techniques (30 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and VLSI and Analog Circuit Testing (9 papers). Yongchan Ban collaborates with scholars based in United States, South Korea and Taiwan. Yongchan Ban's co-authors include David Z. Pan, Minsik Cho, Kevin Lucas, Kun Yuan, Bei Yu, Savithri Sundareswaran, Lars W. Liebmann, Jae-Seok Yang, Chul‐Hong Park and Rajendran Panda and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Journal on Emerging and Selected Topics in Circuits and Systems and Journal of Micro/Nanolithography MEMS and MOEMS.

In The Last Decade

Yongchan Ban

35 papers receiving 350 citations

Peers

Countries citing papers authored by Yongchan Ban

Since Specialization

Citations

This map shows the geographic impact of Yongchan Ban's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yongchan Ban with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yongchan Ban more than expected).

Fields of papers citing papers by Yongchan Ban

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yongchan Ban. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yongchan Ban. The network helps show where Yongchan Ban may publish in the future.

Co-authorship network of co-authors of Yongchan Ban

This figure shows the co-authorship network connecting the top 25 collaborators of Yongchan Ban. A scholar is included among the top collaborators of Yongchan Ban based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yongchan Ban. Yongchan Ban is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Application-driven optimizations of metal stack and PDN (power delivery network) using machine learning framework 2024 ·(unknown), (unknown), Yongchan Ban	1
2	Optimizing and Addressing Stitch Challenges in High-NA EUV Lithography for Large Die Designs 2024 ·Yongchan Ban, (unknown), (unknown)	0
3	Machine learning applications on 3nm node technology and designs for improving block-level PPA 2023 ·(unknown), Yongchan Ban, (unknown), (unknown), Kyoungin Cho, (unknown), (unknown), (unknown), Heeyeon Kim, (unknown)	1
4	Mitigating IR-Drop with Design Technology Co-Optimization for Sub-Nanometer Node Technology 2021 ·Dohyeon Lee, (unknown), (unknown), Yongchan Ban	4
5	IR-drop analysis for validating power grids and standard cell architectures in sub-10nm node designs 2017 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yongchan Ban, Chenchen Wang, (unknown), Jongwook Kye	1
6	Model-based CMP aware RC extraction of interconnects in 16nm designs 2016 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yongchan Ban, (unknown), (unknown), (unknown), (unknown)	1
7	Design for manufacturing and reliability for nanometer SoCs (system-on-chips) 2015 ·Yongchan Ban	2
8	Analysis and optimization of process-induced electromigration on signal interconnects in 16nm FinFET SoC (system-on-chip) 2014 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yongchan Ban, (unknown), (unknown), (unknown), Woo Hyun Paik	6
9	Layout induced variability and manufacturability checks in FinFETs process 2014 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yongchan Ban, (unknown), (unknown), (unknown), (unknown), Woo Hyun Paik, Wei Xu, (unknown)	6
10	Dealing with IC manufacturability in extreme scaling (Embedded tutorial paper) 2012 ·International Conference on Computer Aided Design ·Bei Yu, Jhih-Rong Gao, Duo Ding, Yongchan Ban, Jae-Seok Yang, Kun Yuan, Minsik Cho, David Z. Pan	2
11	DOPPLER: DPL-aware and OPC-friendly gridless detailed routing with mask density balancing 2011 ·International Conference on Computer Aided Design ·Yen‐Hung Lin, Yongchan Ban, David Z. Pan, Yih-Lang Li	7
12	Layout decomposition of self-aligned double patterning for 2D random logic patterning 2011 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yongchan Ban, (unknown), Kevin Lucas, (unknown), Chul‐Hong Park, David Z. Pan	30
13	Modeling of Layout Aware Line-Edge Roughness and Poly Optimization for Leakage Minimization 2011 ·IEEE Journal on Emerging and Selected Topics in Circuits and Systems ·Yongchan Ban, David Z. Pan	10
14	Total sensitivity based dfm optimization of standard library cells 2010 ·Yongchan Ban, Savithri Sundareswaran, David Z. Pan	16
15	Modeling and characterization of contact-edge roughness for minimizing design and manufacturing variations in 32-nm node standard cell 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yongchan Ban, Yuansheng Ma, Harry Levinson, Yunfei Deng, Jongwook Kye, David Z. Pan	6
16	Electrical impact of line-edge roughness on sub-45nm node standard cell 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yongchan Ban, Savithri Sundareswaran, Rajendran Panda, David Z. Pan	15
17	Double patterning technology friendly detailed routing 2008 ·International Conference on Computer Aided Design ·Minsik Cho, Yongchan Ban, David Z. Pan	62
18	ELIAD 2008 ·Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan	25
19	Double patterning technology friendly detailed routing 2008 ·Minsik Cho, Yongchan Ban, David Z. Pan	7
20	Accurate gate CD control through the full-chip area using the dual model in the model-based OPC 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Chul‐Hong Park, Donghyun Kim, Soo‐Han Choi, Yongchan Ban, (unknown), (unknown), Jeong-Taek Kong	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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